High-frequency characterization of direct plated copper metallized substrate and its application on microwave circuit

Direct plated copper (DPC) metallized substrate is introduced, characterized, and demonstrated in this paper. The proposed DPC metallized substrate has the main advantages of high-frequency characteristics and excellent thermal management, due to the use of ceramic substrate and metallized copper co...

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Hauptverfasser: Chien-Cheng Wei, Chin-Ta Fan, Ta-Hsiang Chiang, Ming-Kuen Chiu, Shao-Pin Ru
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Chin-Ta Fan
Ta-Hsiang Chiang
Ming-Kuen Chiu
Shao-Pin Ru
description Direct plated copper (DPC) metallized substrate is introduced, characterized, and demonstrated in this paper. The proposed DPC metallized substrate has the main advantages of high-frequency characteristics and excellent thermal management, due to the use of ceramic substrate and metallized copper conductor. Besides, the DPC process also provides high circuit density, fine pitch, and low cost potential compared to other technologies, like direct bonded copper (DBC), Low-Temperature Cofired Ceramics (LTCC), and High-Temperature Cofired Ceramics (HTCC) processes. Therefore, to characterize the electrical properties of DPC substrate for high-frequency applications, a simple extraction method was adopted to carry out the correlated values of dielectric constant and dielectric loss at Ku-band. However, to validate the extracted parameters, a 10-GHz parallel-coupled line band-pass filter (BPF) was demonstrated by using the presented DPC substrate. This BPF has measured insertion loss of only 0.5dB and return loss of above 10dB in the passband. It obviously proved that the DPC metallized substrate is very capable for RF module packages and microwave components, with its excellent low loss performance.
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fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5382279</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5382279</ieee_id><sourcerecordid>5382279</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-ab453d7694de7716c63a5dbd94010500ef9d1ba7261348b9938f23a9f9830e013</originalsourceid><addsrcrecordid>eNpVkNtKAzEUReOlYK3zBX3JD0w9ucwlj6WoLVT0oe8lk5yxkbmZySjt1ztiEXw6sNdmsTmEzBksGAN1v3l-Xa52Cw6gFonIOc_UBYlUljPJpZRCcrgkU84SiBMl-dU_xsT1HxNyQm5_NAq4hPSGRH3_DgACGIzVKRnW7u0Qlx4_BmzMkZqD9toE9O6kg2sb2pbUOo8m0K7SAS01bdehpzUGXVXuNCb9UPTBj5DqxlIXeqq7rnLmLGho7Yxvv_QnUuO8GVy4I5NSVz1G5zsju8eH3Wodb1-eNqvlNnYKQqwLmQibpUpazDKWmlToxBZWyXF9AoClsqzQGU-ZkHmhlMhLLrQqVS4AgYkZmf9qHSLuO-9q7Y_780PFNwXeZU8</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>High-frequency characterization of direct plated copper metallized substrate and its application on microwave circuit</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Chien-Cheng Wei ; Chin-Ta Fan ; Ta-Hsiang Chiang ; Ming-Kuen Chiu ; Shao-Pin Ru</creator><creatorcontrib>Chien-Cheng Wei ; Chin-Ta Fan ; Ta-Hsiang Chiang ; Ming-Kuen Chiu ; Shao-Pin Ru</creatorcontrib><description>Direct plated copper (DPC) metallized substrate is introduced, characterized, and demonstrated in this paper. The proposed DPC metallized substrate has the main advantages of high-frequency characteristics and excellent thermal management, due to the use of ceramic substrate and metallized copper conductor. Besides, the DPC process also provides high circuit density, fine pitch, and low cost potential compared to other technologies, like direct bonded copper (DBC), Low-Temperature Cofired Ceramics (LTCC), and High-Temperature Cofired Ceramics (HTCC) processes. Therefore, to characterize the electrical properties of DPC substrate for high-frequency applications, a simple extraction method was adopted to carry out the correlated values of dielectric constant and dielectric loss at Ku-band. However, to validate the extracted parameters, a 10-GHz parallel-coupled line band-pass filter (BPF) was demonstrated by using the presented DPC substrate. This BPF has measured insertion loss of only 0.5dB and return loss of above 10dB in the passband. It obviously proved that the DPC metallized substrate is very capable for RF module packages and microwave components, with its excellent low loss performance.