A new global finite element analysis of microwave circuits including lumped elements
A new fullwave global analysis of complex inhomogeneous structures including passive or active, linear or non linear lumped elements is presented. Only one electromagnetic simulation of the distributed part, by a 3D finite element method using edge elements, is needed corresponding to the insertion...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 358 vol.1 |
|---|---|
| container_issue | |
| container_start_page | 355 |
| container_title | |
| container_volume | 1 |
| creator | Guillouard, K. Wong, M.F. Hanna, V.F. Citerne, J. |
| description | A new fullwave global analysis of complex inhomogeneous structures including passive or active, linear or non linear lumped elements is presented. Only one electromagnetic simulation of the distributed part, by a 3D finite element method using edge elements, is needed corresponding to the insertion of several lumped elements placed at the same position. Results for a resistor, a diode inserted in a microstrip circuit as well as a Gunn diode amplifier are presented and comparisons with measurements are given for an active structure. |
| doi_str_mv | 10.1109/MWSYM.1996.508529 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_508529</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>508529</ieee_id><sourcerecordid>508529</sourcerecordid><originalsourceid>FETCH-LOGICAL-i172t-f4bf5e3ae78a13b8228226de5e23bca406d25069c6a9b6a92d2540b9bb6ccdef3</originalsourceid><addsrcrecordid>eNo1UEtPwzAYi3hIlLEfAKf8gZa82xyniZe0iQNDwGlK0i9TUNpOTcu0f0-lgWXL8sE-GKFbSgpKib5ff7x9rQuqtSokqSTTZyhjslR5yag6R9ekrAjnTCh1gTJChc6VkJ9XaJ7SN5kgpGRSZ2izwC0c8C521kTsQxsGwBChgXbApjXxmELCncdNcH13MD-AXejdGIaEQ-viWId2h-PY7KH-76UbdOlNTDD_8xl6f3zYLJ_z1evTy3KxygMt2ZB7Yb0EbqCsDOW2YmyiqkEC49YZQVTNJFHaKaPtJDZFQay2VjlXg-czdHfaDQCw3fehMf1xe_qD_wKaX1Qj</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A new global finite element analysis of microwave circuits including lumped elements</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Guillouard, K. ; Wong, M.F. ; Hanna, V.F. ; Citerne, J.</creator><creatorcontrib>Guillouard, K. ; Wong, M.F. ; Hanna, V.F. ; Citerne, J.</creatorcontrib><description>A new fullwave global analysis of complex inhomogeneous structures including passive or active, linear or non linear lumped elements is presented. Only one electromagnetic simulation of the distributed part, by a 3D finite element method using edge elements, is needed corresponding to the insertion of several lumped elements placed at the same position. Results for a resistor, a diode inserted in a microstrip circuit as well as a Gunn diode amplifier are presented and comparisons with measurements are given for an active structure.</description><identifier>ISSN: 0149-645X</identifier><identifier>ISBN: 0780332466</identifier><identifier>ISBN: 9780780332461</identifier><identifier>EISSN: 2576-7216</identifier><identifier>DOI: 10.1109/MWSYM.1996.508529</identifier><language>eng</language><publisher>IEEE</publisher><subject>Admittance ; Capacitors ; Circuit analysis ; Circuit simulation ; Diodes ; Finite element methods ; Maxwell equations ; Microwave circuits ; Resistors ; Transmission line matrix methods</subject><ispartof>1996 IEEE MTT-S International Microwave Symposium Digest, 1996, Vol.1, p.355-358 vol.1</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/508529$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/508529$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Guillouard, K.</creatorcontrib><creatorcontrib>Wong, M.F.</creatorcontrib><creatorcontrib>Hanna, V.F.</creatorcontrib><creatorcontrib>Citerne, J.</creatorcontrib><title>A new global finite element analysis of microwave circuits including lumped elements</title><title>1996 IEEE MTT-S International Microwave Symposium Digest</title><addtitle>MWSYM</addtitle><description>A new fullwave global analysis of complex inhomogeneous structures including passive or active, linear or non linear lumped elements is presented. Only one electromagnetic simulation of the distributed part, by a 3D finite element method using edge elements, is needed corresponding to the insertion of several lumped elements placed at the same position. Results for a resistor, a diode inserted in a microstrip circuit as well as a Gunn diode amplifier are presented and comparisons with measurements are given for an active structure.