Microcontroller based tester for semiconductor devices
The system presented in this paper represents an enhanced tester for active devices. It ensure the identification of the transistor type (PNP, NPN, JFET, n-MOS, p-MOS) connected to the test terminals, can detect the disposing of the component's terminals in the package and also can measure the...
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| creator | Lita, I. Jurian, M. Visan, D.A. Oprea, S. Cioc, I.B. |
| description | The system presented in this paper represents an enhanced tester for active devices. It ensure the identification of the transistor type (PNP, NPN, JFET, n-MOS, p-MOS) connected to the test terminals, can detect the disposing of the component's terminals in the package and also can measure the gain factor of the bipolar transistors. In addition, the proposed module can measure the channel resistance of field effect transistors (FET) and threshold voltage for metal-oxide transistors (MOS). The measurement results for the tested device are presented on an LCD display. The system is based on PIC16F872 microcontroller which manage the voltages applied to the three test terminals where is connected the semiconductor device. The system is battery operated. By using the microcontroller technology and very few external components, it is obtained a portable and versatile apparatus that allows quick and accurate measurements on active electronic components. |
| doi_str_mv | 10.1109/ISSE.2008.5276430 |
| format | Conference Proceeding |
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It ensure the identification of the transistor type (PNP, NPN, JFET, n-MOS, p-MOS) connected to the test terminals, can detect the disposing of the component's terminals in the package and also can measure the gain factor of the bipolar transistors. In addition, the proposed module can measure the channel resistance of field effect transistors (FET) and threshold voltage for metal-oxide transistors (MOS). The measurement results for the tested device are presented on an LCD display. The system is based on PIC16F872 microcontroller which manage the voltages applied to the three test terminals where is connected the semiconductor device. The system is battery operated. By using the microcontroller technology and very few external components, it is obtained a portable and versatile apparatus that allows quick and accurate measurements on active electronic components.</description><identifier>ISSN: 2161-2528</identifier><identifier>ISBN: 1424439728</identifier><identifier>ISBN: 1424439736</identifier><identifier>ISBN: 9781424439720</identifier><identifier>ISBN: 9781424439737</identifier><identifier>EISBN: 9781424439744</identifier><identifier>EISBN: 1424439744</identifier><identifier>DOI: 10.1109/ISSE.2008.5276430</identifier><language>eng</language><publisher>IEEE</publisher><subject>Battery charge measurement ; Bipolar transistors ; Electrical resistance measurement ; FETs ; Gain measurement ; Microcontrollers ; Semiconductor device packaging ; Semiconductor device testing ; Semiconductor devices ; System testing</subject><ispartof>2008 31st International Spring Seminar on Electronics Technology, 2008, p.117-120</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5276430$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5276430$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lita, I.</creatorcontrib><creatorcontrib>Jurian, M.</creatorcontrib><creatorcontrib>Visan, D.A.</creatorcontrib><creatorcontrib>Oprea, S.</creatorcontrib><creatorcontrib>Cioc, I.B.</creatorcontrib><title>Microcontroller based tester for semiconductor devices</title><title>2008 31st International Spring Seminar on Electronics Technology</title><addtitle>ISSE</addtitle><description>The system presented in this paper represents an enhanced tester for active devices. 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By using the microcontroller technology and very few external components, it is obtained a portable and versatile apparatus that allows quick and accurate measurements on active electronic components.