A unified test and debug platform for SOC design

As the complexity of System-on-a-Chip (SOC) design keeps growing rapidly, efficient and economic testing and debugging for complex circuits at silicon stage has become extremely important. In this paper we present a unified platform that facilitates efficient on-chip testing and silicon debugging in...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kuen-Jong Lee, Chin-Yao Chang, Alan Su, Si-Yuan Liang
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic testing Centralized control Circuit testing Communication system control debug platform Debugging Environmental economics Hardware Silicon silicon debug SOC testing System testing System-on-a-chip
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