</description><subject>Admittance</subject><subject>Capacitors</subject><subject>Circuit analysis</subject><subject>Circuit simulation</subject><subject>Diodes</subject><subject>Finite element methods</subject><subject>Maxwell equations</subject><subject>Microwave circuits</subject><subject>Resistors</subject><subject>Transmission line matrix methods</subject><issn>0149-645X</issn><issn>2576-7216</issn><isbn>0780332466</isbn><isbn>9780780332461</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1996</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1UEtPwzAYi3hIlLEfAKf8gZa82xyniZe0iQNDwGlK0i9TUNpOTcu0f0-lgWXL8sE-GKFbSgpKib5ff7x9rQuqtSokqSTTZyhjslR5yag6R9ekrAjnTCh1gTJChc6VkJ9XaJ7SN5kgpGRSZ2izwC0c8C521kTsQxsGwBChgXbApjXxmELCncdNcH13MD-AXejdGIaEQ-viWId2h-PY7KH-76UbdOlNTDD_8xl6f3zYLJ_z1evTy3KxygMt2ZB7Yb0EbqCsDOW2YmyiqkEC49YZQVTNJFHaKaPtJDZFQay2VjlXg-czdHfaDQCw3fehMf1xe_qD_wKaX1Qj</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>Guillouard, K.</creator><creator>Wong, M.F.</creator><creator>Hanna, V.F.</creator><creator>Citerne, J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1996</creationdate><title>A new global finite element analysis of microwave circuits including lumped elements</title><author>Guillouard, K. ; Wong, M.F. ; Hanna, V.F. ; Citerne, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-f4bf5e3ae78a13b8228226de5e23bca406d25069c6a9b6a92d2540b9bb6ccdef3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Admittance</topic><topic>Capacitors</topic><topic>Circuit analysis</topic><topic>Circuit simulation</topic><topic>Diodes</topic><topic>Finite element methods</topic><topic>Maxwell equations</topic><topic>Microwave circuits</topic><topic>Resistors</topic><topic>Transmission line matrix methods</topic><toplevel>online_resources</toplevel><creatorcontrib>Guillouard, K.</creatorcontrib><creatorcontrib>Wong, M.F.</creatorcontrib><creatorcontrib>Hanna, V.F.</creatorcontrib><creatorcontrib>Citerne, J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Guillouard, K.</au><au>Wong, M.F.</au><au>Hanna, V.F.</au><au>Citerne, J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A new global finite element analysis of microwave circuits including lumped elements</atitle><btitle>1996 IEEE MTT-S International Microwave Symposium Digest</btitle><stitle>MWSYM</stitle><date>1996</date><risdate>1996</risdate><volume>1</volume><spage>355</spage><epage>358 vol.1</epage><pages>355-358 vol.1</pages><issn>0149-645X</issn><eissn>2576-7216</eissn><isbn>0780332466</isbn><isbn>9780780332461</isbn><abstract>A new fullwave global analysis of complex inhomogeneous structures including passive or active, linear or non linear lumped elements is presented. Only one electromagnetic simulation of the distributed part, by a 3D finite element method using edge elements, is needed corresponding to the insertion of several lumped elements placed at the same position. Results for a resistor, a diode inserted in a microstrip circuit as well as a Gunn diode amplifier are presented and comparisons with measurements are given for an active structure.</abstract><pub>IEEE</pub><doi>10.1109/MWSYM.1996.508529</doi></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0149-645X |
| ispartof | 1996 IEEE MTT-S International Microwave Symposium Digest, 1996, Vol.1, p.355-358 vol.1 |
| issn | 0149-645X 2576-7216 |
| language | eng |
| recordid | cdi_ieee_primary_508529 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Admittance Capacitors Circuit analysis Circuit simulation Diodes Finite element methods Maxwell equations Microwave circuits Resistors Transmission line matrix methods |
| title | A new global finite element analysis of microwave circuits including lumped elements |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T23%3A31%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20new%20global%20finite%20element%20analysis%20of%20microwave%20circuits%20including%20lumped%20elements&rft.btitle=1996%20IEEE%20MTT-S%20International%20Microwave%20Symposium%20Digest&rft.au=Guillouard,%20K.&rft.date=1996&rft.volume=1&rft.spage=355&rft.epage=358%20vol.1&rft.pages=355-358%20vol.1&rft.issn=0149-645X&rft.eissn=2576-7216&rft.isbn=0780332466&rft.isbn_list=9780780332461&rft_id=info:doi/10.1109/MWSYM.1996.508529&rft_dat=%3Cieee_6IE%3E508529%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=508529&rfr_iscdi=true |