Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs

We present the spaceflight Single Event Effect (SEE) data for the emerging commercial technologies utilized in multiple NASA spacecraft and experiments. Analyses of device performance as well as design implications of the flight results are discussed.

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Hauptverfasser: Seidleck, C.M., LaBel, K.A., Moran, A.K., Gates, M.M., Barth, J.M., Stassinopoulos, E.G., Gruner, T.D.
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container_issue
container_start_page 581
container_title
container_volume
creator Seidleck, C.M.
LaBel, K.A.
Moran, A.K.
Gates, M.M.
Barth, J.M.
Stassinopoulos, E.G.
Gruner, T.D.
description We present the spaceflight Single Event Effect (SEE) data for the emerging commercial technologies utilized in multiple NASA spacecraft and experiments. Analyses of device performance as well as design implications of the flight results are discussed.
doi_str_mv 10.1109/RADECS.1995.509840
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_509840</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>509840</ieee_id><sourcerecordid>509840</sourcerecordid><originalsourceid>FETCH-ieee_primary_5098403</originalsourceid><addsrcrecordid>eNp9j8FKxEAQRAdEUDQ_sKf-AWOPcXUHT2Fd8eTBeF-apCe2TCZDehT37I87oAdPQkEd6lFFGbOyWFuL7vK5vd9tu9o6t67X6DbXeGQqd7vBoqZB19gTU6m-IWLhb5y9OjVfncQxMPAHxwzsPfcZfJDxNcNAmYAihYOKwuxheg9ZUqGf2q4FTdRzv5DPBRqAPxMvMpUavQOZUpCessxRIc9_WQ5lYilhgIFVxqjn5thTUK5-_cysHnYv28cLYeZ9KqW0HPY_j5p_w28pr1LB</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Seidleck, C.M. ; LaBel, K.A. ; Moran, A.K. ; Gates, M.M. ; Barth, J.M. ; Stassinopoulos, E.G. ; Gruner, T.D.</creator><creatorcontrib>Seidleck, C.M. ; LaBel, K.A. ; Moran, A.K. ; Gates, M.M. ; Barth, J.M. ; Stassinopoulos, E.G. ; Gruner, T.D.</creatorcontrib><description>We present the spaceflight Single Event Effect (SEE) data for the emerging commercial technologies utilized in multiple NASA spacecraft and experiments. Analyses of device performance as well as design implications of the flight results are discussed.</description><identifier>ISBN: 9780780330931</identifier><identifier>ISBN: 0780330935</identifier><identifier>DOI: 10.1109/RADECS.1995.509840</identifier><language>eng</language><publisher>IEEE</publisher><subject>Aerospace electronics ; CMOS technology ; Data analysis ; Integrated circuit technology ; Microprocessors ; NASA ; Optical fibers ; Random access memory ; Space technology ; Space vehicles</subject><ispartof>Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems, 1995, p.581-588</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/509840$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/509840$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Seidleck, C.M.</creatorcontrib><creatorcontrib>LaBel, K.A.</creatorcontrib><creatorcontrib>Moran, A.K.</creatorcontrib><creatorcontrib>Gates, M.M.</creatorcontrib><creatorcontrib>Barth, J.M.</creatorcontrib><creatorcontrib>Stassinopoulos, E.G.</creatorcontrib><creatorcontrib>Gruner, T.D.</creatorcontrib><title>Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs</title><title>Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems</title><addtitle>RADECS</addtitle><description>We present the spaceflight Single Event Effect (SEE) data for the emerging commercial technologies utilized in multiple NASA spacecraft and experiments. Analyses of device performance as well as design implications of the flight results are discussed.