A highly resilient routing algorithm for fault-tolerant NoCs

Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will soon make long-term product reliability extremely difficult in complex modern systems such as systems on a chip (SoC) and c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Fick, D., DeOrio, A., Chen, G., Bertacco, V., Sylvester, D., Blaauw, D.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 26
container_issue
container_start_page 21
container_title
container_volume
creator Fick, D.
DeOrio, A.
Chen, G.
Bertacco, V.
Sylvester, D.
Blaauw, D.
description Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will soon make long-term product reliability extremely difficult in complex modern systems such as systems on a chip (SoC) and chip multiprocessor (CMP) designs, where even a single device failure can cause fatal system errors. Resiliency to device failure will be a necessary condition at future technology nodes. In this work, we present a network-on-chip (NoC) routing algorithm to boost the robustness in interconnect networks, by reconfiguring them to avoid faulty components while maintaining connectivity and correct operation. This distributed algorithm can be implemented in hardware with less than 300 gates per network router. Experimental results over a broad range of 2D-mesh and 2D-torus networks demonstrate 99.99% reliability on average when 10% of the interconnect links have failed.
doi_str_mv 10.1109/DATE.2009.5090627
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5090627</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5090627</ieee_id><sourcerecordid>5090627</sourcerecordid><originalsourceid>FETCH-LOGICAL-c223t-3200e5c54769e8fcce785fe4c1e320f86a00b0fe2bb6ee5870cdcfbe604cccda3</originalsourceid><addsrcrecordid>eNotkMtOwzAURM1LopR-AGLjH3C4tuPElthEoTykCjZlXTnudWKUNshJF_17DHQzszij0WgIueOQcQ7m4alaLzMBYDIFBgpRnpGFKbU0moMGrtQ5mSXVLKX5xR_juchzmVxf_jIJjCvDr8nNOH4BgJLCzMhjRbvQdv2RRhxDH3A_0TgcprBvqe3bIYap21E_ROrtoZ_YNPQYbQq9D_V4S6687UdcnHxOPp-X6_qVrT5e3upqxZwQcmIy7UblVF4WBrV3DkutPOaOY0JeFxagAY-iaQpEpUtwW-cbLCB3zm2tnJP7_96AiJvvGHY2HjenI-QPzBhN2A</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A highly resilient routing algorithm for fault-tolerant NoCs</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Fick, D. ; DeOrio, A. ; Chen, G. ; Bertacco, V. ; Sylvester, D. ; Blaauw, D.</creator><creatorcontrib>Fick, D. ; DeOrio, A. ; Chen, G. ; Bertacco, V. ; Sylvester, D. ; Blaauw, D.</creatorcontrib><description>Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will soon make long-term product reliability extremely difficult in complex modern systems such as systems on a chip (SoC) and chip multiprocessor (CMP) designs, where even a single device failure can cause fatal system errors. Resiliency to device failure will be a necessary condition at future technology nodes. In this work, we present a network-on-chip (NoC) routing algorithm to boost the robustness in interconnect networks, by reconfiguring them to avoid faulty components while maintaining connectivity and correct operation. This distributed algorithm can be implemented in hardware with less than 300 gates per network router. Experimental results over a broad range of 2D-mesh and 2D-torus networks demonstrate 99.99% reliability on average when 10% of the interconnect links have failed.</description><identifier>ISSN: 1530-1591</identifier><identifier>ISBN: 9781424437818</identifier><identifier>ISBN: 1424437814</identifier><identifier>EISSN: 1558-1101</identifier><identifier>EISBN: 9783981080155</identifier><identifier>EISBN: 3981080157</identifier><identifier>DOI: 10.1109/DATE.2009.5090627</identifier><language>eng</language><publisher>IEEE</publisher><subject>Computer network reliability ; Fault tolerance ; Fault tolerant systems ; Hardware ; Joining processes ; Maintenance ; Monte Carlo methods ; Network-on-a-chip ; Routing ; System-on-a-chip</subject><ispartof>2009 Design, Automation &amp; Test in Europe Conference &amp; Exhibition, 2009, p.21-26</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c223t-3200e5c54769e8fcce785fe4c1e320f86a00b0fe2bb6ee5870cdcfbe604cccda3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5090627$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5090627$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Fick, D.</creatorcontrib><creatorcontrib>DeOrio, A.</creatorcontrib><creatorcontrib>Chen, G.</creatorcontrib><creatorcontrib>Bertacco, V.</creatorcontrib><creatorcontrib>Sylvester, D.</creatorcontrib><creatorcontrib>Blaauw, D.</creatorcontrib><title>A highly resilient routing algorithm for fault-tolerant NoCs</title><title>2009 Design, Automation &amp; Test in Europe Conference &amp; Exhibition</title><addtitle>DATE</addtitle><description>Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will soon make long-term product reliability extremely difficult in complex modern systems such as systems on a chip (SoC) and chip multiprocessor (CMP) designs, where even a single device failure can cause fatal system errors. Resiliency to device failure will be a necessary condition at future technology nodes. In this work, we present a network-on-chip (NoC) routing algorithm to boost the robustness in interconnect networks, by reconfiguring them to avoid faulty components while maintaining connectivity and correct operation. This distributed algorithm can be implemented in hardware with less than 300 gates per network router. Experimental results over a broad range of 2D-mesh and 2D-torus networks demonstrate 99.99% reliability on average when 10% of the interconnect links have failed.