A Practical, Innovative Method for Electro-Static Discharge Data Analysis
A practical method to identify outliers in interval data mixed with some right censored data is proposed. It is based on a simple concept of determining the probability that a deviation of an outlier, by chance, from the probability line which was fitted by the data set with the outlier deleted. The...
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Veröffentlicht in: | IEEE transactions on reliability 2010-06, Vol.59 (2), p.440-446 |
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description | A practical method to identify outliers in interval data mixed with some right censored data is proposed. It is based on a simple concept of determining the probability that a deviation of an outlier, by chance, from the probability line which was fitted by the data set with the outlier deleted. The median rank method is employed to determine its sample failing fraction to construct the probability plot. A special treatment is employed to treat the suspect outlier when making probability plots and regression with the suspect outlier deleted. The Fisher Matrix is used to determine the confidence bound, and to assist the estimation of the probability. A critical interval is then defined based on the calculated confidence bound in ESD (Electrostatic Discharge) data, and then the complicated methods are simplified with a simple linear regression using Excel to determine the distance that the possible outlier deviates from the regression line. The remaining work is to simply compare the distance with the critical interval before making a decision about what to do next, such as re-do ESD tests or refine ESD circuits, perform troubleshooting on the manufacturing process, and/or implement process changes for the IC product's ESD performance improvement. |
doi_str_mv | 10.1109/TR.2010.2048680 |
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fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_5475448</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5475448</ieee_id><sourcerecordid>2717039661</sourcerecordid><originalsourceid>FETCH-LOGICAL-c275t-f846945646c1ea6b9435589f8617f7df350caaec20015fefade6ced67df6021a3</originalsourceid><addsrcrecordid>eNpdkM1PAjEUxBujiYiePXjZxIMXF9puP7ZHAqgkGA3ieVO7r7JkodgWEv57SyAePL1M5jcvk0HoluAeIVj157MexUlQzEpR4jPUIZyXOZGUnKMOxqTMFafqEl2FsEySMVV20GSQvXttYmN0-5hN1mu307HZQfYKceHqzDqfjVsw0bv8IybLZKMmmIX235CNdNTZYK3bfWjCNbqwug1wc7pd9Pk0ng9f8unb82Q4mOaGSh5zWzKhGBdMGAJafClWpJrKloJIK2tbcGy0BkNTRW7B6hqEgVokS2BKdNFFD8e_G-9-thBitUqFoG31Gtw2VJIXolBSkETe_yOXbutT3VARTNMuWEmaqP6RMt6F4MFWG9-stN8nqDosW81n1WHZ6rRsStwdEw0A_NGcSc5YWfwCr2Vy2Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1027210972</pqid></control><display><type>article</type><title>A Practical, Innovative Method for Electro-Static Discharge Data Analysis</title><source>IEEE Electronic Library (IEL)</source><creator>Chien, Wei-Ting Kary ; Yang, Siyuan Frank</creator><creatorcontrib>Chien, Wei-Ting Kary ; Yang, Siyuan Frank</creatorcontrib><description>A practical method to identify outliers in interval data mixed with some right censored data is proposed. It is based on a simple concept of determining the probability that a deviation of an outlier, by chance, from the probability line which was fitted by the data set with the outlier deleted. The median rank method is employed to determine its sample failing fraction to construct the probability plot. A special treatment is employed to treat the suspect outlier when making probability plots and regression with the suspect outlier deleted. The Fisher Matrix is used to determine the confidence bound, and to assist the estimation of the probability. A critical interval is then defined based on the calculated confidence bound in ESD (Electrostatic Discharge) data, and then the complicated methods are simplified with a simple linear regression using Excel to determine the distance that the possible outlier deviates from the regression line. The remaining work is to simply compare the distance with the critical interval before making a decision about what to do next, such as re-do ESD tests or refine ESD circuits, perform troubleshooting on the manufacturing process, and/or implement process changes for the IC product's ESD performance improvement.