Matching models to real life for defect reduction

This paper describes a method for quantitatively linking easily measurable parameters [defectivity in parts per million (PPM), test effectiveness (TE), failures in time rates (FIT)] with both customer and producer valued metrics. It describes a process by which test data derived from assembled print...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Tuttle, J.A., Collins, T.W., Tuttle, M.S.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Assembly Circuit testing Costs Manufacturing processes Printed circuits Process design Production facilities Resource management Systems engineering and theory Tellurium
Online-Zugang:	Volltext bestellen
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