An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts

The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated te...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Thanasas, D., Georgiou, E., Giokaris, N., Karabarbounis, A., Maintas, D., Mikeli, M., Papanicolas, C.N., Ragkousis, L., Stiliaris, E.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2769
container_issue
container_start_page 2766
container_title
container_volume
creator Thanasas, D.
Georgiou, E.
Giokaris, N.
Karabarbounis, A.
Maintas, D.
Mikeli, M.
Papanicolas, C.N.
Ragkousis, L.
Stiliaris, E.
description The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated techniques operating on the charge signals from the individual wires of the multi-anode systems. However, a similar algorithmic approach for the simple case, where the resistive chain readout technique is used and, consequently, the original charge distribution information is lost, is not applicable. In this work the development of a new method to eliminate these distortion effects in the planar images for γ-Camera systems based on resistive chain techniques is presented. The proposed model, which incorporates an a priori knowledge of three parameters related to light diffusion inside the scintillation crystal in use, provides an accurate, analytically calculated estimate of the spatial correction as a function of the primary reconstructed planar position from the resistive chain signals. This algorithm can be used online on an event-by-event basis and can be applied to both, homogeneous and pixelated crystals.
doi_str_mv 10.1109/NSSMIC.2009.5401955
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5401955</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5401955</ieee_id><sourcerecordid>5401955</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-5321468fcc20dfb2baff3bc16ba9a1267b265852efd80753b7368650cf0878703</originalsourceid><addsrcrecordid>eNpVUMtOAjEUra9ERL6ATX9g8PbdLslEkQR1ga5Jp7RQMw_SjiZ8l__hNzlRNq7OK_fm5CA0JTAjBMzd83r9tCxnFMDMBAdihDhDE6M04ZRzZiQl52hEhVIFaGou_mWEX6IRGfyCScGv0U3O7wAUGOcj5Octtq2tj310tsaHLsc-di12XUre_VJb77oU-32DQ5fw91dR2sYniw_1cJhwbOzOZxxS1-Dkc8x9_PTY7W1sB2233Uefb9FVsHX2kxOO0dvD_Wv5WKxeFstyvioiUaIvBKOESx2co7ANFa1sCKxyRFbWWEKlqqgUWlAfthqUYJViUksBLoBWWgEbo-nf3-i93xzS0C0dN6fF2A8Kc11i</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Thanasas, D. ; Georgiou, E. ; Giokaris, N. ; Karabarbounis, A. ; Maintas, D. ; Mikeli, M. ; Papanicolas, C.N. ; Ragkousis, L. ; Stiliaris, E.</creator><creatorcontrib>Thanasas, D. ; Georgiou, E. ; Giokaris, N. ; Karabarbounis, A. ; Maintas, D. ; Mikeli, M. ; Papanicolas, C.N. ; Ragkousis, L. ; Stiliaris, E.</creatorcontrib><description>The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated techniques operating on the charge signals from the individual wires of the multi-anode systems. However, a similar algorithmic approach for the simple case, where the resistive chain readout technique is used and, consequently, the original charge distribution information is lost, is not applicable. In this work the development of a new method to eliminate these distortion effects in the planar images for γ-Camera systems based on resistive chain techniques is presented. The proposed model, which incorporates an a priori knowledge of three parameters related to light diffusion inside the scintillation crystal in use, provides an accurate, analytically calculated estimate of the spatial correction as a function of the primary reconstructed planar position from the resistive chain signals. This algorithm can be used online on an event-by-event basis and can be applied to both, homogeneous and pixelated crystals.</description><identifier>ISSN: 1082-3654</identifier><identifier>ISBN: 9781424439614</identifier><identifier>ISBN: 1424439612</identifier><identifier>EISSN: 2577-0829</identifier><identifier>EISBN: 9781424439621</identifier><identifier>EISBN: 1424439620</identifier><identifier>DOI: 10.1109/NSSMIC.2009.5401955</identifier><language>eng</language><publisher>IEEE</publisher><subject>Algorithm design and analysis ; Equations ; Event detection ; Humans ; Image analysis ; Image reconstruction ; Nuclear and plasma sciences ; Photomultipliers ; Position sensitive particle detectors ; Wire</subject><ispartof>2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC), 2009, p.2766-2769</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5401955$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>310,311,782,786,791,792,2060,27932,54927</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5401955$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Thanasas, D.</creatorcontrib><creatorcontrib>Georgiou, E.</creatorcontrib><creatorcontrib>Giokaris, N.</creatorcontrib><creatorcontrib>Karabarbounis, A.</creatorcontrib><creatorcontrib>Maintas, D.</creatorcontrib><creatorcontrib>Mikeli, M.</creatorcontrib><creatorcontrib>Papanicolas, C.N.</creatorcontrib><creatorcontrib>Ragkousis, L.</creatorcontrib><creatorcontrib>Stiliaris, E.</creatorcontrib><title>An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts</title><title>2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)</title><addtitle>NSSMIC</addtitle><description>The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated techniques operating on the charge signals from the individual wires of the multi-anode systems. However, a similar algorithmic approach for the simple case, where the resistive chain readout technique is used and, consequently, the original charge distribution information is lost, is not applicable. In this work the development of a new method to eliminate these distortion effects in the planar images for γ-Camera systems based on resistive chain techniques is presented. The proposed model, which incorporates an a priori knowledge of three parameters related to light diffusion inside the scintillation crystal in use, provides an accurate, analytically calculated estimate of the spatial correction as a function of the primary reconstructed planar position from the resistive chain signals. This algorithm can be used online on an event-by-event basis and can be applied to both, homogeneous and pixelated crystals.