</description><subject>Aerospace electronics</subject><subject>CMOS technology</subject><subject>Data analysis</subject><subject>Integrated circuit technology</subject><subject>Microprocessors</subject><subject>NASA</subject><subject>Optical fibers</subject><subject>Random access memory</subject><subject>Space technology</subject><subject>Space vehicles</subject><isbn>9780780330931</isbn><isbn>0780330935</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1995</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNp9j8FKxEAQRAdEUDQ_sKf-AWOPcXUHT2Fd8eTBeF-apCe2TCZDehT37I87oAdPQkEd6lFFGbOyWFuL7vK5vd9tu9o6t67X6DbXeGQqd7vBoqZB19gTU6m-IWLhb5y9OjVfncQxMPAHxwzsPfcZfJDxNcNAmYAihYOKwuxheg9ZUqGf2q4FTdRzv5DPBRqAPxMvMpUavQOZUpCessxRIc9_WQ5lYilhgIFVxqjn5thTUK5-_cysHnYv28cLYeZ9KqW0HPY_j5p_w28pr1LB</recordid><startdate>1995</startdate><enddate>1995</enddate><creator>Seidleck, C.M.</creator><creator>LaBel, K.A.</creator><creator>Moran, A.K.</creator><creator>Gates, M.M.</creator><creator>Barth, J.M.</creator><creator>Stassinopoulos, E.G.</creator><creator>Gruner, T.D.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1995</creationdate><title>Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs</title><author>Seidleck, C.M. ; LaBel, K.A. ; Moran, A.K. ; Gates, M.M. ; Barth, J.M. ; Stassinopoulos, E.G. ; Gruner, T.D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_5098403</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Aerospace electronics</topic><topic>CMOS technology</topic><topic>Data analysis</topic><topic>Integrated circuit technology</topic><topic>Microprocessors</topic><topic>NASA</topic><topic>Optical fibers</topic><topic>Random access memory</topic><topic>Space technology</topic><topic>Space vehicles</topic><toplevel>online_resources</toplevel><creatorcontrib>Seidleck, C.M.</creatorcontrib><creatorcontrib>LaBel, K.A.</creatorcontrib><creatorcontrib>Moran, A.K.</creatorcontrib><creatorcontrib>Gates, M.M.</creatorcontrib><creatorcontrib>Barth, J.M.</creatorcontrib><creatorcontrib>Stassinopoulos, E.G.</creatorcontrib><creatorcontrib>Gruner, T.D.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Seidleck, C.M.</au><au>LaBel, K.A.</au><au>Moran, A.K.</au><au>Gates, M.M.</au><au>Barth, J.M.</au><au>Stassinopoulos, E.G.</au><au>Gruner, T.D.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs</atitle><btitle>Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems</btitle><stitle>RADECS</stitle><date>1995</date><risdate>1995</risdate><spage>581</spage><epage>588</epage><pages>581-588</pages><isbn>9780780330931</isbn><isbn>0780330935</isbn><abstract>We present the spaceflight Single Event Effect (SEE) data for the emerging commercial technologies utilized in multiple NASA spacecraft and experiments. Analyses of device performance as well as design implications of the flight results are discussed.</abstract><pub>IEEE</pub><doi>10.1109/RADECS.1995.509840</doi></addata></record>
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identifier ISBN: 9780780330931
ispartof Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems, 1995, p.581-588
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language eng
recordid cdi_ieee_primary_509840
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Aerospace electronics
CMOS technology
Data analysis
Integrated circuit technology
Microprocessors
NASA
Optical fibers
Random access memory
Space technology
Space vehicles
title Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T08%3A25%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Single%20event%20effect%20flight%20data%20analysis%20of%20multiple%20NASA%20spacecraft%20and%20experiments;%20implications%20to%20spacecraft%20electrical%20designs&rft.btitle=Proceedings%20of%20the%20Third%20European%20Conference%20on%20Radiation%20and%20its%20Effects%20on%20Components%20and%20Systems&rft.au=Seidleck,%20C.M.&rft.date=1995&rft.spage=581&rft.epage=588&rft.pages=581-588&rft.isbn=9780780330931&rft.isbn_list=0780330935&rft_id=info:doi/10.1109/RADECS.1995.509840&rft_dat=%3Cieee_6IE%3E509840%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=509840&rfr_iscdi=true