Limitations of digital CMOS-processes for analog applications due to channel length modulation and hot carrier degradation

As opposed to digital circuits, output resistance and stability of output current are vital parameters for the precision of analog circuits. Both the non-ideal shape of the output characteristics and degradation after hot carrier stress deteriorates these parameters. This paper discusses two example...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	ESSDERC '91: 21st European Solid State Device Research Conference 1991, Vol.15 (1), p.429-432
Hauptverfasser:	Steimle, M., Mühloff, H.-H.
Format:	Artikel
Sprache:	eng
Schlagworte:	Analog circuits Degradation Digital circuits Digital modulation Hot carriers Mirrors MOS devices MOSFETs Stress
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!