Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study

Shrinking feature size and increased wire density increase the likelihood of occurrence of bridge related defects. N- detect based pattern sets are used commonly to improve the detection of bridge defects. However, achieving high bridge coverage requires deterministic bridge sites extraction from ph...

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Bibliographische Detailangaben

Hauptverfasser:	Goel, S.K., Devta-Prasanna, N., Ward, M.
Format:	Tagungsbericht
Sprache:	eng ; jpn
Schlagworte:	Bridge circuits Circuit faults Data mining Electrical fault detection Fault detection Large scale integration Pattern analysis Silicon Testing Wire
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