</description><identifier>ISSN: 2150-5934</identifier><identifier>ISBN: 9781424443413</identifier><identifier>ISBN: 1424443415</identifier><identifier>EISSN: 2150-5942</identifier><identifier>EISBN: 9781424443420</identifier><identifier>EISBN: 1424443423</identifier><identifier>DOI: 10.1109/IMPACT.2009.5382279</identifier><identifier>LCCN: 2009902406</identifier><language>eng</language><publisher>IEEE</publisher><subject>Band pass filters ; band-pass filter ; ceramic substrate ; Ceramics ; Copper ; Dielectric constant ; Dielectric loss measurement ; Dielectric losses ; dielectric material ; Dielectric substrates ; Direct plated copper ; Metallization ; microstrip resonator ; Microwave circuits ; parallel-coupled line filter ; Thermal management</subject><ispartof>2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009, p.681-684</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5382279$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,27923,54918</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5382279$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chien-Cheng Wei</creatorcontrib><creatorcontrib>Chin-Ta Fan</creatorcontrib><creatorcontrib>Ta-Hsiang Chiang</creatorcontrib><creatorcontrib>Ming-Kuen Chiu</creatorcontrib><creatorcontrib>Shao-Pin Ru</creatorcontrib><title>High-frequency characterization of direct plated copper metallized substrate and its application on microwave circuit</title><title>2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference</title><addtitle>IMPACT</addtitle><description>Direct plated copper (DPC) metallized substrate is introduced, characterized, and demonstrated in this paper. The proposed DPC metallized substrate has the main advantages of high-frequency characteristics and excellent thermal management, due to the use of ceramic substrate and metallized copper conductor. Besides, the DPC process also provides high circuit density, fine pitch, and low cost potential compared to other technologies, like direct bonded copper (DBC), Low-Temperature Cofired Ceramics (LTCC), and High-Temperature Cofired Ceramics (HTCC) processes. Therefore, to characterize the electrical properties of DPC substrate for high-frequency applications, a simple extraction method was adopted to carry out the correlated values of dielectric constant and dielectric loss at Ku-band. However, to validate the extracted parameters, a 10-GHz parallel-coupled line band-pass filter (BPF) was demonstrated by using the presented DPC substrate. This BPF has measured insertion loss of only 0.5dB and return loss of above 10dB in the passband. It obviously proved that the DPC metallized substrate is very capable for RF module packages and microwave components, with its excellent low loss performance.</description><subject>Band pass filters</subject><subject>band-pass filter</subject><subject>ceramic substrate</subject><subject>Ceramics</subject><subject>Copper</subject><subject>Dielectric constant</subject><subject>Dielectric loss measurement</subject><subject>Dielectric losses</subject><subject>dielectric material</subject><subject>Dielectric substrates</subject><subject>Direct plated copper</subject><subject>Metallization</subject><subject>microstrip resonator</subject><subject>Microwave circuits</subject><subject>parallel-coupled line filter</subject><subject>Thermal management</subject><issn>2150-5934</issn><issn>2150-5942</issn><isbn>9781424443413</isbn><isbn>1424443415</isbn><isbn>9781424443420</isbn><isbn>1424443423</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpVkNtKAzEUReOlYK3zBX3JD0w9ucwlj6WoLVT0oe8lk5yxkbmZySjt1ztiEXw6sNdmsTmEzBksGAN1v3l-Xa52Cw6gFonIOc_UBYlUljPJpZRCcrgkU84SiBMl-dU_xsT1HxNyQm5_NAq4hPSGRH3_DgACGIzVKRnW7u0Qlx4_BmzMkZqD9toE9O6kg2sb2pbUOo8m0K7SAS01bdehpzUGXVXuNCb9UPTBj5DqxlIXeqq7rnLmLGho7Yxvv_QnUuO8GVy4I5NSVz1G5zsju8eH3Wodb1-eNqvlNnYKQqwLmQibpUpazDKWmlToxBZWyXF9AoClsqzQGU-ZkHmhlMhLLrQqVS4AgYkZmf9qHSLuO-9q7Y_780PFNwXeZU8</recordid><startdate>200910</startdate><enddate>200910</enddate><creator>Chien-Cheng Wei</creator><creator>Chin-Ta Fan</creator><creator>Ta-Hsiang Chiang</creator><creator>Ming-Kuen Chiu</creator><creator>Shao-Pin Ru</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200910</creationdate><title>High-frequency characterization of direct plated copper metallized substrate and its application on microwave