Thermal disturbance and its impact on reliability of phase-change memory studied by the micro-thermal stage

In this paper, we study thermal disturbance and its impact on reliability using a novel measurement structure - the micro-thermal stage (MTS). The small thermal time constant of the MTS extends the time-scale of temperature dependence measurement to ~100 μs. The reliability of phase-change memory (P...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SangBum Kim, Byoungil Lee, Asheghi, M, Hurkx, G A M, Reifenberg, J, Goodson, K, Wong, H P
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Delay effects Electric resistance Electrical resistance measurement Phase change materials Phase change memory program-disturb proximity disturbance reliability Robustness Temperature dependence Temperature measurement thermal crosstalk thermal disturbance Threshold voltage Time measurement
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!