Disorder limits in passive and amplifying slow light waveguides

We present a simulation approach to estimate the effect of disorder induced backscattering in slow light photonic crystal line-defect waveguides. The backscattering leads to localization and thus limits the maximal length of such waveguides. Loss in passive waveguides in the localization regime redu...

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Hauptverfasser: Petrov, A.Yu, Krause, M., Wulbern, J.H., Hampe, J., Eich, M.
Format: Tagungsbericht
Sprache:eng
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