Correlations of capacitance-voltage hysteresis with thin-film CdTe Solar cell performance during accelerated lifetime testing
In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different pre-measurement bias conditions. These correlations were obtained on CdT...
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| creator | Albin, D S del Cueto, J A |
| description | In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different pre-measurement bias conditions. These correlations were obtained on CdTe cells stressed under conditions of 1-sun illumination, open-circuit bias, and an acceleration temperature of approximately 100°C. |
| doi_str_mv | 10.1109/IRPS.2010.5488811 |
| format | Conference Proceeding |
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(NREL), Golden, CO (United States)</creatorcontrib><description>In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different pre-measurement bias conditions. These correlations were obtained on CdTe cells stressed under conditions of 1-sun illumination, open-circuit bias, and an acceleration temperature of approximately 100°C.</description><identifier>ISSN: 1541-7026</identifier><identifier>ISBN: 1424454301</identifier><identifier>ISBN: 9781424454303</identifier><identifier>EISSN: 1938-1891</identifier><identifier>EISBN: 1424454298</identifier><identifier>EISBN: 9781424454297</identifier><identifier>EISBN: 9781424454310</identifier><identifier>EISBN: 142445431X</identifier><identifier>DOI: 10.1109/IRPS.2010.5488811</identifier><identifier>LCCN: 82-640313</identifier><language>eng</language><publisher>United States: IEEE</publisher><subject>ACCELERATION ; Cadmium Telluride (CdTe) ; cadmium telluride (CdTe) photovoltaic solar cells modules ; CAPACITANCE ; Capacitance measurement ; capacitance voltage (CV) ; Capacitance Voltage Hysteresis ; Capacitance-voltage characteristics ; Deep Level Transient Spectroscopy (DLTS) ; HYSTERESIS ; ILLUMINANCE ; Life estimation ; Life testing ; LIFETIME ; Lighting ; MATERIALS SCIENCE ; Photovoltaic ; Photovoltaic cells ; SOLAR CELLS ; SOLAR ENERGY ; Temperature ; TESTING ; Transient Capacitance ; Transient Ion Drift (TID) ; Transistors</subject><ispartof>2010 IEEE International Reliability Physics Symposium, 2010, p.318-322</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5488811$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,309,310,776,780,785,786,881,2052,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5488811$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttps://www.osti.gov/servlets/purl/1009259$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Albin, D S</creatorcontrib><creatorcontrib>del Cueto, J A</creatorcontrib><creatorcontrib>National Renewable Energy Lab. (NREL), Golden, CO (United States)</creatorcontrib><title>Correlations of capacitance-voltage hysteresis with thin-film CdTe Solar cell performance during accelerated lifetime testing</title><title>2010 IEEE International Reliability Physics Symposium</title><addtitle>IRPS</addtitle><description>In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different pre-measurement bias conditions. These correlations were obtained on CdTe cells stressed under conditions of 1-sun illumination, open-circuit bias, and an acceleration temperature of approximately 100°C.</description><subject>ACCELERATION</subject><subject>Cadmium Telluride (CdTe)</subject><subject>cadmium telluride (CdTe) photovoltaic solar cells modules</subject><subject>CAPACITANCE</subject><subject>Capacitance measurement</subject><subject>capacitance voltage (CV)</subject><subject>Capacitance Voltage Hysteresis</subject><subject>Capacitance-voltage characteristics</subject><subject>Deep Level Transient Spectroscopy (DLTS)</subject><subject>HYSTERESIS</subject><subject>ILLUMINANCE</subject><subject>Life estimation</subject><subject>Life testing</subject><subject>LIFETIME</subject><subject>Lighting</subject><subject>MATERIALS SCIENCE</subject><subject>Photovoltaic</subject><subject>Photovoltaic cells</subject><subject>SOLAR CELLS</subject><subject>SOLAR ENERGY</subject><subject>Temperature</subject><subject>TESTING</subject><subject>Transient Capacitance</subject><subject>Transient Ion Drift (TID)</subject><subject>Transistors</subject><issn>1541-7026</issn><issn>1938-1891</issn><isbn>1424454301</isbn><isbn>9781424454303</isbn><isbn>1424454298</isbn><isbn>9781424454297</isbn><isbn>9781424454310</isbn><isbn>142445431X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9kFtLAzEQheOlYK39AeJL8H1rJpdt8ijFS6Gg2Pq8xOxsN7KXkkSlD_53VyrOy2H4zsxhhpBLYDMAZm6WL8_rGWdDq6TWGuCInIPkUirJjT4mYzBCZ6ANnPwDweB0AEpCNmc8H5Gx5lkumQBxRqYxvrOhpOK5lGPyvehDwMYm33eR9hV1dmedT7ZzmH32TbJbpPU-JgwYfaRfPtU01b7LKt-0dFFukK77xgbqsGnoDkPVh_Z3mpYfwXdbat1AMNiEJW18hcm3SBPGNMALMqpsE3H6pxPyen-3WTxmq6eH5eJ2lXkuVco4cgPKMIMWbC7dmxYl5ko5WSGgybVVjIMQFQipSscUMJureS4M55VgXEzI9WFvP8QWcbgPXe36rkOXCmDMcGUG09XB5BGx2AXf2rAv_v4ufgB9dHFR</recordid><startdate>20100101</startdate><enddate>20100101</enddate><creator>Albin, D S</creator><creator>del Cueto, J A</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>OIOZB</scope><scope>OTOTI</scope></search><sort><creationdate>20100101</creationdate><title>Correlations of capacitance-voltage hysteresis with thin-film CdTe Solar cell performance during accelerated lifetime testing</title><author>Albin, D S ; del Cueto, J A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i245t-2e2915909ea1a64cb83de655c4fe1e968a502133f1345dc0510a65763922f3023</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>ACCELERATION</topic><topic>Cadmium Telluride (CdTe)</topic><topic>cadmium telluride (CdTe) photovoltaic solar cells modules</topic><topic>CAPACITANCE</topic><topic>Capacitance measurement</topic><topic>capacitance voltage (CV)</topic><topic>Capacitance Voltage Hysteresis</topic><topic>Capacitance-voltage characteristics</topic><topic>Deep Level Transient Spectroscopy (DLTS)</topic><topic>HYSTERESIS</topic><topic>ILLUMINANCE</topic><topic>Life estimation</topic><topic>Life testing</topic><topic>LIFETIME</topic><topic>Lighting</topic><topic>MATERIALS SCIENCE</topic><topic>Photovoltaic</topic><topic>Photovoltaic cells</topic><topic>SOLAR CELLS</topic><topic>SOLAR ENERGY</topic><topic>Temperature</topic><topic>TESTING</topic><topic>Transient Capacitance</topic><topic>Transient Ion Drift (TID)</topic><topic>Transistors</topic><toplevel>online_resources</toplevel><creatorcontrib>Albin, D S</creatorcontrib><creatorcontrib>del Cueto, J A</creatorcontrib><creatorcontrib>National Renewable Energy Lab. (NREL), Golden, CO (United States)</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Albin, D S</au><au>del Cueto, J A</au><aucorp>National Renewable Energy Lab. (NREL), Golden, CO (United States)</aucorp><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Correlations of capacitance-voltage hysteresis with thin-film CdTe Solar cell performance during accelerated lifetime testing</atitle><btitle>2010 IEEE International Reliability Physics Symposium</btitle><stitle>IRPS</stitle><date>2010-01-01</date><risdate>2010</risdate><spage>318</spage><epage>322</epage><pages>318-322</pages><issn>1541-7026</issn><eissn>1938-1891</eissn><isbn>1424454301</isbn><isbn>9781424454303</isbn><eisbn>1424454298</eisbn><eisbn>9781424454297</eisbn><eisbn>9781424454310</eisbn><eisbn>142445431X</eisbn><abstract>In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different pre-measurement bias conditions. These correlations were obtained on CdTe cells stressed under conditions of 1-sun illumination, open-circuit bias, and an acceleration temperature of approximately 100°C.</abstract><cop>United States</cop><pub>IEEE</pub><doi>10.1109/IRPS.2010.5488811</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1541-7026 |
| ispartof | 2010 IEEE International Reliability Physics Symposium, 2010, p.318-322 |
| issn | 1541-7026 1938-1891 |
| language | eng |
| recordid | cdi_ieee_primary_5488811 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | ACCELERATION Cadmium Telluride (CdTe) cadmium telluride (CdTe) photovoltaic solar cells modules CAPACITANCE Capacitance measurement capacitance voltage (CV) Capacitance Voltage Hysteresis Capacitance-voltage characteristics Deep Level Transient Spectroscopy (DLTS) HYSTERESIS ILLUMINANCE Life estimation Life testing LIFETIME Lighting MATERIALS SCIENCE Photovoltaic Photovoltaic cells SOLAR CELLS SOLAR ENERGY Temperature TESTING Transient Capacitance Transient Ion Drift (TID) Transistors |
| title | Correlations of capacitance-voltage hysteresis with thin-film CdTe Solar cell performance during accelerated lifetime testing |
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