</description><subject>Algorithm design and analysis</subject><subject>Equations</subject><subject>Event detection</subject><subject>Humans</subject><subject>Image analysis</subject><subject>Image reconstruction</subject><subject>Nuclear and plasma sciences</subject><subject>Photomultipliers</subject><subject>Position sensitive particle detectors</subject><subject>Wire</subject><issn>1082-3654</issn><issn>2577-0829</issn><isbn>9781424439614</isbn><isbn>1424439612</isbn><isbn>9781424439621</isbn><isbn>1424439620</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVUMtOAjEUra9ERL6ATX9g8PbdLslEkQR1ga5Jp7RQMw_SjiZ8l__hNzlRNq7OK_fm5CA0JTAjBMzd83r9tCxnFMDMBAdihDhDE6M04ZRzZiQl52hEhVIFaGou_mWEX6IRGfyCScGv0U3O7wAUGOcj5Octtq2tj310tsaHLsc-di12XUre_VJb77oU-32DQ5fw91dR2sYniw_1cJhwbOzOZxxS1-Dkc8x9_PTY7W1sB2233Uefb9FVsHX2kxOO0dvD_Wv5WKxeFstyvioiUaIvBKOESx2co7ANFa1sCKxyRFbWWEKlqqgUWlAfthqUYJViUksBLoBWWgEbo-nf3-i93xzS0C0dN6fF2A8Kc11i</recordid><startdate>200910</startdate><enddate>200910</enddate><creator>Thanasas, D.</creator><creator>Georgiou, E.</creator><creator>Giokaris, N.</creator><creator>Karabarbounis, A.</creator><creator>Maintas, D.</creator><creator>Mikeli, M.</creator><creator>Papanicolas, C.N.</creator><creator>Ragkousis, L.</creator><creator>Stiliaris, E.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200910</creationdate><title>An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts</title><author>Thanasas, D. ; Georgiou, E. ; Giokaris, N. ; Karabarbounis, A. ; Maintas, D. ; Mikeli, M. ; Papanicolas, C.N. ; Ragkousis, L. ; Stiliaris, E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-5321468fcc20dfb2baff3bc16ba9a1267b265852efd80753b7368650cf0878703</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Algorithm design and analysis</topic><topic>Equations</topic><topic>Event detection</topic><topic>Humans</topic><topic>Image analysis</topic><topic>Image reconstruction</topic><topic>Nuclear and plasma sciences</topic><topic>Photomultipliers</topic><topic>Position sensitive particle detectors</topic><topic>Wire</topic><toplevel>online_resources</toplevel><creatorcontrib>Thanasas, D.</creatorcontrib><creatorcontrib>Georgiou, E.</creatorcontrib><creatorcontrib>Giokaris, N.</creatorcontrib><creatorcontrib>Karabarbounis, A.</creatorcontrib><creatorcontrib>Maintas, D.</creatorcontrib><creatorcontrib>Mikeli, M.</creatorcontrib><creatorcontrib>Papanicolas, C.N.</creatorcontrib><creatorcontrib>Ragkousis, L.</creatorcontrib><creatorcontrib>Stiliaris, E.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Thanasas, D.</au><au>Georgiou, E.</au><au>Giokaris, N.</au><au>Karabarbounis, A.</au><au>Maintas, D.</au><au>Mikeli, M.</au><au>Papanicolas, C.N.</au><au>Ragkousis, L.</au><au>Stiliaris, E.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts</atitle><btitle>2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)</btitle><stitle>NSSMIC</stitle><date>2009-10</date><risdate>2009</risdate><spage>2766</spage><epage>2769</epage><pages>2766-2769</pages><issn>1082-3654</issn><eissn>2577-0829</eissn><isbn>9781424439614</isbn><isbn>1424439612</isbn><eisbn>9781424439621</eisbn><eisbn>1424439620</eisbn><abstract>The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated techniques operating on the charge signals from the individual wires of the multi-anode systems. However, a similar algorithmic approach for the simple case, where the resistive chain readout technique is used and, consequently, the original charge distribution information is lost, is not applicable. In this work the development of a new method to eliminate these distortion effects in the planar images for γ-Camera systems based on resistive chain techniques is presented. The proposed model, which incorporates an a priori knowledge of three parameters related to light diffusion inside the scintillation crystal in use, provides an accurate, analytically calculated estimate of the spatial correction as a function of the primary reconstructed planar position from the resistive chain signals. This algorithm can be used online on an event-by-event basis and can be applied to both, homogeneous and pixelated crystals.</abstract><pub>IEEE</pub><doi>10.1109/NSSMIC.2009.5401955</doi><tpages>4</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1082-3654
ispartof 2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC), 2009, p.2766-2769
issn 1082-3654
2577-0829
language eng
recordid cdi_ieee_primary_5401955
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Algorithm design and analysis
Equations
Event detection
Humans
Image analysis
Image reconstruction
Nuclear and plasma sciences
Photomultipliers
Position sensitive particle detectors
Wire
title An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-04T22%3A51%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=An%20analytical%20position%20correction%20algorithm%20for%20%CE%B3-Camera%20planar%20images%20from%20resistive%20chain%20readouts&rft.btitle=2009%20IEEE%20Nuclear%20Science%20Symposium%20Conference%20Record%20(NSS/MIC)&rft.au=Thanasas,%20D.&rft.date=2009-10&rft.spage=2766&rft.epage=2769&rft.pages=2766-2769&rft.issn=1082-3654&rft.eissn=2577-0829&rft.isbn=9781424439614&rft.isbn_list=1424439612&rft_id=info:doi/10.1109/NSSMIC.2009.5401955&rft_dat=%3Cieee_6IE%3E5401955%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424439621&rft.eisbn_list=1424439620&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5401955&rfr_iscdi=true