Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method

In present paper the method for refractive index determination of isotropic and anisotropic materials in range of millimeter waves was perfected by automation of measuring process. A new scheme was described and measurement error of refractive index was specified.

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Andrushchak, A., Syrotynskiy, O., Andruschak, N.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 224
container_issue
container_start_page 224
container_title
container_volume
creator Andrushchak, A.
Syrotynskiy, O.
Andruschak, N.
description In present paper the method for refractive index determination of isotropic and anisotropic materials in range of millimeter waves was perfected by automation of measuring process. A new scheme was described and measurement error of refractive index was specified.
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5423546</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5423546</ieee_id><sourcerecordid>5423546</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-32d20df78e73b583b2f1d9fa450e57cd4f5422db444f271dcffd2a16e37232873</originalsourceid><addsrcrecordid>eNotjctqwzAQRQWl0JL6C7LRDxj0lr0MoS8IdJN9kKVRomJbQZLTZtVfr_pY3Zkzd-69QU2vu14pKbmqwx1qcn4nhNBeaUrJPfraLCVOpoQ44-jxBCYvKcxHfE7RQs6_0BRIwYwZJ_DJ2BIugMPs4BNyVVxOgKcwjmGCasQf5lJ5MvMR8HCthgo9pFivKdi2LGn-KajrKboHdOtrMjT_ukL7p8f99qXdvT2_bje7NvSktJw5RpzXHWg-yI4PzFPXeyMkAamtE14KxtwghPBMU2e9d8xQBVwzzjrNV2j9FxsA4HBOYTLpeqhPXArFvwH44Vuq</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Andrushchak, A. ; Syrotynskiy, O. ; Andruschak, N.</creator><creatorcontrib>Andrushchak, A. ; Syrotynskiy, O. ; Andruschak, N.</creatorcontrib><description>In present paper the method for refractive index determination of isotropic and anisotropic materials in range of millimeter waves was perfected by automation of measuring process. A new scheme was described and measurement error of refractive index was specified.</description><identifier>ISBN: 9789665536789</identifier><identifier>ISBN: 9665536788</identifier><language>eng</language><publisher>IEEE</publisher><subject>Anisotropic magnetoresistance ; interferometric-turning method ; isotropic and anisotropic materials ; Materials ; Millimeter wave measurements ; Millimeter wave technology ; Receivers ; Refractive index ; Turning</subject><ispartof>2008 International Conference on "Modern Problems of Radio Engineering, Telecommunications and Computer Science" (TCSET), 2008, p.224-224</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5423546$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,778,782,787,788,2054,54903</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5423546$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Andrushchak, A.</creatorcontrib><creatorcontrib>Syrotynskiy, O.</creatorcontrib><creatorcontrib>Andruschak, N.</creatorcontrib><title>Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method</title><title>2008 International Conference on "Modern Problems of Radio Engineering, Telecommunications and Computer Science" (TCSET)</title><addtitle>TCSET</addtitle><description>In present paper the method for refractive index determination of isotropic and anisotropic materials in range of millimeter waves was perfected by automation of measuring process. A new scheme was described and measurement error of refractive index was specified.</description><subject>Anisotropic magnetoresistance</subject><subject>interferometric-turning method</subject><subject>isotropic and anisotropic materials</subject><subject>Materials</subject><subject>Millimeter wave measurements</subject><subject>Millimeter wave technology</subject><subject>Receivers</subject><subject>Refractive index</subject><subject>Turning</subject><isbn>9789665536789</isbn><isbn>9665536788</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjctqwzAQRQWl0JL6C7LRDxj0lr0MoS8IdJN9kKVRomJbQZLTZtVfr_pY3Zkzd-69QU2vu14pKbmqwx1qcn4nhNBeaUrJPfraLCVOpoQ44-jxBCYvKcxHfE7RQs6_0BRIwYwZJ_DJ2BIugMPs4BNyVVxOgKcwjmGCasQf5lJ5MvMR8HCthgo9pFivKdi2LGn-KajrKboHdOtrMjT_ukL7p8f99qXdvT2_bje7NvSktJw5RpzXHWg-yI4PzFPXeyMkAamtE14KxtwghPBMU2e9d8xQBVwzzjrNV2j9FxsA4HBOYTLpeqhPXArFvwH44Vuq</recordid><startdate>200802</startdate><enddate>200802</enddate><creator>Andrushchak, A.</creator><creator>Syrotynskiy, O.</creator><creator>Andruschak, N.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200802</creationdate><title>Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method</title><author>Andrushchak, A. ; Syrotynskiy, O. ; Andruschak, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-32d20df78e73b583b2f1d9fa450e57cd4f5422db444f271dcffd2a16e37232873</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Anisotropic magnetoresistance</topic><topic>interferometric-turning method</topic><topic>isotropic and anisotropic materials</topic><topic>Materials</topic><topic>Millimeter wave measurements</topic><topic>Millimeter wave technology</topic><topic>Receivers</topic><topic>Refractive index</topic><topic>Turning</topic><toplevel>online_resources</toplevel><creatorcontrib>Andrushchak, A.</creatorcontrib><creatorcontrib>Syrotynskiy, O.</creatorcontrib><creatorcontrib>Andruschak, N.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Andrushchak, A.</au><au>Syrotynskiy, O.</au><au>Andruschak, N.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method</atitle><btitle>2008 International Conference on "Modern Problems of Radio Engineering, Telecommunications and Computer Science" (TCSET)</btitle><stitle>TCSET</stitle><date>2008-02</date><risdate>2008</risdate><spage>224</spage><epage>224</epage><pages>224-224</pages><isbn>9789665536789</isbn><isbn>9665536788</isbn><abstract>In present paper the method for refractive index determination of isotropic and anisotropic materials in range of millimeter waves was perfected by automation of measuring process. A new scheme was described and measurement error of refractive index was specified.</abstract><pub>IEEE</pub><tpages>1</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 9789665536789
ispartof 2008 International Conference on "Modern Problems of Radio Engineering, Telecommunications and Computer Science" (TCSET), 2008, p.224-224
issn
language eng
recordid cdi_ieee_primary_5423546
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Anisotropic magnetoresistance
interferometric-turning method
isotropic and anisotropic materials
Materials
Millimeter wave measurements
Millimeter wave technology
Receivers
Refractive index
Turning
title Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T08%3A07%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Automation%20of%20measuring%20process%20of%20materials%20refractive%20indexes%20in%20the%20millimeter%20waves%20range%20by%20interferometric-turning%20method&rft.btitle=2008%20International%20Conference%20on%20%22Modern%20Problems%20of%20Radio%20Engineering,%20Telecommunications%20and%20Computer%20Science%22%20(TCSET)&rft.au=Andrushchak,%20A.&rft.date=2008-02&rft.spage=224&rft.epage=224&rft.pages=224-224&rft.isbn=9789665536789&rft.isbn_list=9665536788&rft_id=info:doi/&rft_dat=%3Cieee_6IE%3E5423546%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5423546&rfr_iscdi=true