Reliability of electronic equipment exposed to chlorine dioxide used for biological decontamination
We have studied the effects of chlorine dioxide fumigation on the reliability of electronic equipment using personal computers as examples of current commercial systems. Unit and subunit failure were objectively defined by standard commercial software. After the initial one-day exposures to the fumi...
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| creator | Derkits, G E Mandich, M L Reents, W D Franey, J P Xu, C Fleming, D Kopf, R Ryan, S |
| description | We have studied the effects of chlorine dioxide fumigation on the reliability of electronic equipment using personal computers as examples of current commercial systems. Unit and subunit failure were objectively defined by standard commercial software. After the initial one-day exposures to the fumigation conditions, the systems were tested to assess impacts and retested monthly for six months. Cumulative failures of decontaminated systems were many times higher than unexposed systems and increased progressively for the harshest fumigation conditions. Failures occurred in electronic, mechanical, optoelectronic, and thermal subsystems. Failure mode and root-cause analyses were performed on a blind sample of systems. Corrosion of metals and degradation of organic materials were predominant causes of failure. Metal corrosion continued to progress well after the initial exposure. |
| doi_str_mv | 10.1109/IRPS.2010.5488715 |
| format | Conference Proceeding |
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Unit and subunit failure were objectively defined by standard commercial software. After the initial one-day exposures to the fumigation conditions, the systems were tested to assess impacts and retested monthly for six months. Cumulative failures of decontaminated systems were many times higher than unexposed systems and increased progressively for the harshest fumigation conditions. Failures occurred in electronic, mechanical, optoelectronic, and thermal subsystems. Failure mode and root-cause analyses were performed on a blind sample of systems. Corrosion of metals and degradation of organic materials were predominant causes of failure. Metal corrosion continued to progress well after the initial exposure.</description><identifier>ISSN: 1541-7026</identifier><identifier>ISBN: 1424454301</identifier><identifier>ISBN: 9781424454303</identifier><identifier>EISSN: 1938-1891</identifier><identifier>EISBN: 1424454298</identifier><identifier>EISBN: 9781424454297</identifier><identifier>EISBN: 9781424454310</identifier><identifier>EISBN: 142445431X</identifier><identifier>DOI: 10.1109/IRPS.2010.5488715</identifier><identifier>LCCN: 82-640313</identifier><language>eng</language><publisher>IEEE</publisher><subject>chlorine dioxide ; Corrosion ; Decontamination ; diagnostic software ; Electronic equipment ; Failure analysis ; Microcomputers ; Organic materials ; Performance analysis ; personal computer ; reliability ; Software standards ; System testing ; Thermal degradation</subject><ispartof>2010 IEEE International Reliability Physics Symposium, 2010, p.879-880</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5488715$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5488715$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Derkits, G E</creatorcontrib><creatorcontrib>Mandich, M L</creatorcontrib><creatorcontrib>Reents, W D</creatorcontrib><creatorcontrib>Franey, J P</creatorcontrib><creatorcontrib>Xu, C</creatorcontrib><creatorcontrib>Fleming, D</creatorcontrib><creatorcontrib>Kopf, R</creatorcontrib><creatorcontrib>Ryan, S</creatorcontrib><title>Reliability of electronic equipment exposed to chlorine dioxide used for biological decontamination</title><title>2010 IEEE International Reliability Physics Symposium</title><addtitle>IRPS</addtitle><description>We have studied the effects of chlorine dioxide fumigation on the reliability of electronic equipment using personal computers as examples of current commercial systems. Unit and subunit failure were objectively defined by standard commercial software. After the initial one-day exposures to the fumigation conditions, the systems were tested to assess impacts and retested monthly for six months. Cumulative failures of decontaminated systems were many times higher than unexposed systems and increased progressively for the harshest fumigation conditions. Failures occurred in electronic, mechanical, optoelectronic, and thermal subsystems. Failure mode and root-cause analyses were performed on a blind sample of systems. Corrosion of metals and degradation of organic materials were predominant causes of failure. Metal corrosion continued to progress well after the initial exposure.