Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method
In present paper the method for refractive index determination of isotropic and anisotropic materials in range of millimeter waves was perfected by automation of measuring process. A new scheme was described and measurement error of refractive index was specified.
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creator | Andrushchak, A. Syrotynskiy, O. Andruschak, N. |
description | In present paper the method for refractive index determination of isotropic and anisotropic materials in range of millimeter waves was perfected by automation of measuring process. A new scheme was described and measurement error of refractive index was specified. |
format | Conference Proceeding |
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A new scheme was described and measurement error of refractive index was specified.</description><subject>Anisotropic magnetoresistance</subject><subject>interferometric-turning method</subject><subject>isotropic and anisotropic materials</subject><subject>Materials</subject><subject>Millimeter wave measurements</subject><subject>Millimeter wave technology</subject><subject>Receivers</subject><subject>Refractive index</subject><subject>Turning</subject><isbn>9789665536789</isbn><isbn>9665536788</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjctqwzAQRQWl0JL6C7LRDxj0lr0MoS8IdJN9kKVRomJbQZLTZtVfr_pY3Zkzd-69QU2vu14pKbmqwx1qcn4nhNBeaUrJPfraLCVOpoQ44-jxBCYvKcxHfE7RQs6_0BRIwYwZJ_DJ2BIugMPs4BNyVVxOgKcwjmGCasQf5lJ5MvMR8HCthgo9pFivKdi2LGn-KajrKboHdOtrMjT_ukL7p8f99qXdvT2_bje7NvSktJw5RpzXHWg-yI4PzFPXeyMkAamtE14KxtwghPBMU2e9d8xQBVwzzjrNV2j9FxsA4HBOYTLpeqhPXArFvwH44Vuq</recordid><startdate>200802</startdate><enddate>200802</enddate><creator>Andrushchak, A.</creator><creator>Syrotynskiy, O.</creator><creator>Andruschak, N.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200802</creationdate><title>Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method</title><author>Andrushchak, A. ; Syrotynskiy, O. ; Andruschak, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-32d20df78e73b583b2f1d9fa450e57cd4f5422db444f271dcffd2a16e37232873</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Anisotropic magnetoresistance</topic><topic>interferometric-turning method</topic><topic>isotropic and anisotropic materials</topic><topic>Materials</topic><topic>Millimeter wave measurements</topic><topic>Millimeter wave technology</topic><topic>Receivers</topic><topic>Refractive index</topic><topic>Turning</topic><toplevel>online_resources</toplevel><creatorcontrib>Andrushchak, A.</creatorcontrib><creatorcontrib>Syrotynskiy, O.</creatorcontrib><creatorcontrib>Andruschak, N.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Andrushchak, A.</au><au>Syrotynskiy, O.</au><au>Andruschak, N.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method</atitle><btitle>2008 International Conference on "Modern Problems of Radio Engineering, Telecommunications and Computer Science" (TCSET)</btitle><stitle>TCSET</stitle><date>2008-02</date><risdate>2008</risdate><spage>224</spage><epage>224</epage><pages>224-224</pages><isbn>9789665536789</isbn><isbn>9665536788</isbn><abstract>In present paper the method for refractive index determination of isotropic and anisotropic materials in range of millimeter waves was perfected by automation of measuring process. A new scheme was described and measurement error of refractive index was specified.</abstract><pub>IEEE</pub><tpages>1</tpages></addata></record> |
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identifier | ISBN: 9789665536789 |
ispartof | 2008 International Conference on "Modern Problems of Radio Engineering, Telecommunications and Computer Science" (TCSET), 2008, p.224-224 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Anisotropic magnetoresistance interferometric-turning method isotropic and anisotropic materials Materials Millimeter wave measurements Millimeter wave technology Receivers Refractive index Turning |
title | Automation of measuring process of materials refractive indexes in the millimeter waves range by interferometric-turning method |
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