Magnetic force microscopy of single-domain cobalt dots patterned using interference lithography

We have fabricated arrays of Co dots having diameters of 100 nm and 70 nm using interference lithography. The density of these arrays is 7.2/spl times/10/sup 9//in/sup 2/. Magnetic force microscopy measurements indicate that the Co dots are single-domain with moments that can be controlled to point...

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Veröffentlicht in:	IEEE transactions on magnetics 1996-09, Vol.32 (5), p.4472-4474
Hauptverfasser:	Fernandez, A., Bedrossian, P.J., Baker, S.L., Vernon, S.P., Kania, D.R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Cobalt Fabrication Interference Laboratories Lithography Magnetic domain walls Magnetic domains Magnetic force microscopy Memory US Department of Transportation
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container_title	IEEE transactions on magnetics
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creator	Fernandez, A. Bedrossian, P.J. Baker, S.L. Vernon, S.P. Kania, D.R.
description	We have fabricated arrays of Co dots having diameters of 100 nm and 70 nm using interference lithography. The density of these arrays is 7.2/spl times/10/sup 9//in/sup 2/. Magnetic force microscopy measurements indicate that the Co dots are single-domain with moments that can be controlled to point either in-plane or out-of-plane. Interference lithography is a process that is easily scaled to large areas and is potentially capable of high throughput. Large, uniform arrays of single-domain structures are potentially useful for high-density, low-noise data storage.
doi_str_mv	10.1109/20.538901
format	Article
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The density of these arrays is 7.2/spl times/10/sup 9//in/sup 2/. Magnetic force microscopy measurements indicate that the Co dots are single-domain with moments that can be controlled to point either in-plane or out-of-plane. Interference lithography is a process that is easily scaled to large areas and is potentially capable of high throughput. Large, uniform arrays of single-domain structures are potentially useful for high-density, low-noise data storage.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/20.538901</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>IEEE</publisher><subject>Cobalt ; Fabrication ; Interference ; Laboratories ; Lithography ; Magnetic domain walls ; Magnetic domains ; Magnetic force microscopy ; Memory ; US Department of Transportation</subject><ispartof>IEEE transactions on magnetics, 1996-09, Vol.32 (5), p.4472-4474</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c378t-bbb3f7ab7d8339c654ec35c761fc47c98c41edddd8c9614df14d3ee0bc11400c3</citedby><cites>FETCH-LOGICAL-c378t-bbb3f7ab7d8339c654ec35c761fc47c98c41edddd8c9614df14d3ee0bc11400c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/538901$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/538901$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Fernandez, A.</creatorcontrib><creatorcontrib>Bedrossian, P.J.</creatorcontrib><creatorcontrib>Baker, S.L.</creatorcontrib><creatorcontrib>Vernon, S.P.</creatorcontrib><creatorcontrib>Kania, D.R.</creatorcontrib><title>Magnetic force microscopy of single-domain cobalt dots patterned using interference lithography</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>We have fabricated arrays of Co dots having diameters of 100 nm and 70 nm using interference lithography. The density of these arrays is 7.2/spl times/10/sup 9//in/sup 2/. Magnetic force microscopy measurements indicate that the Co dots are single-domain with moments that can be controlled to point either in-plane or out-of-plane. Interference lithography is a process that is easily scaled to large areas and is potentially capable of high throughput. Large, uniform arrays of single-domain structures are potentially useful for high-density, low-noise data storage.</description><subject>Cobalt</subject><subject>Fabrication</subject><subject>Interference</subject><subject>Laboratories</subject><subject>Lithography</subject><subject>Magnetic domain walls</subject><subject>Magnetic domains</subject><subject>Magnetic force microscopy</subject><subject>Memory</subject><subject>US Department of Transportation</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNo9kM1LxDAQxYMouK4evHrKSfDQNWnSNjnK4heseNFzSKfT3Ujb1CR72P_eLl0cGIbH_HjwHiG3nK04Z_oxZ6tCKM34GVlwLXnGWKnPyYIxrjItS3lJrmL8maQsOFsQ82G3AyYHtPUBkPYOgo_gxwP1LY1u2HaYNb63bqDga9sl2vgU6WhTwjBgQ_dHiLphki0GHCaTzqWd3wY77g7X5KK1XcSb012S75fnr_Vbtvl8fV8_bTIQlUpZXdeirWxdNUoIDWUhEUQBVclbkBVoBZJjM40CXXLZtNMKRFYD55IxEEtyP_uOwf_uMSbTuwjYdXZAv48mV0KXuVQT-DCDx5wxYGvG4HobDoYzc6zQ5MzMFU7s3cw6RPznTs8_ASpuQA</recordid><startdate>19960901</startdate><enddate>19960901</enddate><creator>Fernandez, A.</creator><creator>Bedrossian, P.J.</creator><creator>Baker, S.L.</creator><creator>Vernon, S.P.</creator><creator>Kania, D.R.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19960901</creationdate><title>Magnetic force microscopy of single-domain cobalt dots patterned using interference lithography</title><author>Fernandez, A. ; Bedrossian, P.J. ; Baker, S.L. ; Vernon, S.P. ; Kania, D.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c378t-bbb3f7ab7d8339c654ec35c761fc47c98c41edddd8c9614df14d3ee0bc11400c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Cobalt</topic><topic>Fabrication</topic><topic>Interference</topic><topic>Laboratories</topic><topic>Lithography</topic><topic>Magnetic domain walls</topic><topic>Magnetic domains</topic><topic>Magnetic force microscopy</topic><topic>Memory</topic><topic>US Department of Transportation</topic><toplevel>online_resources</toplevel><creatorcontrib>Fernandez, A.</creatorcontrib><creatorcontrib>Bedrossian, P.J.</creatorcontrib><creatorcontrib>Baker, S.L.</creatorcontrib><creatorcontrib>Vernon, S.P.</creatorcontrib><creatorcontrib>Kania, D.R.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fernandez, A.</au><au>Bedrossian, P.J.</au><au>Baker, S.L.</au><au>Vernon, S.P.</au><au>Kania, D.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Magnetic force microscopy of single-domain cobalt dots patterned using interference lithography</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1996-09-01</date><risdate>1996</risdate><volume>32</volume><issue>5</issue><spage>4472</spage><epage>4474</epage><pages>4472-4474</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>We have fabricated arrays of Co dots having diameters of 100 nm and 70 nm using interference lithography. The density of these arrays is 7.2/spl times/10/sup 9//in/sup 2/. Magnetic force microscopy measurements indicate that the Co dots are single-domain with moments that can be controlled to point either in-plane or out-of-plane. Interference lithography is a process that is easily scaled to large areas and is potentially capable of high throughput. Large, uniform arrays of single-domain structures are potentially useful for high-density, low-noise data storage.</abstract><pub>IEEE</pub><doi>10.1109/20.538901</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record>
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subjects	Cobalt Fabrication Interference Laboratories Lithography Magnetic domain walls Magnetic domains Magnetic force microscopy Memory US Department of Transportation
title	Magnetic force microscopy of single-domain cobalt dots patterned using interference lithography
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