</description><identifier>ISSN: 0018-9529</identifier><identifier>EISSN: 1558-1721</identifier><identifier>DOI: 10.1109/TR.2010.2048680</identifier><identifier>CODEN: IERQAD</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Biological system modeling ; Circuit simulation ; Circuit testing ; Circuits ; Confidence ; Data analysis ; Deviation ; electro-static discharge/damage (ESD) ; Electrostatic discharge ; Electrostatic discharges ; Humans ; Integrated circuit modeling ; Integrated circuit testing ; interval data ; Intervals ; Mathematical analysis ; median rank equation ; outlier detection ; probability plotting ; Protection ; Regression ; right censored data ; Studies ; suspended ; Troubleshooting ; Voltage</subject><ispartof>IEEE transactions on reliability, 2010-06, Vol.59 (2), p.440-446</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c275t-f846945646c1ea6b9435589f8617f7df350caaec20015fefade6ced67df6021a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5475448$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5475448$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chien, Wei-Ting Kary</creatorcontrib><creatorcontrib>Yang, Siyuan Frank</creatorcontrib><title>A Practical, Innovative Method for Electro-Static Discharge Data Analysis</title><title>IEEE transactions on reliability</title><addtitle>TR</addtitle><description>A practical method to identify outliers in interval data mixed with some right censored data is proposed. It is based on a simple concept of determining the probability that a deviation of an outlier, by chance, from the probability line which was fitted by the data set with the outlier deleted. The median rank method is employed to determine its sample failing fraction to construct the probability plot. A special treatment is employed to treat the suspect outlier when making probability plots and regression with the suspect outlier deleted. The Fisher Matrix is used to determine the confidence bound, and to assist the estimation of the probability. A critical interval is then defined based on the calculated confidence bound in ESD (Electrostatic Discharge) data, and then the complicated methods are simplified with a simple linear regression using Excel to determine the distance that the possible outlier deviates from the regression line. The remaining work is to simply compare the distance with the critical interval before making a decision about what to do next, such as re-do ESD tests or refine ESD circuits, perform troubleshooting on the manufacturing process, and/or implement process changes for the IC product's ESD performance improvement.</description><subject>Biological system modeling</subject><subject>Circuit simulation</subject><subject>Circuit testing</subject><subject>Circuits</subject><subject>Confidence</subject><subject>Data analysis</subject><subject>Deviation</subject><subject>electro-static discharge/damage (ESD)</subject><subject>Electrostatic discharge</subject><subject>Electrostatic discharges</subject><subject>Humans</subject><subject>Integrated circuit modeling</subject><subject>Integrated circuit testing</subject><subject>interval data</subject><subject>Intervals</subject><subject>Mathematical analysis</subject><subject>median rank equation</subject><subject>outlier detection</subject><subject>probability plotting</subject><subject>Protection</subject><subject>Regression</subject><subject>right censored data</subject><subject>Studies</subject><subject>suspended</subject><subject>Troubleshooting</subject><subject>Voltage</subject><issn>0018-9529</issn><issn>1558-1721</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkM1PAjEUxBujiYiePXjZxIMXF9puP7ZHAqgkGA3ieVO7r7JkodgWEv57SyAePL1M5jcvk0HoluAeIVj157MexUlQzEpR4jPUIZyXOZGUnKMOxqTMFafqEl2FsEySMVV20GSQvXttYmN0-5hN1mu307HZQfYKceHqzDqfjVsw0bv8IybLZKMmmIX235CNdNTZYK3bfWjCNbqwug1wc7pd9Pk0ng9f8unb82Q4mOaGSh5zWzKhGBdMGAJafClWpJrKloJIK2tbcGy0BkNTRW7B6hqEgVokS2BKdNFFD8e_G-9-thBitUqFoG31Gtw2VJIXolBSkETe_yOXbutT3VARTNMuWEmaqP6RMt6F4MFWG9-stN8nqDosW81n1WHZ6rRsStwdEw0A_NGcSc5YWfwCr2Vy2Q</recordid><startdate>201006</startdate><enddate>201006</enddate><creator>Chien, Wei-Ting Kary</creator><creator>Yang, Siyuan Frank</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>201006</creationdate><title>A