Special coupling effects of UWB pulses to short signal traces

Special coupling effects of UWB pulses to short signal traces

Ultra wideband (UWB) pulses cover a large frequency range up to several GHz, thus they are able to cause malfunctions or even destructions of complex electronic systems. Previous investigations of the coupling effects of fast transient pulses to complex electronic systems have shown, that increasing...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Fisahn, S., Garbe, H.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Coupling circuits
Electromagnetic transients
EMP radiation effects
Frequency
Interference
Microcontrollers
Printed circuits
Pulse measurements
Testing
Transceivers
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 236
container_issue
container_start_page 231
container_title
container_volume
creator Fisahn, S.
Garbe, H.
description Ultra wideband (UWB) pulses cover a large frequency range up to several GHz, thus they are able to cause malfunctions or even destructions of complex electronic systems. Previous investigations of the coupling effects of fast transient pulses to complex electronic systems have shown, that increasing system dimensions lead to an increased coupling efficiency. This statement seems to be universally applicable for all electronic systems, but susceptibility measurements of a generic microcontroller board with UWB pulses show surprisingly different results. In this contribution, this effect is investigated by measurements and numerical methods. Measurement results of the generic microcontroller board are presented as well as numerical results of the coupling behavior of different fast transient pulses to short PCB traces. Furthermore, the results of both measurement and numerical methods are compared to each other.
doi_str_mv 10.1109/ISEMC.2009.5284563
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5284563</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5284563</ieee_id><sourcerecordid>5284563</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-8371221a97e71451334bb166b16588b53df2838f6bd6aa2b0e572e9fda322a993</originalsourceid><addsrcrecordid>eNo9kL1OwzAUhS2gElGbF4DFL5Dge_0Te2CAqEClog4tgq1yErsYhSaK04G3JxIVw9EZvqNvOITcAMsBmLlbbZevZY6MmVyiFlLxC5IgSJ0BgL4kqSk0CBRCoFLm6p-xjxlJNM-UkEKYa5LG-MUYm5TKcEjI_bZ3dbAtrbtT34bjgTrvXT1G2nn69v5I-1MbXaRjR-NnN4w0hsNxmo-DrV1ckJm3E0_PPSe7p-WufMnWm-dV-bDOgmFjpnkBiGBN4QoQEjgXVQVKTZFaV5I3HjXXXlWNshYr5mSBzvjGckRrDJ-T2z9tcM7t-yF82-Fnf_6B_wJYLEvW</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Special coupling effects of UWB pulses to short signal traces</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Fisahn, S. ; Garbe, H.</creator><creatorcontrib>Fisahn, S. ; Garbe, H.</creatorcontrib><description>Ultra wideband (UWB) pulses cover a large frequency range up to several GHz, thus they are able to cause malfunctions or even destructions of complex electronic systems. Previous investigations of the coupling effects of fast transient pulses to complex electronic systems have shown, that increasing system dimensions lead to an increased coupling efficiency. This statement seems to be universally applicable for all electronic systems, but susceptibility measurements of a generic microcontroller board with UWB pulses show surprisingly different results. In this contribution, this effect is investigated by measurements and numerical methods. Measurement results of the generic microcontroller board are presented as well as numerical results of the coupling behavior of different fast transient pulses to short PCB traces. Furthermore, the results of both measurement and numerical methods are compared to each other.</description><identifier>ISSN: 2158-110X</identifier><identifier>ISBN: 9781424442669</identifier><identifier>ISBN: 1424442664</identifier><identifier>EISSN: 2158-1118</identifier><identifier>DOI: 10.1109/ISEMC.2009.5284563</identifier><identifier>LCCN: 83-645449</identifier><language>eng</language><publisher>IEEE</publisher><subject>Coupling circuits ; Electromagnetic transients ; EMP radiation effects ; Frequency ; Interference ; Microcontrollers ; Printed circuits ; Pulse measurements ; Testing ; Transceivers</subject><ispartof>2009 IEEE International Symposium on Electromagnetic Compatibility, 2009, p.231-236</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5284563$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5284563$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Fisahn, S.</creatorcontrib><creatorcontrib>Garbe, H.