Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment
This paper reports the experience being made during the implementation of low pin count techniques and their insertion into a production environment. The techniques applied are "on-loadboard compare" and "shared driver". Already known on a concept level for an on-chip approach, i...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 44 |
|---|---|
| container_issue | |
| container_start_page | 39 |
| container_title | |
| container_volume | |
| creator | Faber, F.-U. Beck, M. Barondeau, O. Rabenalt, T. Gossel, M. Leininger, A. |
| description | This paper reports the experience being made during the implementation of low pin count techniques and their insertion into a production environment. The techniques applied are "on-loadboard compare" and "shared driver". Already known on a concept level for an on-chip approach, in this paper the transfer to an on-loadboard solution is presented. Emphasis is put on production related aspects. Practical experience, challenges, and pitfalls are described to allow a better assessment of risks and benefits of the investigated methods. |
| doi_str_mv | 10.1109/ETS.2009.38 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5170457</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5170457</ieee_id><sourcerecordid>5170457</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-bbee737aefee694f5c1647fbf6a7ed9d9f4d9e6fce5474a62924d52669655e1b3</originalsourceid><addsrcrecordid>eNotj8tOwzAURC0eEqV0xZKNf8DFTvyIl6gEWqlSkQjryo5vWqPUCU4C9O9JgVnMleaMrjQI3TI6Z4zq-7x4nSeU6nmanaEJEyIjTGX0HF1TJbVIFU3pxQmklLBMqSs067p3OkokI9cT9PHYDLb2YYcL6Hq8gLrGxT42w27fDj22R7wJZN0YZxsTHV6O9mUiELw6tDUcIPSm903AJjicf7cQPYQSsB8T_BIbN5S_OA-fPjbh1L9Bl5WpO5j93yl6e8qLxZKsN8-rxcOaeKZET6wFUKkyUAFIzStRMslVZStpFDjtdMWdBlmVILjiRiY64W5cJbUUAphNp-ju768HgG0b_cHE41YwRblQ6Q8crFzz</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Faber, F.-U. ; Beck, M. ; Barondeau, O. ; Rabenalt, T. ; Gossel, M. ; Leininger, A.</creator><creatorcontrib>Faber, F.-U. ; Beck, M. ; Barondeau, O. ; Rabenalt, T. ; Gossel, M. ; Leininger, A.</creatorcontrib><description>This paper reports the experience being made during the implementation of low pin count techniques and their insertion into a production environment. The techniques applied are "on-loadboard compare" and "shared driver". Already known on a concept level for an on-chip approach, in this paper the transfer to an on-loadboard solution is presented. Emphasis is put on production related aspects. Practical experience, challenges, and pitfalls are described to allow a better assessment of risks and benefits of the investigated methods.</description><identifier>ISSN: 1530-1877</identifier><identifier>ISBN: 0769537030</identifier><identifier>ISBN: 9780769537030</identifier><identifier>EISSN: 1558-1780</identifier><identifier>DOI: 10.1109/ETS.2009.38</identifier><language>eng</language><publisher>IEEE</publisher><subject>Automatic test equipment ; Built-in self-test ; Circuit testing ; Cost function ; Field programmable gate arrays ; Hardware ; Paper technology ; Production systems ; Test equipment ; Throughput</subject><ispartof>2009 14th IEEE European Test Symposium, 2009, p.39-44</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5170457$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5170457$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Faber, F.-U.</creatorcontrib><creatorcontrib>Beck, M.</creatorcontrib><creatorcontrib>Barondeau, O.</creatorcontrib><creatorcontrib>Rabenalt, T.</creatorcontrib><creatorcontrib>Gossel, M.</creatorcontrib><creatorcontrib>Leininger, A.</creatorcontrib><title>Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment</title><title>2009 14th IEEE European Test Symposium</title><addtitle>ETSYM</addtitle><description>This paper reports the experience being made during the implementation of low pin count techniques and their insertion into a production environment. The techniques applied are "on-loadboard compare" and "shared driver". Already known on a concept level for an on-chip approach, in this paper the transfer to an on-loadboard solution is presented. Emphasis is put on production related aspects. Practical experience, challenges, and pitfalls are described to allow a better assessment of risks and benefits of the investigated methods.