</description><subject>chlorine dioxide</subject><subject>Corrosion</subject><subject>Decontamination</subject><subject>diagnostic software</subject><subject>Electronic equipment</subject><subject>Failure analysis</subject><subject>Microcomputers</subject><subject>Organic materials</subject><subject>Performance analysis</subject><subject>personal computer</subject><subject>reliability</subject><subject>Software standards</subject><subject>System testing</subject><subject>Thermal degradation</subject><issn>1541-7026</issn><issn>1938-1891</issn><isbn>1424454301</isbn><isbn>9781424454303</isbn><isbn>1424454298</isbn><isbn>9781424454297</isbn><isbn>9781424454310</isbn><isbn>142445431X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9kFtLAzEUhOOlYK39AeJL_sDWXHeTRyleCgWl6nNJsid6JN3U3S20_94Vi_MyDN9w4Awh15zNOGf2drF6eZ0JNkStjKm4PiGXXAmltBLWnJIxt9IU3Fh-9g8k4-cD0IoXFRPliIyNKErFJJcXZNp1X2yQ0qJUakzCChI6jwn7A82RQoLQt7nBQOF7h9sNND2F_TZ3UNM-0_CZcosN0BrzHmugu18Qc0s95pQ_MLhEawi56d0GG9djbq7IKLrUwfToE_L-cP82fyqWz4-L-d2yQF7pvvC18qUIJogYKuNtGaKzPnpbWyZBqkrYKpYQhz-ic0Ezr63UQ1NHp1yt5YTc_N1FAFhvW9y49rA-Did_ADNDXnI</recordid><startdate>201005</startdate><enddate>201005</enddate><creator>Derkits, G E</creator><creator>Mandich, M L</creator><creator>Reents, W D</creator><creator>Franey, J P</creator><creator>Xu, C</creator><creator>Fleming, D</creator><creator>Kopf, R</creator><creator>Ryan, S</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201005</creationdate><title>Reliability of electronic equipment exposed to chlorine dioxide used for biological decontamination</title><author>Derkits, G E ; Mandich, M L ; Reents, W D ; Franey, J P ; Xu, C ; Fleming, D ; Kopf, R ; Ryan, S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-bd4b62c8c2fc78b96cfa9bfb9d903e347297f6ef313faac50b593578b5fa4ad53</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>chlorine dioxide</topic><topic>Corrosion</topic><topic>Decontamination</topic><topic>diagnostic software</topic><topic>Electronic equipment</topic><topic>Failure analysis</topic><topic>Microcomputers</topic><topic>Organic materials</topic><topic>Performance analysis</topic><topic>personal computer</topic><topic>reliability</topic><topic>Software standards</topic><topic>System testing</topic><topic>Thermal degradation</topic><toplevel>online_resources</toplevel><creatorcontrib>Derkits, G E</creatorcontrib><creatorcontrib>Mandich, M L</creatorcontrib><creatorcontrib>Reents, W D</creatorcontrib><creatorcontrib>Franey, J P</creatorcontrib><creatorcontrib>Xu, C</creatorcontrib><creatorcontrib>Fleming, D</creatorcontrib><creatorcontrib>Kopf, R</creatorcontrib><creatorcontrib>Ryan, S</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Derkits, G E</au><au>Mandich, M L</au><au>Reents, W D</au><au>Franey, J P</au><au>Xu, C</au><au>Fleming, D</au><au>Kopf, R</au><au>Ryan, S</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Reliability of electronic equipment exposed to chlorine dioxide used for biological decontamination</atitle><btitle>2010 IEEE International Reliability Physics Symposium</btitle><stitle>IRPS</stitle><date>2010-05</date><risdate>2010</risdate><spage>879</spage><epage>880</epage><pages>879-880</pages><issn>1541-7026</issn><eissn>1938-1891</eissn><isbn>1424454301</isbn><isbn>9781424454303</isbn><eisbn>1424454298</eisbn><eisbn>9781424454297</eisbn><eisbn>9781424454310</eisbn><eisbn>142445431X</eisbn><abstract>We have studied the effects of chlorine dioxide fumigation on the reliability of electronic equipment using personal computers as examples of current commercial systems. Unit and subunit failure were objectively defined by standard commercial software. After the initial one-day exposures to the fumigation conditions, the systems were tested to assess impacts and retested monthly for six months. Cumulative failures of decontaminated systems were many times higher than unexposed systems and increased progressively for the harshest fumigation conditions. Failures occurred in electronic, mechanical, optoelectronic, and thermal subsystems. Failure mode and root-cause analyses were performed on a blind sample of systems. Corrosion of metals and degradation of organic materials were predominant causes of failure. Metal corrosion continued to progress well after the initial exposure.</abstract><pub>IEEE</pub><doi>10.1109/IRPS.2010.5488715</doi><tpages>2</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1541-7026 |
| ispartof | 2010 IEEE International Reliability Physics Symposium, 2010, p.879-880 |
| issn | 1541-7026 1938-1891 |
| language | eng |
| recordid | cdi_ieee_primary_5488715 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | chlorine dioxide Corrosion Decontamination diagnostic software Electronic equipment Failure analysis Microcomputers Organic materials Performance analysis personal computer reliability Software standards System testing Thermal degradation |
| title | Reliability of electronic equipment exposed to chlorine dioxide used for biological decontamination |
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