Properties of intense ion beams from pinch-beam diodes

Summary form only given. Properties of pulsed ion beams from a pinch-beam diode on the Gamble II generator are being evaluated with several different diagnostics. An intense 1to 2-MeV ion beam is extracted from the diode through a 2-/spl mu/m thick Kimfol and transported up to 2.2 m in 1-Torr air. M...

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Hauptverfasser:	Young, F.C., Stephanakis, S.J., Goodrich, P.J., Mosher, D.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Anodes Cameras Diodes Ion beams Ion emission Particle beams Polyethylene Protons Pulse generation Pulse measurements
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creator	Young, F.C. Stephanakis, S.J. Goodrich, P.J. Mosher, D.
description	Summary form only given. Properties of pulsed ion beams from a pinch-beam diode on the Gamble II generator are being evaluated with several different diagnostics. An intense 1to 2-MeV ion beam is extracted from the diode through a 2-/spl mu/m thick Kimfol and transported up to 2.2 m in 1-Torr air. Multiple-pinhole-camera, Thomson-parabola-ion-analyzer, Rutherford-scattering, and step-wedge-filter diagnostics are fielded in the gas region to determine ion-beam properties. Uniformity of ion emission from the polyethylene anode and ion-beam divergence are determined with a multiple pinhole camera located 0.5 m from the anode. Images recorded on radiachromic film indicate extremely non-uniform emission from the anode and a beam divergence of 0.12 to 0.16 rad. Beam composition is determined with the Thomson parabola ion analyzer located about 2 m from the polyethylene anode in order to sample ions from the 10-cm-diam anode. The beam is primarily protons with a carbon fraction of
doi_str_mv	10.1109/PLASMA.1995.532789
format	Conference Proceeding
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Properties of pulsed ion beams from a pinch-beam diode on the Gamble II generator are being evaluated with several different diagnostics. An intense 1to 2-MeV ion beam is extracted from the diode through a 2-/spl mu/m thick Kimfol and transported up to 2.2 m in 1-Torr air. Multiple-pinhole-camera, Thomson-parabola-ion-analyzer, Rutherford-scattering, and step-wedge-filter diagnostics are fielded in the gas region to determine ion-beam properties. Uniformity of ion emission from the polyethylene anode and ion-beam divergence are determined with a multiple pinhole camera located 0.5 m from the anode. Images recorded on radiachromic film indicate extremely non-uniform emission from the anode and a beam divergence of 0.12 to 0.16 rad. Beam composition is determined with the Thomson parabola ion analyzer located about 2 m from the polyethylene anode in order to sample ions from the 10-cm-diam anode. The beam is primarily protons with a carbon fraction of <1%. When the transport region is at 10/sup -4/ Torr, a carbon component is observed. Beam fluence and pulse duration are determined by measuring protons Rutherford-scattered from small-area, thin, aluminum foils located at distances of 0.4 to 2.2 m from the anode.</description><identifier>ISSN: 0730-9244</identifier><identifier>ISBN: 0780326695</identifier><identifier>ISBN: 9780780326699</identifier><identifier>EISSN: 2576-7208</identifier><identifier>DOI: 10.1109/PLASMA.1995.532789</identifier><language>eng</language><publisher>IEEE</publisher><subject>Anodes ; Cameras ; Diodes ; Ion beams ; Ion emission ; Particle beams ; Polyethylene ; Protons ; Pulse generation ; Pulse measurements</subject><ispartof>International Conference on Plasma Science (papers in summary form only received), 1995, p.217</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/532789$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,4048,4049,27924,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/532789$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Young, F.C.</creatorcontrib><creatorcontrib>Stephanakis, S.J.</creatorcontrib><creatorcontrib>Goodrich, P.J.</creatorcontrib><creatorcontrib>Mosher, D.</creatorcontrib><title>Properties of intense ion beams from pinch-beam diodes</title><title>International Conference on Plasma Science (papers in summary form only received)</title><addtitle>PLASMA</addtitle><description>Summary form only given. Properties of pulsed ion beams from a pinch-beam diode on the Gamble II generator are being evaluated with several different diagnostics. An intense 1to 2-MeV ion beam is extracted from the diode through a 2-/spl mu/m thick Kimfol and transported up to 2.2 m in 1-Torr air. Multiple-pinhole-camera, Thomson-parabola-ion-analyzer, Rutherford-scattering, and step-wedge-filter diagnostics are fielded in the gas region to determine ion-beam properties. Uniformity of ion emission