On-line fault detection and diagnosis obtained by implementing neural algorithms on a digital signal processor
A measurement instrument for on-line fault detection and diagnosis is proposed. It is based on the implementation of a neural network algorithm on a processor specialized in digital signal processing and provided with suitable data acquisition and generation units. Two specific implementations are d...
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Veröffentlicht in: | IEEE transactions on instrumentation and measurement 1996-10, Vol.45 (5), p.894-899 |
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container_title | IEEE transactions on instrumentation and measurement |
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creator | Bernieri, A. Betta, G. Liguori, C. |
description | A measurement instrument for on-line fault detection and diagnosis is proposed. It is based on the implementation of a neural network algorithm on a processor specialized in digital signal processing and provided with suitable data acquisition and generation units. Two specific implementations are detailed. The former uses the neural-network to simulate on-line the correct system behavior, thus allowing the fault detection to be achieved by comparing the neural network output with the measured one. The latter uses the neural network to classify on-line the system as correct or faulty, thus allowing the fault detection and diagnosis to be achieved simultaneously. These two implementations are applied to detect on-line and diagnose faults on a real system in order to point out different fields of application and to highlight the performance of the measurement apparatus. |
doi_str_mv | 10.1109/19.536707 |
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These two implementations are applied to detect on-line and diagnose faults on a real system in order to point out different fields of application and to highlight the performance of the measurement apparatus.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/19.536707</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuit faults ; Digital signal processing ; Digital signal processors ; Electrical fault detection ; Electronics ; Exact sciences and technology ; Fault detection ; Fault diagnosis ; Hardware ; Instruments ; Neural networks ; Signal processing algorithms ; Testing, measurement, noise and reliability</subject><ispartof>IEEE transactions on instrumentation and measurement, 1996-10, Vol.45 (5), p.894-899</ispartof><rights>1996 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c306t-d3f531b35a7e285c7152cd2ea7aea16d4d9c0057973a64a00e3578db944a4fdd3</citedby><cites>FETCH-LOGICAL-c306t-d3f531b35a7e285c7152cd2ea7aea16d4d9c0057973a64a00e3578db944a4fdd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/536707$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/536707$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3236548$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Bernieri, A.</creatorcontrib><creatorcontrib>Betta, G.</creatorcontrib><creatorcontrib>Liguori, C.</creatorcontrib><title>On-line fault detection and diagnosis obtained by implementing neural algorithms on a digital signal processor</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>A measurement instrument for on-line fault detection and diagnosis is proposed. 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These two implementations are applied to detect on-line and diagnose faults on a real system in order to point out different fields of application and to highlight the performance of the measurement apparatus.</description><subject>Applied sciences</subject><subject>Circuit faults</subject><subject>Digital signal processing</subject><subject>Digital signal processors</subject><subject>Electrical fault detection</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fault detection</subject><subject>Fault diagnosis</subject><subject>Hardware</subject><subject>Instruments</subject><subject>Neural networks</subject><subject>Signal processing algorithms</subject><subject>Testing, measurement, noise and reliability</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNo9kL1rHDEUxIWxweePwq0rFSbgYi_S6mu3NEfiBA7cxPXyTnq7ltFqL5KuuP8-Cne4Gpj3m3kwhDxwtuac9d95v1ZCG2YuyIorZZpe6_aSrBjjXdNLpa_JTc6fjDGjpVmR-Bab4CPSEQ6hUIcFbfFLpBAddR6muGSf6bIrUClHd0fq533AGWPxcaIRDwkChTAtyZePuaI1W5OTL9XPfopV9mmxmPOS7sjVCCHj_VlvyfvPH382v5rt2-vvzcu2sYLp0jgxKsF3QoHBtlPWcNVa1yIYQODaSddbxpTpjQAtgTEUynRu10sJcnRO3JJvp976-e8Bcxlmny2GABGXQx7aTjLdybaCzyfQpiXnhOOwT36GdBw4G_4vOvB-OC1a2adzKWQLYUwQrc9fAdEKrWRXsccT5hHx63ru-AdbG382</recordid><startdate>19961001</startdate><enddate>19961001</enddate><creator>Bernieri, A.</creator><creator>Betta, G.</creator><creator>Liguori, C.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19961001</creationdate><title>On-line fault detection and diagnosis obtained by implementing neural algorithms on a digital signal processor</title><author>Bernieri, A. ; Betta, G. ; Liguori, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c306t-d3f531b35a7e285c7152cd2ea7aea16d4d9c0057973a64a00e3578db944a4fdd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Applied sciences</topic><topic>Circuit faults</topic><topic>Digital signal processing</topic><topic>Digital signal processors</topic><topic>Electrical fault detection</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fault detection</topic><topic>Fault diagnosis</topic><topic>Hardware</topic><topic>Instruments</topic><topic>Neural networks</topic><topic>Signal processing algorithms</topic><topic>Testing, measurement, noise and reliability</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bernieri, A.</creatorcontrib><creatorcontrib>Betta, G.</creatorcontrib><creatorcontrib>Liguori, C.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bernieri, A.</au><au>Betta, G.</au><au>Liguori, C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>On-line fault detection and diagnosis obtained by implementing neural algorithms on a digital signal processor</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1996-10-01</date><risdate>1996</risdate><volume>45</volume><issue>5</issue><spage>894</spage><epage>899</epage><pages>894-899</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>A measurement instrument for on-line fault detection and diagnosis is proposed. It is based on the implementation of a neural network algorithm on a processor specialized in digital signal processing and provided with suitable data acquisition and generation units. Two specific implementations are detailed. The former uses the neural-network to simulate on-line the correct system behavior, thus allowing the fault detection to be achieved by comparing the neural network output with the measured one. The latter uses the neural network to classify on-line the system as correct or faulty, thus allowing the fault detection and diagnosis to be achieved simultaneously. These two implementations are applied to detect on-line and diagnose faults on a real system in order to point out different fields of application and to highlight the performance of the measurement apparatus.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/19.536707</doi><tpages>6</tpages></addata></record> |
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subjects | Applied sciences Circuit faults Digital signal processing Digital signal processors Electrical fault detection Electronics Exact sciences and technology Fault detection Fault diagnosis Hardware Instruments Neural networks Signal processing algorithms Testing, measurement, noise and reliability |
title | On-line fault detection and diagnosis obtained by implementing neural algorithms on a digital signal processor |
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