circuit</title><author>Chien-Cheng Wei ; Chin-Ta Fan ; Ta-Hsiang Chiang ; Ming-Kuen Chiu ; Shao-Pin Ru</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-ab453d7694de7716c63a5dbd94010500ef9d1ba7261348b9938f23a9f9830e013</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Band pass filters</topic><topic>band-pass filter</topic><topic>ceramic substrate</topic><topic>Ceramics</topic><topic>Copper</topic><topic>Dielectric constant</topic><topic>Dielectric loss measurement</topic><topic>Dielectric losses</topic><topic>dielectric material</topic><topic>Dielectric substrates</topic><topic>Direct plated copper</topic><topic>Metallization</topic><topic>microstrip resonator</topic><topic>Microwave circuits</topic><topic>parallel-coupled line filter</topic><topic>Thermal management</topic><toplevel>online_resources</toplevel><creatorcontrib>Chien-Cheng Wei</creatorcontrib><creatorcontrib>Chin-Ta Fan</creatorcontrib><creatorcontrib>Ta-Hsiang Chiang</creatorcontrib><creatorcontrib>Ming-Kuen Chiu</creatorcontrib><creatorcontrib>Shao-Pin Ru</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chien-Cheng Wei</au><au>Chin-Ta Fan</au><au>Ta-Hsiang Chiang</au><au>Ming-Kuen Chiu</au><au>Shao-Pin Ru</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>High-frequency characterization of direct plated copper metallized substrate and its application on microwave circuit</atitle><btitle>2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference</btitle><stitle>IMPACT</stitle><date>2009-10</date><risdate>2009</risdate><spage>681</spage><epage>684</epage><pages>681-684</pages><issn>2150-5934</issn><eissn>2150-5942</eissn><isbn>9781424443413</isbn><isbn>1424443415</isbn><eisbn>9781424443420</eisbn><eisbn>1424443423</eisbn><abstract>Direct plated copper (DPC) metallized substrate is introduced, characterized, and demonstrated in this paper. The proposed DPC metallized substrate has the main advantages of high-frequency characteristics and excellent thermal management, due to the use of ceramic substrate and metallized copper conductor. Besides, the DPC process also provides high circuit density, fine pitch, and low cost potential compared to other technologies, like direct bonded copper (DBC), Low-Temperature Cofired Ceramics (LTCC), and High-Temperature Cofired Ceramics (HTCC) processes. Therefore, to characterize the electrical properties of DPC substrate for high-frequency applications, a simple extraction method was adopted to carry out the correlated values of dielectric constant and dielectric loss at Ku-band. However, to validate the extracted parameters, a 10-GHz parallel-coupled line band-pass filter (BPF) was demonstrated by using the presented DPC substrate. This BPF has measured insertion loss of only 0.5dB and return loss of above 10dB in the passband. It obviously proved that the DPC metallized substrate is very capable for RF module packages and microwave components, with its excellent low loss performance.</abstract><pub>IEEE</pub><doi>10.1109/IMPACT.2009.5382279</doi><tpages>4</tpages></addata></record>
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subjects Band pass filters
band-pass filter
ceramic substrate
Ceramics
Copper
Dielectric constant
Dielectric loss measurement
Dielectric losses
dielectric material
Dielectric substrates
Direct plated copper
Metallization
microstrip resonator
Microwave circuits
parallel-coupled line filter
Thermal management
title High-frequency characterization of direct plated copper metallized substrate and its application on microwave circuit
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T17%3A59%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=High-frequency%20characterization%20of%20direct%20plated%20copper%20metallized%20substrate%20and%20its%20application%20on%20microwave%20circuit&rft.btitle=2009%204th%20International%20Microsystems,%20Packaging,%20Assembly%20and%20Circuits%20Technology%20Conference&rft.au=Chien-Cheng%20Wei&rft.date=2009-10&rft.spage=681&rft.epage=684&rft.pages=681-684&rft.issn=2150-5934&rft.eissn=2150-5942&rft.isbn=9781424443413&rft.isbn_list=1424443415&rft_id=info:doi/10.1109/IMPACT.2009.5382279&rft_dat=%3Cieee_6IE%3E5382279%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9781424443420&rft.eisbn_list=1424443423&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5382279&rfr_iscdi=true