Vector corrected on-wafer power measurements of frequency converting two-ports
In this paper a universal nonlinear measurement system is presented. The On-Wafer approach described here is commercially available and utilizes a modified vectorial network analyzer (Wiltron 360 B) and a special software package developed at the IMST. The system determines the complex quantities of...
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creator | Roth, B. Kother, D. Sporkmann, T. Lutke, W. Wolff, I. |
description | In this paper a universal nonlinear measurement system is presented. The On-Wafer approach described here is commercially available and utilizes a modified vectorial network analyzer (Wiltron 360 B) and a special software package developed at the IMST. The system determines the complex quantities of all power waves at all ports of the DUT. Since measurements are carried out at all interesting harmonics, the system is ideal for the complete electrical characterization of a frequency multiplier for instance. In contrast to other power and harmonic measurement approaches using VNAs, the technique proposed here does not need an additional microwave synthesizer for locking the receiver to the harmonics. The described system exhibits a power sweep range of more than 80 dB. |
doi_str_mv | 10.1109/MWSYM.1996.512170 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_512170</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>512170</ieee_id><sourcerecordid>512170</sourcerecordid><originalsourceid>FETCH-LOGICAL-i87t-86cf899c477c55bab6853d40866223ba263b80c807b6d4ef6768f174a46431513</originalsourceid><addsrcrecordid>eNotkMlOwzAYhC0WiVL6AHDKCzh4_W0fUcUmtXCgYjlVjvMbBdE4OClV355IZQ4z32XmMIRcclZyztz18u3lY1ly56DUXHDDjshEaAPUCA7H5JwZy6QUCuCETBhXjoLS72dk1vdfbJTSWmg3IU-vGIaUi5ByHgnrIrV05yPmoku70Tfo-23GDbZDX6RYxIw_W2zDfqy0v5iHpv0shl2iXcpDf0FOo__ucfafU7K6u13NH-ji-f5xfrOgjTUDtRCidS4oY4LWla_AalkrZgGEkJUXICvLgmWmglphBAM2cqO8AiW55nJKrg6zDSKuu9xsfN6vD0fIPyqDUH4</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Vector corrected on-wafer power measurements of frequency converting two-ports</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Roth, B. ; Kother, D. ; Sporkmann, T. ; Lutke, W. ; Wolff, I.</creator><creatorcontrib>Roth, B. ; Kother, D. ; Sporkmann, T. ; Lutke, W. ; Wolff, I.</creatorcontrib><description>In this paper a universal nonlinear measurement system is presented. The On-Wafer approach described here is commercially available and utilizes a modified vectorial network analyzer (Wiltron 360 B) and a special software package developed at the IMST. The system determines the complex quantities of all power waves at all ports of the DUT. Since measurements are carried out at all interesting harmonics, the system is ideal for the complete electrical characterization of a frequency multiplier for instance. In contrast to other power and harmonic measurement approaches using VNAs, the technique proposed here does not need an additional microwave synthesizer for locking the receiver to the harmonics. The described system exhibits a power sweep range of more than 80 dB.</description><identifier>ISSN: 0149-645X</identifier><identifier>ISBN: 0780332466</identifier><identifier>ISBN: 9780780332461</identifier><identifier>EISSN: 2576-7216</identifier><identifier>DOI: 10.1109/MWSYM.1996.512170</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuits ; Frequency conversion ; Frequency measurement ; Instruments ; Power measurement ; Power system harmonics ; Scattering parameters ; Spectral analysis ; Synthesizers ; Testing</subject><ispartof>1996 IEEE MTT-S International Microwave Symposium Digest, 1996, Vol.3, p.1281-1284 vol.3</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/512170$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,778,782,787,788,2054,4038,4039,27908,54903</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/512170$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Roth, B.</creatorcontrib><creatorcontrib>Kother, D.</creatorcontrib><creatorcontrib>Sporkmann, T.</creatorcontrib><creatorcontrib>Lutke, W.</creatorcontrib><creatorcontrib>Wolff, I.</creatorcontrib><title>Vector corrected on-wafer power measurements of frequency converting two-ports</title><title>1996 IEEE MTT-S International Microwave Symposium Digest</title><addtitle>MWSYM</addtitle><description>In this paper a universal nonlinear measurement system is presented. The On-Wafer approach described here is commercially available and utilizes a modified vectorial network analyzer (Wiltron 360 B) and a special software package developed at the IMST. The system determines the complex quantities of all power waves at all ports of the DUT. Since measurements are carried out at all interesting harmonics, the system is ideal for the complete electrical characterization of a frequency multiplier for instance. In contrast to other power and harmonic measurement approaches using VNAs, the technique proposed here does not need an additional microwave synthesizer for locking the receiver to the harmonics. The described system exhibits a power sweep range of more than 80 dB.