Scale limits in estimating fractal dimensions of image surfaces
Fractal dimension is a useful parameter for characterizing textured images. However,different methods and even the same method with different scale ranges of computation give different values due to the finite sizes and gray level numbers of digitized images. This paper presents an intuitive, simple...
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| container_end_page | 473 vol.1 |
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| creator | Jin, X.C. Ong, S.H. Jayasooriah |
| description | Fractal dimension is a useful parameter for characterizing textured images. However,different methods and even the same method with different scale ranges of computation give different values due to the finite sizes and gray level numbers of digitized images. This paper presents an intuitive, simple, model-free algorithm for estimating the fractal dimensions of textured images. The emphasis is on how scale range affects the value of the measured fractal dimension. The results of experiments using computer-generated image surfaces demonstrate the validity of the scale limit criterion. |
| doi_str_mv | 10.1109/SICON.1993.515808 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_515808</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>515808</ieee_id><sourcerecordid>515808</sourcerecordid><originalsourceid>FETCH-LOGICAL-i174t-58c1fb6b62821310e474f349b750723be7ff806facd8ad8822c9b9ddbfa1c6553</originalsourceid><addsrcrecordid>eNotT81qwzAYM4xBR5cH6E5-gWT-_BPbpzHCfgqlPXQ7F9v5XDySdMTZYW8_QycEOkgIiZANsAaA2cfjtjvsG7BWNAqUYeaGVFYbVihASsVWpMr5ixVIVWLsjjwdgxuQDmlMS6ZpopiXNLolTWcaZxcWN9A-jTjldJkyvURa3DPS_DNHFzDfk9vohozVv67J5-vLR_de7w5v2-55VyfQcqmVCRB961tuOAhgKLWMQlqvFdNceNQxGtaWyt643hjOg_W27310EFqlxJo8XHsTIp6-57Ji_j1dX4o_Gm5IMQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Scale limits in estimating fractal dimensions of image surfaces</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Jin, X.C. ; Ong, S.H. ; Jayasooriah</creator><creatorcontrib>Jin, X.C. ; Ong, S.H. ; Jayasooriah</creatorcontrib><description>Fractal dimension is a useful parameter for characterizing textured images. However,different methods and even the same method with different scale ranges of computation give different values due to the finite sizes and gray level numbers of digitized images. This paper presents an intuitive, simple, model-free algorithm for estimating the fractal dimensions of textured images. The emphasis is on how scale range affects the value of the measured fractal dimension. The results of experiments using computer-generated image surfaces demonstrate the validity of the scale limit criterion.</description><identifier>ISBN: 9780780314450</identifier><identifier>ISBN: 078031445X</identifier><identifier>DOI: 10.1109/SICON.1993.515808</identifier><language>eng</language><publisher>IEEE</publisher><subject>Brownian motion ; Digital images ; Equations ; Fractals ; Geometry ; Image generation ; Interpolation ; Motion estimation ; Surface topography</subject><ispartof>Proceedings of IEEE Singapore International Conference on Networks/International Conference on Information Engineering '93, 1993, Vol.1, p.470-473 vol.1</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/515808$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,4035,4036,27904,54899</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/515808$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Jin, X.C.</creatorcontrib><creatorcontrib>Ong, S.H.</creatorcontrib><creatorcontrib>Jayasooriah</creatorcontrib><title>Scale limits in estimating fractal dimensions of image surfaces</title><title>Proceedings of IEEE Singapore International Conference on Networks/International Conference on Information Engineering '93</title><addtitle>SICON</addtitle><description>Fractal dimension is a useful parameter for characterizing textured images. However,different methods and even the same method with different scale ranges of computation give different values due to the finite sizes and gray level numbers of digitized images. This paper presents an intuitive, simple, model-free algorithm for estimating the fractal dimensions of textured images. The emphasis is on how scale range affects the value of the measured fractal dimension. The results of experiments using computer-generated image surfaces demonstrate the validity of the scale limit criterion.