New on-chip screening of gate oxides smart power devices for automotive applications

Efficient screening procedures for the control of the gate oxide defectivity are vital to limit early failures especially in critical automotive applications. Traditional strategies based on burn-in and in-line tests are able to provide the required level of reliability but they are expensive and ti...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Malandruccolo, V., Ciappa, M., Rothleitner, H., Fichtner, W.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automotive applications Burn-In Circuit simulation Circuit testing Gate Oxide Reliability Gate Stress Test Leakage current Logic circuits Logic testing Low Side Switch Monitoring MOSFETs Stress control Voltage control
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