</description><subject>Battery charge measurement</subject><subject>Bipolar transistors</subject><subject>Electrical resistance measurement</subject><subject>FETs</subject><subject>Gain measurement</subject><subject>Microcontrollers</subject><subject>Semiconductor device packaging</subject><subject>Semiconductor device testing</subject><subject>Semiconductor devices</subject><subject>System testing</subject><issn>2161-2528</issn><isbn>1424439728</isbn><isbn>1424439736</isbn><isbn>9781424439720</isbn><isbn>9781424439737</isbn><isbn>9781424439744</isbn><isbn>1424439744</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1z81KAzEUBeCIFWxrH0DczAvMeHPzv5RStVDpot2XTOYORKaOJFHw7R2wrg4fBw4cxu45NJyDe9weDpsGAWyj0Ggp4IqtnLFcopTCGSmv2eIfaGdsjlzzGhXaW7bI-R1ACYF8zvRbDGkM40dJ4zBQqlqfqasK5TKhH1OV6RynvvsKZVJH3zFQvmM3vR8yrS65ZMfnzXH9Wu_2L9v1066ODkotelCBAvreO5QdWS9Uq6y0wNEo5ax1nGOrnfcGwHkteh2sFrLtTAioxZI9_M1GIjp9pnj26ed0uSx-AeubR-E</recordid><startdate>200805</startdate><enddate>200805</enddate><creator>Lita, I.</creator><creator>Jurian, M.</creator><creator>Visan, D.A.</creator><creator>Oprea, S.</creator><creator>Cioc, I.B.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200805</creationdate><title>Microcontroller based tester for semiconductor devices</title><author>Lita, I. ; Jurian, M. ; Visan, D.A. ; Oprea, S. ; Cioc, I.B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-3f05cec2afa924de8a35b58480127559889112b69aa7009a63f6c8634bd7cc263</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Battery charge measurement</topic><topic>Bipolar transistors</topic><topic>Electrical resistance measurement</topic><topic>FETs</topic><topic>Gain measurement</topic><topic>Microcontrollers</topic><topic>Semiconductor device packaging</topic><topic>Semiconductor device testing</topic><topic>Semiconductor devices</topic><topic>System testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Lita, I.</creatorcontrib><creatorcontrib>Jurian, M.</creatorcontrib><creatorcontrib>Visan, D.A.</creatorcontrib><creatorcontrib>Oprea, S.</creatorcontrib><creatorcontrib>Cioc, I.B.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lita, I.</au><au>Jurian, M.</au><au>Visan, D.A.</au><au>Oprea, S.</au><au>Cioc, I.B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Microcontroller based tester for semiconductor devices</atitle><btitle>2008 31st International Spring Seminar on Electronics Technology</btitle><stitle>ISSE</stitle><date>2008-05</date><risdate>2008</risdate><spage>117</spage><epage>120</epage><pages>117-120</pages><issn>2161-2528</issn><isbn>1424439728</isbn><isbn>1424439736</isbn><isbn>9781424439720</isbn><isbn>9781424439737</isbn><eisbn>9781424439744</eisbn><eisbn>1424439744</eisbn><abstract>The system presented in this paper represents an enhanced tester for active devices. It ensure the identification of the transistor type (PNP, NPN, JFET, n-MOS, p-MOS) connected to the test terminals, can detect the disposing of the component's terminals in the package and also can measure the gain factor of the bipolar transistors. In addition, the proposed module can measure the channel resistance of field effect transistors (FET) and threshold voltage for metal-oxide transistors (MOS). The measurement results for the tested device are presented on an LCD display. The system is based on PIC16F872 microcontroller which manage the voltages applied to the three test terminals where is connected the semiconductor device. The system is battery operated. By using the microcontroller technology and very few external components, it is obtained a portable and versatile apparatus that allows quick and accurate measurements on active electronic components.</abstract><pub>IEEE</pub><doi>10.1109/ISSE.2008.5276430</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 2161-2528 |
| ispartof | 2008 31st International Spring Seminar on Electronics Technology, 2008, p.117-120 |
| issn | 2161-2528 |
| language | eng |
| recordid | cdi_ieee_primary_5276430 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Battery charge measurement Bipolar transistors Electrical resistance measurement FETs Gain measurement Microcontrollers Semiconductor device packaging Semiconductor device testing Semiconductor devices System testing |
| title | Microcontroller based tester for semiconductor devices |
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