A Self-Checking Scheme to Mitigate Single Event Upset Effects in SRAM-Based FPAAs

In this work the problem of Single Event Upset (SEU) is considered in a recent analog technology: The Field Programmable Analog Arrays (FPAAs). Some FPAA models are based on SRAM memory cells to implement the user programmability, which makes this kind of device vulnerable to SEU when employed in ap...

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