The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost

This paper presents two new conflict-driven techniques for improving transition fault coverage using multiple scan chains. These techniques are based on a novel test application scheme, in order to break the functional dependency of broadside testing. The two new techniques analyze the ATPG conflict...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Zhen Chen, Dong Xiang, Boxue Yin
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Automatic test pattern generation broadside Circuit faults Circuit testing conflit-driven Costs Educational technology enhanced scan fault coverage Fault detection Flip-flops Paper technology Software testing System testing test cost
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