Automated Debug of Speed Path Failures Using Functional Tests

Debug of at-speed failures using functional tests is a key challenge as part of frequency pushes during post-silicon debug to improve performance of high performance designs, especially microprocessors. In this paper, we present a technique to automate the debug of speed path failures using failing...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	McLaughlin, R., Venkataraman, S., Lim, C.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Algorithm design and analysis Automatic testing Circuit simulation Computer bugs Data mining design for debug Frequency functional tests Microprocessors Silicon Silicon debug speed-path System testing Timing
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