</description><subject>Computer network reliability</subject><subject>Fault tolerance</subject><subject>Fault tolerant systems</subject><subject>Hardware</subject><subject>Joining processes</subject><subject>Maintenance</subject><subject>Monte Carlo methods</subject><subject>Network-on-a-chip</subject><subject>Routing</subject><subject>System-on-a-chip</subject><issn>1530-1591</issn><issn>1558-1101</issn><isbn>9781424437818</isbn><isbn>1424437814</isbn><isbn>9783981080155</isbn><isbn>3981080157</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkMtOwzAURM1LopR-AGLjH3C4tuPElthEoTykCjZlXTnudWKUNshJF_17DHQzszij0WgIueOQcQ7m4alaLzMBYDIFBgpRnpGFKbU0moMGrtQ5mSXVLKX5xR_juchzmVxf_jIJjCvDr8nNOH4BgJLCzMhjRbvQdv2RRhxDH3A_0TgcprBvqe3bIYap21E_ROrtoZ_YNPQYbQq9D_V4S6687UdcnHxOPp-X6_qVrT5e3upqxZwQcmIy7UblVF4WBrV3DkutPOaOY0JeFxagAY-iaQpEpUtwW-cbLCB3zm2tnJP7_96AiJvvGHY2HjenI-QPzBhN2A</recordid><startdate>200904</startdate><enddate>200904</enddate><creator>Fick, D.</creator><creator>DeOrio, A.</creator><creator>Chen, G.</creator><creator>Bertacco, V.</creator><creator>Sylvester, D.</creator><creator>Blaauw, D.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200904</creationdate><title>A highly resilient routing algorithm for fault-tolerant NoCs</title><author>Fick, D. ; DeOrio, A. ; Chen, G. ; Bertacco, V. ; Sylvester, D. ; Blaauw, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c223t-3200e5c54769e8fcce785fe4c1e320f86a00b0fe2bb6ee5870cdcfbe604cccda3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Computer network reliability</topic><topic>Fault tolerance</topic><topic>Fault tolerant systems</topic><topic>Hardware</topic><topic>Joining processes</topic><topic>Maintenance</topic><topic>Monte Carlo methods</topic><topic>Network-on-a-chip</topic><topic>Routing</topic><topic>System-on-a-chip</topic><toplevel>online_resources</toplevel><creatorcontrib>Fick, D.</creatorcontrib><creatorcontrib>DeOrio, A.</creatorcontrib><creatorcontrib>Chen, G.</creatorcontrib><creatorcontrib>Bertacco, V.</creatorcontrib><creatorcontrib>Sylvester, D.</creatorcontrib><creatorcontrib>Blaauw, D.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fick, D.</au><au>DeOrio, A.</au><au>Chen, G.</au><au>Bertacco, V.</au><au>Sylvester, D.</au><au>Blaauw, D.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A highly resilient routing algorithm for fault-tolerant NoCs</atitle><btitle>2009 Design, Automation &amp; Test in Europe Conference &amp; Exhibition</btitle><stitle>DATE</stitle><date>2009-04</date><risdate>2009</risdate><spage>21</spage><epage>26</epage><pages>21-26</pages><issn>1530-1591</issn><eissn>1558-1101</eissn><isbn>9781424437818</isbn><isbn>1424437814</isbn><eisbn>9783981080155</eisbn><eisbn>3981080157</eisbn><abstract>Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will soon make long-term product reliability extremely difficult in complex modern systems such as systems on a chip (SoC) and chip multiprocessor (CMP) designs, where even a single device failure can cause fatal system errors. Resiliency to device failure will be a necessary condition at future technology nodes. In this work, we present a network-on-chip (NoC) routing algorithm to boost the robustness in interconnect networks, by reconfiguring them to avoid faulty components while maintaining connectivity and correct operation. This distributed algorithm can be implemented in hardware with less than 300 gates per network router. Experimental results over a broad range of 2D-mesh and 2D-torus networks demonstrate 99.99% reliability on average when 10% of the interconnect links have failed.</abstract><pub>IEEE</pub><doi>10.1109/DATE.2009.5090627</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1530-1591
ispartof 2009 Design, Automation & Test in Europe Conference & Exhibition, 2009, p.21-26
issn 1530-1591
1558-1101
language eng
recordid cdi_ieee_primary_5090627
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Computer network reliability
Fault tolerance
Fault tolerant systems
Hardware
Joining processes
Maintenance
Monte Carlo methods
Network-on-a-chip
Routing
System-on-a-chip
title A highly resilient routing algorithm for fault-tolerant NoCs
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T03%3A17%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20highly%20resilient%20routing%20algorithm%20for%20fault-tolerant%20NoCs&rft.btitle=2009%20Design,%20Automation%20&%20Test%20in%20Europe%20Conference%20&%20Exhibition&rft.au=Fick,%20D.&rft.date=2009-04&rft.spage=21&rft.epage=26&rft.pages=21-26&rft.issn=1530-1591&rft.eissn=1558-1101&rft.isbn=9781424437818&rft.isbn_list=1424437814&rft_id=info:doi/10.1109/DATE.2009.5090627&rft_dat=%3Cieee_6IE%3E5090627%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9783981080155&rft.eisbn_list=3981080157&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5090627&rfr_iscdi=true