</description><subject>Automatic test equipment</subject><subject>Built-in self-test</subject><subject>Circuit testing</subject><subject>Cost function</subject><subject>Field programmable gate arrays</subject><subject>Hardware</subject><subject>Paper technology</subject><subject>Production systems</subject><subject>Test equipment</subject><subject>Throughput</subject><issn>1530-1877</issn><issn>1558-1780</issn><isbn>0769537030</isbn><isbn>9780769537030</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tOwzAURC0eEqV0xZKNf8DFTvyIl6gEWqlSkQjryo5vWqPUCU4C9O9JgVnMleaMrjQI3TI6Z4zq-7x4nSeU6nmanaEJEyIjTGX0HF1TJbVIFU3pxQmklLBMqSs067p3OkokI9cT9PHYDLb2YYcL6Hq8gLrGxT42w27fDj22R7wJZN0YZxsTHV6O9mUiELw6tDUcIPSm903AJjicf7cQPYQSsB8T_BIbN5S_OA-fPjbh1L9Bl5WpO5j93yl6e8qLxZKsN8-rxcOaeKZET6wFUKkyUAFIzStRMslVZStpFDjtdMWdBlmVILjiRiY64W5cJbUUAphNp-ju768HgG0b_cHE41YwRblQ6Q8crFzz</recordid><startdate>200905</startdate><enddate>200905</enddate><creator>Faber, F.-U.</creator><creator>Beck, M.</creator><creator>Barondeau, O.</creator><creator>Rabenalt, T.</creator><creator>Gossel, M.</creator><creator>Leininger, A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200905</creationdate><title>Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment</title><author>Faber, F.-U. ; Beck, M. ; Barondeau, O. ; Rabenalt, T. ; Gossel, M. ; Leininger, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-bbee737aefee694f5c1647fbf6a7ed9d9f4d9e6fce5474a62924d52669655e1b3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Automatic test equipment</topic><topic>Built-in self-test</topic><topic>Circuit testing</topic><topic>Cost function</topic><topic>Field programmable gate arrays</topic><topic>Hardware</topic><topic>Paper technology</topic><topic>Production systems</topic><topic>Test equipment</topic><topic>Throughput</topic><toplevel>online_resources</toplevel><creatorcontrib>Faber, F.-U.</creatorcontrib><creatorcontrib>Beck, M.</creatorcontrib><creatorcontrib>Barondeau, O.</creatorcontrib><creatorcontrib>Rabenalt, T.</creatorcontrib><creatorcontrib>Gossel, M.</creatorcontrib><creatorcontrib>Leininger, A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Faber, F.-U.</au><au>Beck, M.</au><au>Barondeau, O.</au><au>Rabenalt, T.</au><au>Gossel, M.</au><au>Leininger, A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment</atitle><btitle>2009 14th IEEE European Test Symposium</btitle><stitle>ETSYM</stitle><date>2009-05</date><risdate>2009</risdate><spage>39</spage><epage>44</epage><pages>39-44</pages><issn>1530-1877</issn><eissn>1558-1780</eissn><isbn>0769537030</isbn><isbn>9780769537030</isbn><abstract>This paper reports the experience being made during the implementation of low pin count techniques and their insertion into a production environment. The techniques applied are "on-loadboard compare" and "shared driver". Already known on a concept level for an on-chip approach, in this paper the transfer to an on-loadboard solution is presented. Emphasis is put on production related aspects. Practical experience, challenges, and pitfalls are described to allow a better assessment of risks and benefits of the investigated methods.</abstract><pub>IEEE</pub><doi>10.1109/ETS.2009.38</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1530-1877 |
| ispartof | 2009 14th IEEE European Test Symposium, 2009, p.39-44 |
| issn | 1530-1877 1558-1780 |
| language | eng |
| recordid | cdi_ieee_primary_5170457 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Automatic test equipment Built-in self-test Circuit testing Cost function Field programmable gate arrays Hardware Paper technology Production systems Test equipment Throughput |
| title | Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T00%3A47%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Doubling%20Test%20Cell%20Throughput%20by%20On-Loadboard%20Hardware-%20Implementation%20and%20Experience%20in%20a%20Production%20Environment&rft.btitle=2009%2014th%20IEEE%20European%20Test%20Symposium&rft.au=Faber,%20F.-U.&rft.date=2009-05&rft.spage=39&rft.epage=44&rft.pages=39-44&rft.issn=1530-1877&rft.eissn=1558-1780&rft.isbn=0769537030&rft.isbn_list=9780769537030&rft_id=info:doi/10.1109/ETS.2009.38&rft_dat=%3Cieee_6IE%3E5170457%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5170457&rfr_iscdi=true |