Test Integration for SOC Supporting Very Low-Cost Testers

To reduce test cost for SOC products, it is important to reduce the cost of testers. When using low-cost testers which have a limited test bandwidth to perform testing, built-in- self-test (BIST) is necessary to reduce the data volume to be transmitted between the tester and the device-under-test (D...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Chun-Chuan Chi, Chih-Yen Lo, Te-Wen Ko, Cheng-Wen Wu
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Bandwidth Built-in self-test Circuit testing Costs Design for testability HOY logic BIST Logic circuits Logic testing low-cost tester Performance evaluation Probes System testing test integration wireless testing
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