Path clustering for adaptive test

Adaptive test is one of the most efficient techniques that practically ensure high yield and reliability of designed chips. In this paper, a novel path-clustering method suitable for the adaptive test, in which test paths are altered according to the monitored process-parameters, is proposed. Consid...

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Bibliographische Detailangaben

Hauptverfasser:	Uezono, Takumi, Takahashi, Tomoyuki, Shintani, Michihiro, Hatayama, Kazumi, Masu, Kazuya, Ochi, Hiroyuki, Sato, Takashi
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit faults Circuit synthesis Circuit testing Clustering algorithms Delay Semiconductor device measurement Semiconductor device testing System testing Timing Very large scale integration
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