from the polyethylene anode and ion-beam divergence are determined with a multiple pinhole camera located 0.5 m from the anode. Images recorded on radiachromic film indicate extremely non-uniform emission from the anode and a beam divergence of 0.12 to 0.16 rad. Beam composition is determined with the Thomson parabola ion analyzer located about 2 m from the polyethylene anode in order to sample ions from the 10-cm-diam anode. The beam is primarily protons with a carbon fraction of <1%. When the transport region is at 10/sup -4/ Torr, a carbon component is observed. Beam fluence and pulse duration are determined by measuring protons Rutherford-scattered from small-area, thin, aluminum foils located at distances of 0.4 to 2.2 m from the anode.</description><subject>Anodes</subject><subject>Cameras</subject><subject>Diodes</subject><subject>Ion beams</subject><subject>Ion emission</subject><subject>Particle beams</subject><subject>Polyethylene</subject><subject>Protons</subject><subject>Pulse generation</subject><subject>Pulse measurements</subject><issn>0730-9244</issn><issn>2576-7208</issn><isbn>0780326695</isbn><isbn>9780780326699</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1995</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNp9js0KgkAUhS_9QFa-gKt5AW1mdBxnKVG0KBBqL5ZXmkhHZtz09hm17mwOfIcPDkDAaMQYVZvimJ9PecSUEpGIuczUBDwuZBpKTrMpLKnMaMzTVIkZeFTGNFQ8SRbgO_egYxLBRs2DtLCmRztodMQ0RHcDdg6JNh25YtU60ljTkl53t3v4AaTWpka3hnlTPR36v15BsN9dtodQI2LZW91W9lV-n8V_xzc07Ti2</recordid><startdate>1995</startdate><enddate>1995</enddate><creator>Young, F.C.</creator><creator>Stephanakis, S.J.</creator><creator>Goodrich, P.J.</creator><creator>Mosher, D.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1995</creationdate><title>Properties of intense ion beams from pinch-beam diodes</title><author>Young, F.C. ; Stephanakis, S.J. ; Goodrich, P.J. ; Mosher, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_5327893</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Anodes</topic><topic>Cameras</topic><topic>Diodes</topic><topic>Ion beams</topic><topic>Ion emission</topic><topic>Particle beams</topic><topic>Polyethylene</topic><topic>Protons</topic><topic>Pulse generation</topic><topic>Pulse measurements</topic><toplevel>online_resources</toplevel><creatorcontrib>Young, F.C.</creatorcontrib><creatorcontrib>Stephanakis, S.J.</creatorcontrib><creatorcontrib>Goodrich, P.J.</creatorcontrib><creatorcontrib>Mosher, D.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library Online</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Young, F.C.</au><au>Stephanakis, S.J.</au><au>Goodrich, P.J.</au><au>Mosher, D.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Properties of intense ion beams from pinch-beam diodes</atitle><btitle>International Conference on Plasma Science (papers in summary form only received)</btitle><stitle>PLASMA</stitle><date>1995</date><risdate>1995</risdate><spage>217</spage><pages>217-</pages><issn>0730-9244</issn><eissn>2576-7208</eissn><isbn>0780326695</isbn><isbn>9780780326699</isbn><abstract>Summary form only given. Properties of pulsed ion beams from a pinch-beam diode on the Gamble II generator are being evaluated with several different diagnostics. An intense 1to 2-MeV ion beam is extracted from the diode through a 2-/spl mu/m thick Kimfol and transported up to 2.2 m in 1-Torr air. Multiple-pinhole-camera, Thomson-parabola-ion-analyzer, Rutherford-scattering, and step-wedge-filter diagnostics are fielded in the gas region to determine ion-beam properties. Uniformity of ion emission from the polyethylene anode and ion-beam divergence are determined with a multiple pinhole camera located 0.5 m from the anode. Images recorded on radiachromic film indicate extremely non-uniform emission from the anode and a beam divergence of 0.12 to 0.16 rad. Beam composition is determined with the Thomson parabola ion analyzer located about 2 m from the polyethylene anode in order to sample ions from the 10-cm-diam anode. The beam is primarily protons with a carbon fraction of <1%. When the transport region is at 10/sup -4/ Torr, a carbon component is observed. Beam fluence and pulse duration are determined by measuring protons Rutherford-scattered from small-area, thin, aluminum foils located at distances of 0.4 to 2.2 m from the anode.</abstract><pub>IEEE</pub><doi>10.1109/PLASMA.1995.532789</doi></addata></record>
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language	eng
recordid	cdi_ieee_primary_532789
source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Anodes Cameras Diodes Ion beams Ion emission Particle beams Polyethylene Protons Pulse generation Pulse measurements
title	Properties of intense ion beams from pinch-beam diodes
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