Best practice: An optimization of assets productivity in semiconductor manufacturing
ROE (Return on Equity) is something that causes the most concern by stockholders and is a major index when evaluating a company's overall profitability. This paper introduces a new index-Equipment Asset Productivity (EAP) to aid index-Asset Productivity (AP), the key elements of ROE, by benchma...
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| creator | Yung-Ta Li |
| description | ROE (Return on Equity) is something that causes the most concern by stockholders and is a major index when evaluating a company's overall profitability. This paper introduces a new index-Equipment Asset Productivity (EAP) to aid index-Asset Productivity (AP), the key elements of ROE, by benchmarking Fab-by-Fab asset management performance over time. A hierarchical asset management mechanism was developed to identify the root causes of poor asset management performance. The aim is to provide attainable execution plan that will allow senior management to improve assets productivity. In addition, the paper also designates the ownership of each index required to monitor progress in the future then by raising ROE. |
| doi_str_mv | 10.1109/ICMIT.2010.5492807 |
| format | Conference Proceeding |
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In addition, the paper also designates the ownership of each index required to monitor progress in the future then by raising ROE.</description><subject>Application specific processors</subject><subject>Asset management</subject><subject>Asset Productivity</subject><subject>Benchmark</subject><subject>Best practices</subject><subject>Demand forecasting</subject><subject>Economic forecasting</subject><subject>Electric breakdown</subject><subject>Equipment Asset Productivity</subject><subject>Fab</subject><subject>Load forecasting</subject><subject>Monitoring</subject><subject>Productivity</subject><subject>Return on Equity (ROE)</subject><subject>Semiconductor device manufacture</subject><isbn>1424465656</isbn><isbn>9781424465651</isbn><isbn>1424465672</isbn><isbn>9781424465668</isbn><isbn>1424465664</isbn><isbn>9781424465675</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFkN1KxDAQhSMiqOu-gN7kBbrmP613a3G1sOJN75cwTWTE_tCkwvr0RlxwGDjzHQ7nYgi55WzDOavum_q1aTeCZdaqEiWzZ-SaK6GU0caK83_Q5pKsY_xgeZQWxpor0j76mOg0O0gI_oFuBzpOCXv8dgnHDIG6GH2KOTN2S059YTpSHGj0PcI4_HrjTHs3LCGXLDMO7zfkIrjP6NcnXZF299TWL8X-7bmpt_sCK5YKYNqDNdxarlynbSehqjqAUggwZWDMipAP6IyUJRcycAOQKa9wUgW5Ind_tei9P0wz9m4-Hk5PkD_YelJ8</recordid><startdate>201006</startdate><enddate>201006</enddate><creator>Yung-Ta Li</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201006</creationdate><title>Best practice: An optimization of assets productivity in semiconductor manufacturing</title><author>Yung-Ta Li</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-c05ec7617714ad57d3c99dcc822c68f0072fc68cd6338123f16cccd6cd62a34f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Application specific processors</topic><topic>Asset management</topic><topic>Asset Productivity</topic><topic>Benchmark</topic><topic>Best practices</topic><topic>Demand forecasting</topic><topic>Economic forecasting</topic><topic>Electric breakdown</topic><topic>Equipment Asset Productivity</topic><topic>Fab</topic><topic>Load forecasting</topic><topic>Monitoring</topic><topic>Productivity</topic><topic>Return on Equity (ROE)</topic><topic>Semiconductor device manufacture</topic><toplevel>online_resources</toplevel><creatorcontrib>Yung-Ta Li</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yung-Ta Li</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Best practice: An optimization of assets productivity in semiconductor manufacturing</atitle><btitle>2010 IEEE International Conference on Management of Innovation & Technology</btitle><stitle>ICMIT</stitle><date>2010-06</date><risdate>2010</risdate><spage>880</spage><epage>884</epage><pages>880-884</pages><isbn>1424465656</isbn><isbn>9781424465651</isbn><eisbn>1424465672</eisbn><eisbn>9781424465668</eisbn><eisbn>1424465664</eisbn><eisbn>9781424465675</eisbn><abstract>ROE (Return on Equity) is something that causes the most concern by stockholders and is a major index when evaluating a company's overall profitability. This paper introduces a new index-Equipment Asset Productivity (EAP) to aid index-Asset Productivity (AP), the key elements of ROE, by benchmarking Fab-by-Fab asset management performance over time. A hierarchical asset management mechanism was developed to identify the root causes of poor asset management performance. The aim is to provide attainable execution plan that will allow senior management to improve assets productivity. In addition, the paper also designates the ownership of each index required to monitor progress in the future then by raising ROE.</abstract><pub>IEEE</pub><doi>10.1109/ICMIT.2010.5492807</doi><tpages>5</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Application specific processors Asset management Asset Productivity Benchmark Best practices Demand forecasting Economic forecasting Electric breakdown Equipment Asset Productivity Fab Load forecasting Monitoring Productivity Return on Equity (ROE) Semiconductor device manufacture |
| title | Best practice: An optimization of assets productivity in semiconductor manufacturing |
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