</description><subject>Brownian motion</subject><subject>Digital images</subject><subject>Equations</subject><subject>Fractals</subject><subject>Geometry</subject><subject>Image generation</subject><subject>Interpolation</subject><subject>Motion estimation</subject><subject>Surface topography</subject><isbn>9780780314450</isbn><isbn>078031445X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1993</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotT81qwzAYM4xBR5cH6E5-gWT-_BPbpzHCfgqlPXQ7F9v5XDySdMTZYW8_QycEOkgIiZANsAaA2cfjtjvsG7BWNAqUYeaGVFYbVihASsVWpMr5ixVIVWLsjjwdgxuQDmlMS6ZpopiXNLolTWcaZxcWN9A-jTjldJkyvURa3DPS_DNHFzDfk9vohozVv67J5-vLR_de7w5v2-55VyfQcqmVCRB961tuOAhgKLWMQlqvFdNceNQxGtaWyt643hjOg_W27310EFqlxJo8XHsTIp6-57Ji_j1dX4o_Gm5IMQ</recordid><startdate>1993</startdate><enddate>1993</enddate><creator>Jin, X.C.</creator><creator>Ong, S.H.</creator><creator>Jayasooriah</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1993</creationdate><title>Scale limits in estimating fractal dimensions of image surfaces</title><author>Jin, X.C. ; Ong, S.H. ; Jayasooriah</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i174t-58c1fb6b62821310e474f349b750723be7ff806facd8ad8822c9b9ddbfa1c6553</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Brownian motion</topic><topic>Digital images</topic><topic>Equations</topic><topic>Fractals</topic><topic>Geometry</topic><topic>Image generation</topic><topic>Interpolation</topic><topic>Motion estimation</topic><topic>Surface topography</topic><toplevel>online_resources</toplevel><creatorcontrib>Jin, X.C.</creatorcontrib><creatorcontrib>Ong, S.H.</creatorcontrib><creatorcontrib>Jayasooriah</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jin, X.C.</au><au>Ong, S.H.</au><au>Jayasooriah</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Scale limits in estimating fractal dimensions of image surfaces</atitle><btitle>Proceedings of IEEE Singapore International Conference on Networks/International Conference on Information Engineering '93</btitle><stitle>SICON</stitle><date>1993</date><risdate>1993</risdate><volume>1</volume><spage>470</spage><epage>473 vol.1</epage><pages>470-473 vol.1</pages><isbn>9780780314450</isbn><isbn>078031445X</isbn><abstract>Fractal dimension is a useful parameter for characterizing textured images. However,different methods and even the same method with different scale ranges of computation give different values due to the finite sizes and gray level numbers of digitized images. This paper presents an intuitive, simple, model-free algorithm for estimating the fractal dimensions of textured images. The emphasis is on how scale range affects the value of the measured fractal dimension. The results of experiments using computer-generated image surfaces demonstrate the validity of the scale limit criterion.</abstract><pub>IEEE</pub><doi>10.1109/SICON.1993.515808</doi></addata></record> |
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| identifier | ISBN: 9780780314450 |
| ispartof | Proceedings of IEEE Singapore International Conference on Networks/International Conference on Information Engineering '93, 1993, Vol.1, p.470-473 vol.1 |
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| language | eng |
| recordid | cdi_ieee_primary_515808 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Brownian motion Digital images Equations Fractals Geometry Image generation Interpolation Motion estimation Surface topography |
| title | Scale limits in estimating fractal dimensions of image surfaces |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T05%3A17%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Scale%20limits%20in%20estimating%20fractal%20dimensions%20of%20image%20surfaces&rft.btitle=Proceedings%20of%20IEEE%20Singapore%20International%20Conference%20on%20Networks/International%20Conference%20on%20Information%20Engineering%20'93&rft.au=Jin,%20X.C.&rft.date=1993&rft.volume=1&rft.spage=470&rft.epage=473%20vol.1&rft.pages=470-473%20vol.1&rft.isbn=9780780314450&rft.isbn_list=078031445X&rft_id=info:doi/10.1109/SICON.1993.515808&rft_dat=%3Cieee_6IE%3E515808%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=515808&rfr_iscdi=true |