Analysis of physics based model of AlGaN/GaN power HEMT with temperature compensation
An AlGaN/GaN high electron mobility transistor (HEMT) model with temperature compensation is proposed. The simulation and experimental data are in close agreement within the measured temperature range. Despite of drain current degradation, the characteristics exhibit high temperature compatibility o...
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creator | Huq, H.F. Polash, B. |
description | An AlGaN/GaN high electron mobility transistor (HEMT) model with temperature compensation is proposed. The simulation and experimental data are in close agreement within the measured temperature range. Despite of drain current degradation, the characteristics exhibit high temperature compatibility of AlGaN/GaN HEMTs. |
doi_str_mv | 10.1109/ISDRS.2009.5378298 |
format | Conference Proceeding |
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The simulation and experimental data are in close agreement within the measured temperature range. 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The simulation and experimental data are in close agreement within the measured temperature range. Despite of drain current degradation, the characteristics exhibit high temperature compatibility of AlGaN/GaN HEMTs.</description><subject>Aluminum gallium nitride</subject><subject>Gallium nitride</subject><subject>HEMTs</subject><subject>Physics</subject><subject>Temperature</subject><isbn>1424460301</isbn><isbn>9781424460304</isbn><isbn>9781424460311</isbn><isbn>142446031X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1UFtLwzAYjYigzv4BfckfWJdbk-axzLkNpoKrzyNNvrBIbzSVsX9vxXngcC4PHx8HoUdKUkqJXmz3zx_7lBGi04yrnOn8CiVa5VQwISThlF6j-_9A6C1KYvwiE0TGuGZ36LNoTX2OIeLO4_44ORtxZSI43HQO6t-6qNfmbTER990JBrxZvZb4FMYjHqHpYTDj9wDYdpNvoxlD1z6gG2_qCMlFZ6h8WZXLzXz3vt4ui908aDLOrSeSVmb6jWlnrCSGEi58rkFmTlrqvKyUcBZASArGW6Vo7nMmveBKW8Fn6OnvbACAQz-Exgznw2UI_gPYklHs</recordid><startdate>200912</startdate><enddate>200912</enddate><creator>Huq, H.F.</creator><creator>Polash, B.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200912</creationdate><title>Analysis of physics based model of AlGaN/GaN power HEMT with temperature compensation</title><author>Huq, H.F. ; Polash, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-cf061ba44629dac60a1034f89e65d6c1df6b74dcee461eafc7718f826f4379c43</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Aluminum gallium nitride</topic><topic>Gallium nitride</topic><topic>HEMTs</topic><topic>Physics</topic><topic>Temperature</topic><toplevel>online_resources</toplevel><creatorcontrib>Huq, H.F.</creatorcontrib><creatorcontrib>Polash, B.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Huq, H.F.</au><au>Polash, B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Analysis of physics based model of AlGaN/GaN power HEMT with temperature compensation</atitle><btitle>2009 International Semiconductor Device Research Symposium</btitle><stitle>ISDRS</stitle><date>2009-12</date><risdate>2009</risdate><spage>1</spage><epage>2</epage><pages>1-2</pages><isbn>1424460301</isbn><isbn>9781424460304</isbn><eisbn>9781424460311</eisbn><eisbn>142446031X</eisbn><abstract>An AlGaN/GaN high electron mobility transistor (HEMT) model with temperature compensation is proposed. The simulation and experimental data are in close agreement within the measured temperature range. Despite of drain current degradation, the characteristics exhibit high temperature compatibility of AlGaN/GaN HEMTs.</abstract><pub>IEEE</pub><doi>10.1109/ISDRS.2009.5378298</doi><tpages>2</tpages></addata></record> |
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subjects | Aluminum gallium nitride Gallium nitride HEMTs Physics Temperature |
title | Analysis of physics based model of AlGaN/GaN power HEMT with temperature compensation |
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