Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations
Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortion are two significant effects in power amplifiers at high output power levels. Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This p...
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| creator | Sen, S. Devarakond, S. Chatterjee, A. |
| description | Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortion are two significant effects in power amplifiers at high output power levels. Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude conversion using simple load board test circuitry along with the use of hardware and software based difference generation and peak detection mechanisms. It is seen that both distortion effects can be measured with high accuracy while allowing significant reduction in test cost. |
| doi_str_mv | 10.1109/TEST.2009.5355531 |
| format | Conference Proceeding |
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Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude conversion using simple load board test circuitry along with the use of hardware and software based difference generation and peak detection mechanisms. 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Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude conversion using simple load board test circuitry along with the use of hardware and software based difference generation and peak detection mechanisms. It is seen that both distortion effects can be measured with high accuracy while allowing significant reduction in test cost.</description><subject>Circuit testing</subject><subject>Costs</subject><subject>Distortion measurement</subject><subject>High power amplifiers</subject><subject>Phase measurement</subject><subject>Power amplifiers</subject><subject>Power generation</subject><subject>Power measurement</subject><subject>Radiofrequency amplifiers</subject><subject>Software testing</subject><issn>1089-3539</issn><issn>2378-2250</issn><isbn>1424448689</isbn><isbn>9781424448685</isbn><isbn>9781424448678</isbn><isbn>1424448670</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpNkMlqwzAYhNUN6qZ-gNKLXkCJtt-WjiGkC9i0UF9LUCS5qMR2sGRK374JTaFzmYFvmMMgdMfonDGqF836rZlzSvUcBAAIdoZyXSomuZRSFaU6RxkXpSKcA71AN39A6UuUMao0ESD0Ncpj_KQHSTi0eYbeq-EL2yEmvKwXyxqb3h3Ta41diGkYUxh63HkTp9F3vk94iqH_-AdJGojp9ruQJudxGk0f22HszJHFW3TVml30-clnqHlYN6snUr08Pq-WFQmaJmK3XAhoLVVWQSG0d7ykRaEKYC3TkrqytdK3zGlFtyAMM94WACWA885xK2bo_nc2eO83-zF0ZvzenI4SP3oJWMw</recordid><startdate>200911</startdate><enddate>200911</enddate><creator>Sen, S.</creator><creator>Devarakond, S.</creator><creator>Chatterjee, A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200911</creationdate><title>Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations</title><author>Sen, S. ; Devarakond, S. ; Chatterjee, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-cb2335fc08c85639ed270668651f1940d7fc4ef1d980b53a1aec655755dedd2c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Circuit testing</topic><topic>Costs</topic><topic>Distortion measurement</topic><topic>High power amplifiers</topic><topic>Phase measurement</topic><topic>Power amplifiers</topic><topic>Power generation</topic><topic>Power measurement</topic><topic>Radiofrequency amplifiers</topic><topic>Software testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Sen, S.</creatorcontrib><creatorcontrib>Devarakond, S.</creatorcontrib><creatorcontrib>Chatterjee, A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sen, S.</au><au>Devarakond, S.</au><au>Chatterjee, A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations</atitle><btitle>2009 International Test Conference</btitle><stitle>TEST</stitle><date>2009-11</date><risdate>2009</risdate><spage>1</spage><epage>10</epage><pages>1-10</pages><issn>1089-3539</issn><eissn>2378-2250</eissn><isbn>1424448689</isbn><isbn>9781424448685</isbn><eisbn>9781424448678</eisbn><eisbn>1424448670</eisbn><abstract>Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortion are two significant effects in power amplifiers at high output power levels. Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude conversion using simple load board test circuitry along with the use of hardware and software based difference generation and peak detection mechanisms. It is seen that both distortion effects can be measured with high accuracy while allowing significant reduction in test cost.</abstract><pub>IEEE</pub><doi>10.1109/TEST.2009.5355531</doi><tpages>10</tpages></addata></record> |
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| identifier | ISSN: 1089-3539 |
| ispartof | 2009 International Test Conference, 2009, p.1-10 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuit testing Costs Distortion measurement High power amplifiers Phase measurement Power amplifiers Power generation Power measurement Radiofrequency amplifiers Software testing |
| title | Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations |
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