Delay Test: The Next Frontier for LSSD Test Systems

Delay Test: The Next Frontier for LSSD Test Systems

Delay testing, as opposed to static testing introduces the parameter of time as a new variable. Time impacts the way defects manifest themselves and are modeled as faults, as well as how defect sizes and system timing statistics interact with tester timing constraints in the detection of causes for...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Konemann, B., Barlow, J., Chang, P., Iyengar, V., Rosen, B., Williams, T., Gabrielson, R., Goertz, C., Keller, B., McCauley, K., Tischer, J.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Automatic testing
Clocks
Control systems
Delay effects
Delay systems
Logic testing
Production
Shift registers
System testing
Timing
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Delay testing, as opposed to static testing introduces the parameter of time as a new variable. Time impacts the way defects manifest themselves and are modeled as faults, as well as how defect sizes and system timing statistics interact with tester timing constraints in the detection of causes for dynamic system malfunctions. This paper briefly discusses some of the issues that had to be addressed in the development of a comprehensive system for delay testing in a Level Sensitive Scan Design environment.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1992.527878