An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts
The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated te...
Gespeichert in:
Hauptverfasser: | , , , , , , , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 2769 |
---|---|
container_issue | |
container_start_page | 2766 |
container_title | |
container_volume | |
creator | Thanasas, D. Georgiou, E. Giokaris, N. Karabarbounis, A. Maintas, D. Mikeli, M. Papanicolas, C.N. Ragkousis, L. Stiliaris, E. |
description | The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated techniques operating on the charge signals from the individual wires of the multi-anode systems. However, a similar algorithmic approach for the simple case, where the resistive chain readout technique is used and, consequently, the original charge distribution information is lost, is not applicable. In this work the development of a new method to eliminate these distortion effects in the planar images for γ-Camera systems based on resistive chain techniques is presented. The proposed model, which incorporates an a priori knowledge of three parameters related to light diffusion inside the scintillation crystal in use, provides an accurate, analytically calculated estimate of the spatial correction as a function of the primary reconstructed planar position from the resistive chain signals. This algorithm can be used online on an event-by-event basis and can be applied to both, homogeneous and pixelated crystals. |
doi_str_mv | 10.1109/NSSMIC.2009.5401955 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5401955</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5401955</ieee_id><sourcerecordid>5401955</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-5321468fcc20dfb2baff3bc16ba9a1267b265852efd80753b7368650cf0878703</originalsourceid><addsrcrecordid>eNpVUMtOAjEUra9ERL6ATX9g8PbdLslEkQR1ga5Jp7RQMw_SjiZ8l__hNzlRNq7OK_fm5CA0JTAjBMzd83r9tCxnFMDMBAdihDhDE6M04ZRzZiQl52hEhVIFaGou_mWEX6IRGfyCScGv0U3O7wAUGOcj5Octtq2tj310tsaHLsc-di12XUre_VJb77oU-32DQ5fw91dR2sYniw_1cJhwbOzOZxxS1-Dkc8x9_PTY7W1sB2233Uefb9FVsHX2kxOO0dvD_Wv5WKxeFstyvioiUaIvBKOESx2co7ANFa1sCKxyRFbWWEKlqqgUWlAfthqUYJViUksBLoBWWgEbo-nf3-i93xzS0C0dN6fF2A8Kc11i</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Thanasas, D. ; Georgiou, E. ; Giokaris, N. ; Karabarbounis, A. ; Maintas, D. ; Mikeli, M. ; Papanicolas, C.N. ; Ragkousis, L. ; Stiliaris, E.</creator><creatorcontrib>Thanasas, D. ; Georgiou, E. ; Giokaris, N. ; Karabarbounis, A. ; Maintas, D. ; Mikeli, M. ; Papanicolas, C.N. ; Ragkousis, L. ; Stiliaris, E.</creatorcontrib><description>The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated techniques operating on the charge signals from the individual wires of the multi-anode systems. However, a similar algorithmic approach for the simple case, where the resistive chain readout technique is used and, consequently, the original charge distribution information is lost, is not applicable. In this work the development of a new method to eliminate these distortion effects in the planar images for γ-Camera systems based on resistive chain techniques is presented. The proposed model, which incorporates an a priori knowledge of three parameters related to light diffusion inside the scintillation crystal in use, provides an accurate, analytically calculated estimate of the spatial correction as a function of the primary reconstructed planar position from the resistive chain signals. This algorithm can be used online on an event-by-event basis and can be applied to both, homogeneous and pixelated crystals.