</description><subject>Circuits</subject><subject>Frequency conversion</subject><subject>Frequency measurement</subject><subject>Instruments</subject><subject>Power measurement</subject><subject>Power system harmonics</subject><subject>Scattering parameters</subject><subject>Spectral analysis</subject><subject>Synthesizers</subject><subject>Testing</subject><issn>0149-645X</issn><issn>2576-7216</issn><isbn>0780332466</isbn><isbn>9780780332461</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1996</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkMlOwzAYhC0WiVL6AHDKCzh4_W0fUcUmtXCgYjlVjvMbBdE4OClV355IZQ4z32XmMIRcclZyztz18u3lY1ly56DUXHDDjshEaAPUCA7H5JwZy6QUCuCETBhXjoLS72dk1vdfbJTSWmg3IU-vGIaUi5ByHgnrIrV05yPmoku70Tfo-23GDbZDX6RYxIw_W2zDfqy0v5iHpv0shl2iXcpDf0FOo__ucfafU7K6u13NH-ji-f5xfrOgjTUDtRCidS4oY4LWla_AalkrZgGEkJUXICvLgmWmglphBAM2cqO8AiW55nJKrg6zDSKuu9xsfN6vD0fIPyqDUH4</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>Roth, B.</creator><creator>Kother, D.</creator><creator>Sporkmann, T.</creator><creator>Lutke, W.</creator><creator>Wolff, I.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1996</creationdate><title>Vector corrected on-wafer power measurements of frequency converting two-ports</title><author>Roth, B. ; Kother, D. ; Sporkmann, T. ; Lutke, W. ; Wolff, I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i87t-86cf899c477c55bab6853d40866223ba263b80c807b6d4ef6768f174a46431513</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Circuits</topic><topic>Frequency conversion</topic><topic>Frequency measurement</topic><topic>Instruments</topic><topic>Power measurement</topic><topic>Power system harmonics</topic><topic>Scattering parameters</topic><topic>Spectral analysis</topic><topic>Synthesizers</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Roth, B.</creatorcontrib><creatorcontrib>Kother, D.</creatorcontrib><creatorcontrib>Sporkmann, T.</creatorcontrib><creatorcontrib>Lutke, W.</creatorcontrib><creatorcontrib>Wolff, I.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Roth, B.</au><au>Kother, D.</au><au>Sporkmann, T.</au><au>Lutke, W.</au><au>Wolff, I.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Vector corrected on-wafer power measurements of frequency converting two-ports</atitle><btitle>1996 IEEE MTT-S International Microwave Symposium Digest</btitle><stitle>MWSYM</stitle><date>1996</date><risdate>1996</risdate><volume>3</volume><spage>1281</spage><epage>1284 vol.3</epage><pages>1281-1284 vol.3</pages><issn>0149-645X</issn><eissn>2576-7216</eissn><isbn>0780332466</isbn><isbn>9780780332461</isbn><abstract>In this paper a universal nonlinear measurement system is presented. The On-Wafer approach described here is commercially available and utilizes a modified vectorial network analyzer (Wiltron 360 B) and a special software package developed at the IMST. The system determines the complex quantities of all power waves at all ports of the DUT. Since measurements are carried out at all interesting harmonics, the system is ideal for the complete electrical characterization of a frequency multiplier for instance. In contrast to other power and harmonic measurement approaches using VNAs, the technique proposed here does not need an additional microwave synthesizer for locking the receiver to the harmonics. The described system exhibits a power sweep range of more than 80 dB.</abstract><pub>IEEE</pub><doi>10.1109/MWSYM.1996.512170</doi></addata></record> |
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identifier | ISSN: 0149-645X |
ispartof | 1996 IEEE MTT-S International Microwave Symposium Digest, 1996, Vol.3, p.1281-1284 vol.3 |
issn | 0149-645X 2576-7216 |
language | eng |
recordid | cdi_ieee_primary_512170 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Circuits Frequency conversion Frequency measurement Instruments Power measurement Power system harmonics Scattering parameters Spectral analysis Synthesizers Testing |
title | Vector corrected on-wafer power measurements of frequency converting two-ports |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T04%3A27%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Vector%20corrected%20on-wafer%20power%20measurements%20of%20frequency%20converting%20two-ports&rft.btitle=1996%20IEEE%20MTT-S%20International%20Microwave%20Symposium%20Digest&rft.au=Roth,%20B.&rft.date=1996&rft.volume=3&rft.spage=1281&rft.epage=1284%20vol.3&rft.pages=1281-1284%20vol.3&rft.issn=0149-645X&rft.eissn=2576-7216&rft.isbn=0780332466&rft.isbn_list=9780780332461&rft_id=info:doi/10.1109/MWSYM.1996.512170&rft_dat=%3Cieee_6IE%3E512170%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=512170&rfr_iscdi=true |