Practical, Innovative Method for Electro-Static Discharge Data Analysis</title><author>Chien, Wei-Ting Kary ; Yang, Siyuan Frank</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c275t-f846945646c1ea6b9435589f8617f7df350caaec20015fefade6ced67df6021a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Biological system modeling</topic><topic>Circuit simulation</topic><topic>Circuit testing</topic><topic>Circuits</topic><topic>Confidence</topic><topic>Data analysis</topic><topic>Deviation</topic><topic>electro-static discharge/damage (ESD)</topic><topic>Electrostatic discharge</topic><topic>Electrostatic discharges</topic><topic>Humans</topic><topic>Integrated circuit modeling</topic><topic>Integrated circuit testing</topic><topic>interval data</topic><topic>Intervals</topic><topic>Mathematical analysis</topic><topic>median rank equation</topic><topic>outlier detection</topic><topic>probability plotting</topic><topic>Protection</topic><topic>Regression</topic><topic>right censored data</topic><topic>Studies</topic><topic>suspended</topic><topic>Troubleshooting</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chien, Wei-Ting Kary</creatorcontrib><creatorcontrib>Yang, Siyuan Frank</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chien, Wei-Ting Kary</au><au>Yang, Siyuan Frank</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Practical, Innovative Method for Electro-Static Discharge Data Analysis</atitle><jtitle>IEEE transactions on reliability</jtitle><stitle>TR</stitle><date>2010-06</date><risdate>2010</risdate><volume>59</volume><issue>2</issue><spage>440</spage><epage>446</epage><pages>440-446</pages><issn>0018-9529</issn><eissn>1558-1721</eissn><coden>IERQAD</coden><abstract>A practical method to identify outliers in interval data mixed with some right censored data is proposed. It is based on a simple concept of determining the probability that a deviation of an outlier, by chance, from the probability line which was fitted by the data set with the outlier deleted. The median rank method is employed to determine its sample failing fraction to construct the probability plot. A special treatment is employed to treat the suspect outlier when making probability plots and regression with the suspect outlier deleted. The Fisher Matrix is used to determine the confidence bound, and to assist the estimation of the probability. A critical interval is then defined based on the calculated confidence bound in ESD (Electrostatic Discharge) data, and then the complicated methods are simplified with a simple linear regression using Excel to determine the distance that the possible outlier deviates from the regression line. The remaining work is to simply compare the distance with the critical interval before making a decision about what to do next, such as re-do ESD tests or refine ESD circuits, perform troubleshooting on the manufacturing process, and/or implement process changes for the IC product's ESD performance improvement.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TR.2010.2048680</doi><tpages>7</tpages></addata></record> |
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subjects | Biological system modeling Circuit simulation Circuit testing Circuits Confidence Data analysis Deviation electro-static discharge/damage (ESD) Electrostatic discharge Electrostatic discharges Humans Integrated circuit modeling Integrated circuit testing interval data Intervals Mathematical analysis median rank equation outlier detection probability plotting Protection Regression right censored data Studies suspended Troubleshooting Voltage |
title | A Practical, Innovative Method for Electro-Static Discharge Data Analysis |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T21%3A30%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Practical,%20Innovative%20Method%20for%20Electro-Static%20Discharge%20Data%20Analysis&rft.jtitle=IEEE%20transactions%20on%20reliability&rft.au=Chien,%20Wei-Ting%20Kary&rft.date=2010-06&rft.volume=59&rft.issue=2&rft.spage=440&rft.epage=446&rft.pages=440-446&rft.issn=0018-9529&rft.eissn=1558-1721&rft.coden=IERQAD&rft_id=info:doi/10.1109/TR.2010.2048680&rft_dat=%3Cproquest_RIE%3E2717039661%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1027210972&rft_id=info:pmid/&rft_ieee_id=5475448&rfr_iscdi=true |