</description><identifier>ISSN: 1082-3654</identifier><identifier>ISBN: 9781424439614</identifier><identifier>ISBN: 1424439612</identifier><identifier>EISSN: 2577-0829</identifier><identifier>EISBN: 9781424439621</identifier><identifier>EISBN: 1424439620</identifier><identifier>DOI: 10.1109/NSSMIC.2009.5401955</identifier><language>eng</language><publisher>IEEE</publisher><subject>Algorithm design and analysis ; Equations ; Event detection ; Humans ; Image analysis ; Image reconstruction ; Nuclear and plasma sciences ; Photomultipliers ; Position sensitive particle detectors ; Wire</subject><ispartof>2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC), 2009, p.2766-2769</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5401955$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>310,311,782,786,791,792,2060,27932,54927</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5401955$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Thanasas, D.</creatorcontrib><creatorcontrib>Georgiou, E.</creatorcontrib><creatorcontrib>Giokaris, N.</creatorcontrib><creatorcontrib>Karabarbounis, A.</creatorcontrib><creatorcontrib>Maintas, D.</creatorcontrib><creatorcontrib>Mikeli, M.</creatorcontrib><creatorcontrib>Papanicolas, C.N.</creatorcontrib><creatorcontrib>Ragkousis, L.</creatorcontrib><creatorcontrib>Stiliaris, E.</creatorcontrib><title>An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts</title><title>2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)</title><addtitle>NSSMIC</addtitle><description>The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated techniques operating on the charge signals from the individual wires of the multi-anode systems. However, a similar algorithmic approach for the simple case, where the resistive chain readout technique is used and, consequently, the original charge distribution information is lost, is not applicable. In this work the development of a new method to eliminate these distortion effects in the planar images for γ-Camera systems based on resistive chain techniques is presented. The proposed model, which incorporates an a priori knowledge of three parameters related to light diffusion inside the scintillation crystal in use, provides an accurate, analytically calculated estimate of the spatial correction as a function of the primary reconstructed planar position from the resistive chain signals. This algorithm can be used online on an event-by-event basis and can be applied to both, homogeneous and pixelated crystals.</description><subject>Algorithm design and analysis</subject><subject>Equations</subject><subject>Event detection</subject><subject>Humans</subject><subject>Image analysis</subject><subject>Image reconstruction</subject><subject>Nuclear and plasma sciences</subject><subject>Photomultipliers</subject><subject>Position sensitive particle detectors</subject><subject>Wire</subject><issn>1082-3654</issn><issn>2577-0829</issn><isbn>9781424439614</isbn><isbn>1424439612</isbn><isbn>9781424439621</isbn><isbn>1424439620</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVUMtOAjEUra9ERL6ATX9g8PbdLslEkQR1ga5Jp7RQMw_SjiZ8l__hNzlRNq7OK_fm5CA0JTAjBMzd83r9tCxnFMDMBAdihDhDE6M04ZRzZiQl52hEhVIFaGou_mWEX6IRGfyCScGv0U3O7wAUGOcj5Octtq2tj310tsaHLsc-di12XUre_VJb77oU-32DQ5fw91dR2sYniw_1cJhwbOzOZxxS1-Dkc8x9_PTY7W1sB2233Uefb9FVsHX2kxOO0dvD_Wv5WKxeFstyvioiUaIvBKOESx2co7ANFa1sCKxyRFbWWEKlqqgUWlAfthqUYJViUksBLoBWWgEbo-nf3-i93xzS0C0dN6fF2A8Kc11i</recordid><startdate>200910</startdate><enddate>200910</enddate><creator>Thanasas, D.</creator><creator>Georgiou, E.</creator><creator>Giokaris, N.</creator><creator>Karabarbounis, A.</creator><creator>Maintas, D.</creator><creator>Mikeli, M.</creator><creator>Papanicolas, C.N.</creator><creator>Ragkousis, L.</creator><creator>Stiliaris, E.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200910</creationdate><title>An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts</title><author>Thanasas, D. ; Georgiou, E. ; Giokaris, N. ; Karabarbounis, A. ; Maintas, D. ; Mikeli, M. ; Papanicolas, C.N. ; Ragkousis, L. ; Stiliaris, E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-5321468fcc20dfb2baff3bc16ba9a1267b265852efd80753b7368650cf0878703</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Algorithm design and analysis</topic><topic>Equations</topic><topic>Event detection</topic><topic>Humans</topic><topic>Image analysis</topic><topic>Image reconstruction</topic><topic>Nuclear and plasma sciences</topic><topic>Photomultipliers</topic><topic>Position sensitive particle detectors</topic><topic>Wire</topic><toplevel>online_resources</toplevel><creatorcontrib>Thanasas, D.