</creatorcontrib><title>Special coupling effects of UWB pulses to short signal traces</title><title>2009 IEEE International Symposium on Electromagnetic Compatibility</title><addtitle>ISEMC</addtitle><description>Ultra wideband (UWB) pulses cover a large frequency range up to several GHz, thus they are able to cause malfunctions or even destructions of complex electronic systems. Previous investigations of the coupling effects of fast transient pulses to complex electronic systems have shown, that increasing system dimensions lead to an increased coupling efficiency. This statement seems to be universally applicable for all electronic systems, but susceptibility measurements of a generic microcontroller board with UWB pulses show surprisingly different results. In this contribution, this effect is investigated by measurements and numerical methods. Measurement results of the generic microcontroller board are presented as well as numerical results of the coupling behavior of different fast transient pulses to short PCB traces. Furthermore, the results of both measurement and numerical methods are compared to each other.</description><subject>Coupling circuits</subject><subject>Electromagnetic transients</subject><subject>EMP radiation effects</subject><subject>Frequency</subject><subject>Interference</subject><subject>Microcontrollers</subject><subject>Printed circuits</subject><subject>Pulse measurements</subject><subject>Testing</subject><subject>Transceivers</subject><issn>2158-110X</issn><issn>2158-1118</issn><isbn>9781424442669</isbn><isbn>1424442664</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9kL1OwzAUhS2gElGbF4DFL5Dge_0Te2CAqEClog4tgq1yErsYhSaK04G3JxIVw9EZvqNvOITcAMsBmLlbbZevZY6MmVyiFlLxC5IgSJ0BgL4kqSk0CBRCoFLm6p-xjxlJNM-UkEKYa5LG-MUYm5TKcEjI_bZ3dbAtrbtT34bjgTrvXT1G2nn69v5I-1MbXaRjR-NnN4w0hsNxmo-DrV1ckJm3E0_PPSe7p-WufMnWm-dV-bDOgmFjpnkBiGBN4QoQEjgXVQVKTZFaV5I3HjXXXlWNshYr5mSBzvjGckRrDJ-T2z9tcM7t-yF82-Fnf_6B_wJYLEvW</recordid><startdate>200908</startdate><enddate>200908</enddate><creator>Fisahn, S.</creator><creator>Garbe, H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200908</creationdate><title>Special coupling effects of UWB pulses to short signal traces</title><author>Fisahn, S. ; Garbe, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-8371221a97e71451334bb166b16588b53df2838f6bd6aa2b0e572e9fda322a993</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Coupling circuits</topic><topic>Electromagnetic transients</topic><topic>EMP radiation effects</topic><topic>Frequency</topic><topic>Interference</topic><topic>Microcontrollers</topic><topic>Printed circuits</topic><topic>Pulse measurements</topic><topic>Testing</topic><topic>Transceivers</topic><toplevel>online_resources</toplevel><creatorcontrib>Fisahn, S.</creatorcontrib><creatorcontrib>Garbe, H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fisahn, S.</au><au>Garbe, H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Special coupling effects of UWB pulses to short signal traces</atitle><btitle>2009 IEEE International Symposium on Electromagnetic Compatibility</btitle><stitle>ISEMC</stitle><date>2009-08</date><risdate>2009</risdate><spage>231</spage><epage>236</epage><pages>231-236</pages><issn>2158-110X</issn><eissn>2158-1118</eissn><isbn>9781424442669</isbn><isbn>1424442664</isbn><abstract>Ultra wideband (UWB) pulses cover a large frequency range up to several GHz, thus they are able to cause malfunctions or even destructions of complex electronic systems. Previous investigations of the coupling effects of fast transient pulses to complex electronic systems have shown, that increasing system dimensions lead to an increased coupling efficiency. This statement seems to be universally applicable for all electronic systems, but susceptibility measurements of a generic microcontroller board with UWB pulses show surprisingly different results. In this contribution, this effect is investigated by measurements and numerical methods. Measurement results of the generic microcontroller board are presented as well as numerical results of the coupling behavior of different fast transient pulses to short PCB traces. Furthermore, the results of both measurement and numerical methods are compared to each other.</abstract><pub>IEEE</pub><doi>10.1109/ISEMC.2009.5284563</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 2158-110X
ispartof 2009 IEEE International Symposium on Electromagnetic Compatibility, 2009, p.231-236
issn 2158-110X
2158-1118
language eng
recordid cdi_ieee_primary_5284563
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Coupling circuits
Electromagnetic transients
EMP radiation effects
Frequency
Interference
Microcontrollers
Printed circuits
Pulse measurements
Testing
Transceivers
title Special coupling effects of UWB pulses to short signal traces
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T06%3A47%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Special%20coupling%20effects%20of%20UWB%20pulses%20to%20short%20signal%20traces&rft.btitle=2009%20IEEE%20International%20Symposium%20on%20Electromagnetic%20Compatibility&rft.au=Fisahn,%20S.&rft.date=2009-08&rft.spage=231&rft.epage=236&rft.pages=231-236&rft.issn=2158-110X&rft.eissn=2158-1118&rft.isbn=9781424442669&rft.isbn_list=1424442664&rft_id=info:doi/10.1109/ISEMC.2009.5284563&rft_dat=%3Cieee_6IE%3E5284563%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5284563&rfr_iscdi=true