Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

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Hauptverfasser: O'Bryan, M.V., LaBel, K.A., Pellish, J.A., Buchner, S.P., Ladbury, R.L., Oldham, T.R., Kim, H.S., Campola, M.J., Lauenstein, J.-M., Chen, D., Berg, M.D., Sanders, A.B., Marshall, P.W., Marshall, C.J., Xapsos, M.A., Kruckmeyer, K., Leftwich, M., Benedetto, J.M.
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creator O'Bryan, M.V.
LaBel, K.A.
Pellish, J.A.
Buchner, S.P.
Ladbury, R.L.
Oldham, T.R.
Kim, H.S.
Campola, M.J.
Lauenstein, J.-M.
Chen, D.
Berg, M.D.
Sanders, A.B.
Marshall, P.W.
Marshall, C.J.
Xapsos, M.A.
Kruckmeyer, K.
Leftwich, M.
Benedetto, J.M.
description We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
doi_str_mv 10.1109/REDW.2009.5336321
format Conference Proceeding
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Acceleration
Aerospace electronics
Cyclotrons
Laboratories
NASA
Particle beams
Single event upset
Space technology
Space vehicles
Testing
title Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
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