</creatorcontrib><creatorcontrib>Georgiou, E.</creatorcontrib><creatorcontrib>Giokaris, N.</creatorcontrib><creatorcontrib>Karabarbounis, A.</creatorcontrib><creatorcontrib>Maintas, D.</creatorcontrib><creatorcontrib>Mikeli, M.</creatorcontrib><creatorcontrib>Papanicolas, C.N.</creatorcontrib><creatorcontrib>Ragkousis, L.</creatorcontrib><creatorcontrib>Stiliaris, E.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Thanasas, D.</au><au>Georgiou, E.</au><au>Giokaris, N.</au><au>Karabarbounis, A.</au><au>Maintas, D.</au><au>Mikeli, M.</au><au>Papanicolas, C.N.</au><au>Ragkousis, L.</au><au>Stiliaris, E.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts</atitle><btitle>2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)</btitle><stitle>NSSMIC</stitle><date>2009-10</date><risdate>2009</risdate><spage>2766</spage><epage>2769</epage><pages>2766-2769</pages><issn>1082-3654</issn><eissn>2577-0829</eissn><isbn>9781424439614</isbn><isbn>1424439612</isbn><eisbn>9781424439621</eisbn><eisbn>1424439620</eisbn><abstract>The charge limitation for peripheral Field Of View (FOV) events detected by the most commonly used Position Sensitive Photomultiplier Tubes (PSPMTs) results to spatial distortions and non-uniformities of the obtained planar images. These effects can be corrected with newly developed sophisticated techniques operating on the charge signals from the individual wires of the multi-anode systems. However, a similar algorithmic approach for the simple case, where the resistive chain readout technique is used and, consequently, the original charge distribution information is lost, is not applicable. In this work the development of a new method to eliminate these distortion effects in the planar images for γ-Camera systems based on resistive chain techniques is presented. The proposed model, which incorporates an a priori knowledge of three parameters related to light diffusion inside the scintillation crystal in use, provides an accurate, analytically calculated estimate of the spatial correction as a function of the primary reconstructed planar position from the resistive chain signals. This algorithm can be used online on an event-by-event basis and can be applied to both, homogeneous and pixelated crystals.</abstract><pub>IEEE</pub><doi>10.1109/NSSMIC.2009.5401955</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1082-3654 |
ispartof | 2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC), 2009, p.2766-2769 |
issn | 1082-3654 2577-0829 |
language | eng |
recordid | cdi_ieee_primary_5401955 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Algorithm design and analysis Equations Event detection Humans Image analysis Image reconstruction Nuclear and plasma sciences Photomultipliers Position sensitive particle detectors Wire |
title | An analytical position correction algorithm for γ-Camera planar images from resistive chain readouts |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-04T22%3A51%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=An%20analytical%20position%20correction%20algorithm%20for%20%CE%B3-Camera%20planar%20images%20from%20resistive%20chain%20readouts&rft.btitle=2009%20IEEE%20Nuclear%20Science%20Symposium%20Conference%20Record%20(NSS/MIC)&rft.au=Thanasas,%20D.&rft.date=2009-10&rft.spage=2766&rft.epage=2769&rft.pages=2766-2769&rft.issn=1082-3654&rft.eissn=2577-0829&rft.isbn=9781424439614&rft.isbn_list=1424439612&rft_id=info:doi/10.1109/NSSMIC.2009.5401955&rft_dat=%3Cieee_6IE%3E5401955%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424439621&rft.eisbn_list=1424439620&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5401955&rfr_iscdi=true |