Delay Test: The Next Frontier for LSSD Test Systems
Delay testing, as opposed to static testing introduces the parameter of time as a new variable. Time impacts the way defects manifest themselves and are modeled as faults, as well as how defect sizes and system timing statistics interact with tester timing constraints in the detection of causes for...
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| creator | Konemann, B. Barlow, J. Chang, P. Iyengar, V. Rosen, B. Williams, T. Gabrielson, R. Goertz, C. Keller, B. McCauley, K. Tischer, J. |
| description | Delay testing, as opposed to static testing introduces the parameter of time as a new variable. Time impacts the way defects manifest themselves and are modeled as faults, as well as how defect sizes and system timing statistics interact with tester timing constraints in the detection of causes for dynamic system malfunctions. This paper briefly discusses some of the issues that had to be addressed in the development of a comprehensive system for delay testing in a Level Sensitive Scan Design environment. |
| doi_str_mv | 10.1109/TEST.1992.527878 |
| format | Conference Proceeding |
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| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1089-3539 |
| ispartof | Proceedings International Test Conference 1992, 1992, p.578 |
| issn | 1089-3539 2378-2250 |
| language | eng |
| recordid | cdi_ieee_primary_527878 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Automatic testing Clocks Control systems Delay effects Delay systems Logic testing Production Shift registers System testing Timing |
| title | Delay Test: The Next Frontier for LSSD Test Systems |
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