Alignment and illumination issues in scaled THz RCS measurements
Radar cross section (RCS) measurements are widely employed for the target identification of objects such as aircraft. The RCS of large, complex geometries is usually determined in a well defined, scaled experimental setup. In such a setup, the measuring frequency equates the frequency of interest mu...
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creator | Jansen, C. Krumbholz, N. Geise, R. Probst, T. Peters, O. Enders, A. Koch, M. |
description | Radar cross section (RCS) measurements are widely employed for the target identification of objects such as aircraft. The RCS of large, complex geometries is usually determined in a well defined, scaled experimental setup. In such a setup, the measuring frequency equates the frequency of interest multiplied by the scaling factor of the model. For high scaling factors, frequencies well above 100 GHz result so that conventional microwave equipment reaches its technological limits. In this paper, we discuss the use of a fiber coupled terahertz time domain spectroscopy system for angle dependent RCS measurements. Several measurements on simple objects like metal plates with corresponding simulations are performed. We also investigate how angular misalignment and displacement of the scatterer effects the measurement results. Moreover, we discuss the influence of non planar incident wavefronts and compare experimentally obtained data to simulations using an enhanced physical optics model. |
doi_str_mv | 10.1109/ICIMW.2009.5324664 |
format | Conference Proceeding |
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Moreover, we discuss the influence of non planar incident wavefronts and compare experimentally obtained data to simulations using an enhanced physical optics model.</description><subject>Aircraft</subject><subject>Frequency measurement</subject><subject>Geometry</subject><subject>Lighting</subject><subject>Microwave devices</subject><subject>Microwave technology</subject><subject>Optical fiber devices</subject><subject>Radar cross section</subject><subject>Spectroscopy</subject><subject>Submillimeter wave technology</subject><issn>2162-2027</issn><isbn>1424454166</isbn><isbn>9781424454167</isbn><isbn>1424454174</isbn><isbn>9781424454174</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFj81KxDAUhSMqOI7zArrJC3TMzc3vzqGoUxgRtOBySNtEIm2Upl3o06s44OpwFt_hO4RcAlsDMHtdldXDy5ozZtcSuVBKHJFzEFwIKUCL4_-i1AlZcFC84IzrM7LK-Y0xhpyhFXZBbjZ9fE2DTxN1qaOx7-chJjfF90RjzrPPNCaaW9f7jtbbL_pUPtPBuzyP_pfKF-Q0uD771SGXpL67rcttsXu8r8rNroiWTQUihBDQQGh420CrW-MUNtKbwBB0g9Ki9soZKRVvDIdOCAdW_pgbLZ3EJbn6m43e-_3HGAc3fu4P5_Eb9TVKqQ</recordid><startdate>200909</startdate><enddate>200909</enddate><creator>Jansen, C.</creator><creator>Krumbholz, N.</creator><creator>Geise, R.</creator><creator>Probst, T.</creator><creator>Peters, O.</creator><creator>Enders, A.</creator><creator>Koch, M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200909</creationdate><title>Alignment and illumination issues in scaled THz RCS measurements</title><author>Jansen, C. ; Krumbholz, N. ; Geise, R. ; Probst, T. ; Peters, O. ; Enders, A. ; Koch, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-331fff381fb2cb1c7c8a63b5e8f0317b35937e6a85562b821d44a195216875a53</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Aircraft</topic><topic>Frequency measurement</topic><topic>Geometry</topic><topic>Lighting</topic><topic>Microwave devices</topic><topic>Microwave technology</topic><topic>Optical fiber devices</topic><topic>Radar cross section</topic><topic>Spectroscopy</topic><topic>Submillimeter wave technology</topic><toplevel>online_resources</toplevel><creatorcontrib>Jansen, C.</creatorcontrib><creatorcontrib>Krumbholz, N.</creatorcontrib><creatorcontrib>Geise, R.</creatorcontrib><creatorcontrib>Probst, T.</creatorcontrib><creatorcontrib>Peters, O.</creatorcontrib><creatorcontrib>Enders, A.</creatorcontrib><creatorcontrib>Koch, M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jansen, C.</au><au>Krumbholz, N.</au><au>Geise, R.</au><au>Probst, T.</au><au>Peters, O.</au><au>Enders, A.</au><au>Koch, M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Alignment and illumination issues in scaled THz RCS measurements</atitle><btitle>2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves</btitle><stitle>ICIMW</stitle><date>2009-09</date><risdate>2009</risdate><spage>1</spage><epage>2</epage><pages>1-2</pages><issn>2162-2027</issn><isbn>1424454166</isbn><isbn>9781424454167</isbn><eisbn>1424454174</eisbn><eisbn>9781424454174</eisbn><abstract>Radar cross section (RCS) measurements are widely employed for the target identification of objects such as aircraft. 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identifier | ISSN: 2162-2027 |
ispartof | 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves, 2009, p.1-2 |
issn | 2162-2027 |
language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Aircraft Frequency measurement Geometry Lighting Microwave devices Microwave technology Optical fiber devices Radar cross section Spectroscopy Submillimeter wave technology |
title | Alignment and illumination issues in scaled THz RCS measurements |
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