Method of Testability Index Determination Based on Generalized Stochastic Petri Net
As an important performance of equipment system, testability is always omitted in the traditional availability analysis. Testability design is an effective way to realize the fault detection and isolation. Determining testability index is the chief step of testability design. It needs to consider th...
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creator | Su Yongding Qiu Jing Liu Guanjun Xu Yuguo Qian Yanling |
description | As an important performance of equipment system, testability is always omitted in the traditional availability analysis. Testability design is an effective way to realize the fault detection and isolation. Determining testability index is the chief step of testability design. It needs to consider the influence factors of testability such as the requirement of system availability, reliability, maintainability, supportability and so on. A testability requirement analysis model is built based on generalized stochastic Petri nets (GSPN), which is used to determinate testability index. The reachable states are analyzed based on the model and the Markov chain is constructed. The state transition matrix is created and the system steady state probability is gained. The relationship between the steady state availability and testability parameters was revealed and the testability parameters are reasoned. The validation results of an example show that the method is an effective method to determine testability index such as fault detection rate and fault isolation rate. |
doi_str_mv | 10.1109/CAS-ICTD.2009.4960839 |
format | Conference Proceeding |
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Testability design is an effective way to realize the fault detection and isolation. Determining testability index is the chief step of testability design. It needs to consider the influence factors of testability such as the requirement of system availability, reliability, maintainability, supportability and so on. A testability requirement analysis model is built based on generalized stochastic Petri nets (GSPN), which is used to determinate testability index. The reachable states are analyzed based on the model and the Markov chain is constructed. The state transition matrix is created and the system steady state probability is gained. The relationship between the steady state availability and testability parameters was revealed and the testability parameters are reasoned. The validation results of an example show that the method is an effective method to determine testability index such as fault detection rate and fault isolation rate.</description><identifier>ISSN: 2324-8475</identifier><identifier>ISBN: 1424425875</identifier><identifier>ISBN: 9781424425877</identifier><identifier>DOI: 10.1109/CAS-ICTD.2009.4960839</identifier><identifier>LCCN: 2008904859</identifier><language>eng</language><publisher>IEEE</publisher><subject>Availability ; Fault detection ; Life testing ; Maintenance ; Petri nets ; Steady-state ; Stochastic processes ; Stochastic systems ; System performance ; System testing</subject><ispartof>2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis, 2009, p.1-4</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4960839$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4960839$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Su Yongding</creatorcontrib><creatorcontrib>Qiu Jing</creatorcontrib><creatorcontrib>Liu Guanjun</creatorcontrib><creatorcontrib>Xu Yuguo</creatorcontrib><creatorcontrib>Qian Yanling</creatorcontrib><title>Method of Testability Index Determination Based on Generalized Stochastic Petri Net</title><title>2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis</title><addtitle>CAS-ICTD</addtitle><description>As an important performance of equipment system, testability is always omitted in the traditional availability analysis. 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The validation results of an example show that the method is an effective method to determine testability index such as fault detection rate and fault isolation rate.</description><subject>Availability</subject><subject>Fault detection</subject><subject>Life testing</subject><subject>Maintenance</subject><subject>Petri nets</subject><subject>Steady-state</subject><subject>Stochastic processes</subject><subject>Stochastic systems</subject><subject>System performance</subject><subject>System testing</subject><issn>2324-8475</issn><isbn>1424425875</isbn><isbn>9781424425877</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkNtqwkAURQdaoWr9glKYH4g9c8vMebSx2oC9gHmXSXKCUzQpyTzUfn0D9WmzYbFgb8YeBSyFAHzKVvskz4r1UgLgUmMKTuENmwkttZbGWXPLplJJnThtzYTNRs4haGfwji2G4QsAlARlwEzZ_o3isat51_CChujLcArxwvO2ph--pkj9ObQ-hq7lz36gEWz5llrq_Sn8jnUfu-rohxgq_kmxD_yd4j2bNP400OKac1ZsXorsNdl9bPNstUsCQkwqErY2JXoFvkmRMPWIZE2jfUPOCmeELQFNamtZKyxlnZYSQQjpx51Vqebs4V8biOjw3Yez7y-H6x_qD8JBUwY</recordid><startdate>200904</startdate><enddate>200904</enddate><creator>Su Yongding</creator><creator>Qiu Jing</creator><creator>Liu Guanjun</creator><creator>Xu Yuguo</creator><creator>Qian Yanling</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200904</creationdate><title>Method of Testability Index Determination Based on Generalized Stochastic Petri Net</title><author>Su Yongding ; Qiu Jing ; Liu Guanjun ; Xu Yuguo ; Qian Yanling</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-ce17d5b9a30af69e96a99e75f4afe8718517b09567d2d39b2d6b290112a244cb3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Availability</topic><topic>Fault detection</topic><topic>Life testing</topic><topic>Maintenance</topic><topic>Petri nets</topic><topic>Steady-state</topic><topic>Stochastic processes</topic><topic>Stochastic systems</topic><topic>System performance</topic><topic>System testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Su Yongding</creatorcontrib><creatorcontrib>Qiu Jing</creatorcontrib><creatorcontrib>Liu Guanjun</creatorcontrib><creatorcontrib>Xu Yuguo</creatorcontrib><creatorcontrib>Qian Yanling</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Su Yongding</au><au>Qiu Jing</au><au>Liu Guanjun</au><au>Xu Yuguo</au><au>Qian Yanling</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Method of Testability Index Determination Based on Generalized Stochastic Petri Net</atitle><btitle>2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis</btitle><stitle>CAS-ICTD</stitle><date>2009-04</date><risdate>2009</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>2324-8475</issn><isbn>1424425875</isbn><isbn>9781424425877</isbn><abstract>As an important performance of equipment system, testability is always omitted in the traditional availability analysis. Testability design is an effective way to realize the fault detection and isolation. Determining testability index is the chief step of testability design. It needs to consider the influence factors of testability such as the requirement of system availability, reliability, maintainability, supportability and so on. A testability requirement analysis model is built based on generalized stochastic Petri nets (GSPN), which is used to determinate testability index. The reachable states are analyzed based on the model and the Markov chain is constructed. The state transition matrix is created and the system steady state probability is gained. The relationship between the steady state availability and testability parameters was revealed and the testability parameters are reasoned. The validation results of an example show that the method is an effective method to determine testability index such as fault detection rate and fault isolation rate.</abstract><pub>IEEE</pub><doi>10.1109/CAS-ICTD.2009.4960839</doi><tpages>4</tpages></addata></record> |
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issn | 2324-8475 |
language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Availability Fault detection Life testing Maintenance Petri nets Steady-state Stochastic processes Stochastic systems System performance System testing |
title | Method of Testability Index Determination Based on Generalized Stochastic Petri Net |
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