Non-robust versus robust [test generation]

We show that a path delay under a non-robust test may be longer than under any robust test. Thus, for a given path, a non-robust test can detect a delay fault undetectable by robust tests. This can happen even in a circuit in which all paths are robust-testable.

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Bibliographische Detailangaben
Hauptverfasser:	Pierzynska, A., Pilarski, S.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit faults Circuit testing Combinational circuits Councils Electrical fault detection Fault detection Logic circuits Logic testing Propagation delay Robustness
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Beschreibung
Zusammenfassung:	We show that a path delay under a non-robust test may be longer than under any robust test. Thus, for a given path, a non-robust test can detect a delay fault undetectable by robust tests. This can happen even in a circuit in which all paths are robust-testable.
ISSN:	1089-3539 2378-2250
DOI:	10.1109/TEST.1995.529825