IEEE P1687 IJTAG a presentation of current technology

The use of embedded test instrumentation in ASIC designs has changed dramatically over the last decade. This is due to a variety of forces that affect the semiconductor industry. Unfortunately, processes surrounding test creation and validation this instrumentation has become significantly more comp...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Posse, K., Crouch, A., Rearick, J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Application specific integrated circuits Automatic testing Circuit testing Design for testability Electronics industry Hardware design languages Instruments Logic testing Page description languages Technological innovation
Online-Zugang:	Volltext bestellen
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