Both NOR and NAND Embedded Hybrid Flash for S-SIM Application Using 90 nm Process Technology

We have firstly demonstrated a hybrid flash including both NOR and NAND cell in a single chip using 90 nm logic technology for S-SIM (Super-Subscriber Identity Module) application. The memory sizes are 16 MB NAND and 768 kB NOR flash, respectively. The flash memory cells exhibited over 10 k-cycle en...

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Hauptverfasser:	Jeong-Uk Han, Yong Kyu Lee, Chang Min Jeon, Jido Ryu, Eun-Mi Hong, Seungjin Yang, Youngho Kim, Hyucksoo Yang, Hyunkhe Yoo, Jaemin Yu, Hoonjin Bang, Seung-Won Lee, ByeongHoon Lee, Daesop Lee, Eunseung Jung, Chilhee Chung
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Application specific integrated circuits CMOS technology Electronic equipment testing Hybrid integrated circuits Integrated circuit testing Large scale integration Mobile handsets Smart cards System testing Voltage
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