Redundant, High Density, High Efficiency Double Conversion Uninterruptible Power System
This paper presents a novel design for double conversion UPS systems that results in higher power density, higher efficiency and more flexible parallelism for higher reliability. This design comprises a three-level circuit topology, a customized power semiconductor module and a cross current sensorl...
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| creator | Sato, E.K. Kinoshita, M. Yamamoto, Y. Amboh, T. |
| description | This paper presents a novel design for double conversion UPS systems that results in higher power density, higher efficiency and more flexible parallelism for higher reliability. This design comprises a three-level circuit topology, a customized power semiconductor module and a cross current sensorless parallel control. The innovative circuit topology results in an UPS with higher efficiency and dramatic size/weight reduction and confirms the advantages of three-level circuits in low-voltage applications. Higher reliability uninterruptible power system using parallel redundant UPS modules employs a novel cross current sensorless control without compromise the performance in comparison with single-module systems. Test results using a single and a multiple module system confirm the improvement in efficiency and the high performance of this UPS. |
| doi_str_mv | 10.1109/IAS.2009.5324877 |
| format | Conference Proceeding |
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Test results using a single and a multiple module system confirm the improvement in efficiency and the high performance of this UPS.</description><subject>Circuit testing</subject><subject>Circuit topology</subject><subject>Insulated gate bipolar transistors</subject><subject>Power electronics</subject><subject>Power system reliability</subject><subject>Redundancy</subject><subject>Sensorless control</subject><subject>System testing</subject><subject>Uninterruptible power systems</subject><subject>Voltage fluctuations</subject><issn>0197-2618</issn><issn>2576-702X</issn><isbn>1424434750</isbn><isbn>9781424434756</isbn><isbn>1424434769</isbn><isbn>9781424434763</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFkEtLw0AUhccXGGv3gpv8ABPnmZtZlrbaQkGxFd2VTOaOjrSTkoeSf69iwLP5OHxwFoeQK0ZTxqi-XU7WKadUp0pwmQMckQsmuZRCQqaPScQVZAlQ_nryLxQ9JRFlGhKesfycjJvmg_5EKsEUj8jLE9ou2CK0N_HCv73HMwyNb_uhzZ3zpcdQ9vGs6swO42kVPrFufBXi5-BDi3XdHVr_qx6rL6zjdd-0uL8kZ67YNTgeOCKbu_lmukhWD_fL6WSVeE3bxECpckFBcQDUaKygLtfclEXmnDKKOSstZxmALbQyJWjjUJjCcSaUtlSMyPXfrEfE7aH2-6Lut8M_4hsmR1YC</recordid><startdate>200910</startdate><enddate>200910</enddate><creator>Sato, E.K.</creator><creator>Kinoshita, M.</creator><creator>Yamamoto, Y.</creator><creator>Amboh, T.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200910</creationdate><title>Redundant, High Density, High Efficiency Double Conversion Uninterruptible Power System</title><author>Sato, E.K. ; Kinoshita, M. ; Yamamoto, Y. ; Amboh, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-b7c583075277e9ebd30f892bca6ff5b51fd4d21677da95bc79bfe3baf21359d03</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Circuit testing</topic><topic>Circuit topology</topic><topic>Insulated gate bipolar transistors</topic><topic>Power electronics</topic><topic>Power system reliability</topic><topic>Redundancy</topic><topic>Sensorless control</topic><topic>System testing</topic><topic>Uninterruptible power systems</topic><topic>Voltage fluctuations</topic><toplevel>online_resources</toplevel><creatorcontrib>Sato, E.K.</creatorcontrib><creatorcontrib>Kinoshita, M.</creatorcontrib><creatorcontrib>Yamamoto, Y.</creatorcontrib><creatorcontrib>Amboh, T.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sato, E.K.</au><au>Kinoshita, M.</au><au>Yamamoto, Y.</au><au>Amboh, T.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Redundant, High Density, High Efficiency Double Conversion Uninterruptible Power System</atitle><btitle>2009 IEEE Industry Applications Society Annual Meeting</btitle><stitle>IAS</stitle><date>2009-10</date><risdate>2009</risdate><spage>1</spage><epage>8</epage><pages>1-8</pages><issn>0197-2618</issn><eissn>2576-702X</eissn><isbn>1424434750</isbn><isbn>9781424434756</isbn><eisbn>1424434769</eisbn><eisbn>9781424434763</eisbn><abstract>This paper presents a novel design for double conversion UPS systems that results in higher power density, higher efficiency and more flexible parallelism for higher reliability. This design comprises a three-level circuit topology, a customized power semiconductor module and a cross current sensorless parallel control. The innovative circuit topology results in an UPS with higher efficiency and dramatic size/weight reduction and confirms the advantages of three-level circuits in low-voltage applications. Higher reliability uninterruptible power system using parallel redundant UPS modules employs a novel cross current sensorless control without compromise the performance in comparison with single-module systems. Test results using a single and a multiple module system confirm the improvement in efficiency and the high performance of this UPS.</abstract><pub>IEEE</pub><doi>10.1109/IAS.2009.5324877</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0197-2618 |
| ispartof | 2009 IEEE Industry Applications Society Annual Meeting, 2009, p.1-8 |
| issn | 0197-2618 2576-702X |
| language | eng |
| recordid | cdi_ieee_primary_5324877 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuit testing Circuit topology Insulated gate bipolar transistors Power electronics Power system reliability Redundancy Sensorless control System testing Uninterruptible power systems Voltage fluctuations |
| title | Redundant, High Density, High Efficiency Double Conversion Uninterruptible Power System |
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