Diffraction enhanced imaging with pulsed terahertz radiation
Terahertz radiation can penetrate through most non-conducting materials. Imaging with terahertz waves for these materials could provide an appropriate contrast compared with infrared, visible light and X-ray. Edge diffraction in terahertz pulsed imaging (TPI) enables the image contrast to be further...
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| creator | Yingxin Wang Ziran Zhao Zhiqiang Chen Li Zhang Kejun Kang Jingkang Deng Zhifeng Huang |
| description | Terahertz radiation can penetrate through most non-conducting materials. Imaging with terahertz waves for these materials could provide an appropriate contrast compared with infrared, visible light and X-ray. Edge diffraction in terahertz pulsed imaging (TPI) enables the image contrast to be further enhanced, which exhibits considerable application potential to recognize shape features in the sample under test, especially for those weak absorption materials. In this report, we perform a theoretical investigation on the edge diffraction effect and present a diffraction enhanced imaging method based on pulsed terahertz radiation without modification of the conventional TPI system. Experimental results demonstrate the capability of our method for image quality improvement. |
| doi_str_mv | 10.1109/NSSMIC.2009.5402100 |
| format | Conference Proceeding |
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Imaging with terahertz waves for these materials could provide an appropriate contrast compared with infrared, visible light and X-ray. Edge diffraction in terahertz pulsed imaging (TPI) enables the image contrast to be further enhanced, which exhibits considerable application potential to recognize shape features in the sample under test, especially for those weak absorption materials. In this report, we perform a theoretical investigation on the edge diffraction effect and present a diffraction enhanced imaging method based on pulsed terahertz radiation without modification of the conventional TPI system. 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Experimental results demonstrate the capability of our method for image quality improvement.</description><subject>contrast enhancement</subject><subject>edge diffraction</subject><subject>Electromagnetic wave absorption</subject><subject>Image quality</subject><subject>Image recognition</subject><subject>Infrared imaging</subject><subject>Materials testing</subject><subject>nondestructive testing</subject><subject>Optical imaging</subject><subject>phase step</subject><subject>Pulse shaping methods</subject><subject>Shape</subject><subject>terahertz pulsed imaging</subject><subject>X-ray diffraction</subject><subject>X-ray imaging</subject><issn>1082-3654</issn><issn>2577-0829</issn><isbn>9781424439614</isbn><isbn>1424439612</isbn><isbn>9781424439621</isbn><isbn>1424439620</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVkM1OwzAQhM2fRCh9gl7yAgm79jqOJS6oFKhU4FA4V-vEaYwgVE4QgqcniF44jfSNZjQaIWYIOSLYi4f1-n45zyWAzTWBRIADMbWmRJJEyhYSD0UitTEZlNIe_fOQjkWCI89UoelUnPX9C4AERZSIy-vQNJGrIbx3qe9a7ipfp-GNt6Hbpp9haNPdx2s_ssFHbn0cvtPIdeDfwLk4aXg0p3udiOebxdP8Lls93i7nV6ssoNFDpqHRRF5hSaZk6yQ24BRbSZUHLqRRlXJgS64a5yx4dLYwXnlZK2JAqSZi9tcbvPebXRznxa_N_gj1A35pTVU</recordid><startdate>200910</startdate><enddate>200910</enddate><creator>Yingxin Wang</creator><creator>Ziran Zhao</creator><creator>Zhiqiang Chen</creator><creator>Li Zhang</creator><creator>Kejun Kang</creator><creator>Jingkang Deng</creator><creator>Zhifeng Huang</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200910</creationdate><title>Diffraction enhanced imaging with pulsed terahertz radiation</title><author>Yingxin Wang ; Ziran Zhao ; Zhiqiang Chen ; Li Zhang ; Kejun Kang ; Jingkang Deng ; Zhifeng Huang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-50f544e318478a9b21f0b3a924ce0a6273c3b098acfbb90e1b967e3e2d34a0123</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>contrast enhancement</topic><topic>edge diffraction</topic><topic>Electromagnetic wave absorption</topic><topic>Image quality</topic><topic>Image recognition</topic><topic>Infrared imaging</topic><topic>Materials testing</topic><topic>nondestructive testing</topic><topic>Optical imaging</topic><topic>phase step</topic><topic>Pulse shaping methods</topic><topic>Shape</topic><topic>terahertz pulsed imaging</topic><topic>X-ray diffraction</topic><topic>X-ray imaging</topic><toplevel>online_resources</toplevel><creatorcontrib>Yingxin Wang</creatorcontrib><creatorcontrib>Ziran Zhao</creatorcontrib><creatorcontrib>Zhiqiang Chen</creatorcontrib><creatorcontrib>Li Zhang</creatorcontrib><creatorcontrib>Kejun Kang</creatorcontrib><creatorcontrib>Jingkang Deng</creatorcontrib><creatorcontrib>Zhifeng Huang</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yingxin Wang</au><au>Ziran Zhao</au><au>Zhiqiang Chen</au><au>Li Zhang</au><au>Kejun Kang</au><au>Jingkang Deng</au><au>Zhifeng Huang</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Diffraction enhanced imaging with pulsed terahertz radiation</atitle><btitle>2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)</btitle><stitle>NSSMIC</stitle><date>2009-10</date><risdate>2009</risdate><spage>2465</spage><epage>2468</epage><pages>2465-2468</pages><issn>1082-3654</issn><eissn>2577-0829</eissn><isbn>9781424439614</isbn><isbn>1424439612</isbn><eisbn>9781424439621</eisbn><eisbn>1424439620</eisbn><abstract>Terahertz radiation can penetrate through most non-conducting materials. Imaging with terahertz waves for these materials could provide an appropriate contrast compared with infrared, visible light and X-ray. Edge diffraction in terahertz pulsed imaging (TPI) enables the image contrast to be further enhanced, which exhibits considerable application potential to recognize shape features in the sample under test, especially for those weak absorption materials. In this report, we perform a theoretical investigation on the edge diffraction effect and present a diffraction enhanced imaging method based on pulsed terahertz radiation without modification of the conventional TPI system. Experimental results demonstrate the capability of our method for image quality improvement.</abstract><pub>IEEE</pub><doi>10.1109/NSSMIC.2009.5402100</doi><tpages>4</tpages></addata></record> |
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| ispartof | 2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC), 2009, p.2465-2468 |
| issn | 1082-3654 2577-0829 |
| language | eng |
| recordid | cdi_ieee_primary_5402100 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | contrast enhancement edge diffraction Electromagnetic wave absorption Image quality Image recognition Infrared imaging Materials testing nondestructive testing Optical imaging phase step Pulse shaping methods Shape terahertz pulsed imaging X-ray diffraction X-ray imaging |
| title | Diffraction enhanced imaging with pulsed terahertz radiation |
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