Limitation of the signal pin density on wiring boards

A practical limit of the signal pin density on wiring boards is investigated from the wireability point of view. The wireability problem can be expressed as a supply and demand model of two resources, i.e. wiring channels and via-holes. The limit of the signal pin density is assumed to be determined...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging packaging, and manufacturing technology. Part B, Advanced packaging, 1996-05, Vol.19 (2), p.391-396
Hauptverfasser: Chiba, T., Yamada, M., Kobayashi, F.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 396
container_issue 2
container_start_page 391
container_title IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging
container_volume 19
creator Chiba, T.
Yamada, M.
Kobayashi, F.
description A practical limit of the signal pin density on wiring boards is investigated from the wireability point of view. The wireability problem can be expressed as a supply and demand model of two resources, i.e. wiring channels and via-holes. The limit of the signal pin density is assumed to be determined by the shortage of either of these two resources. As a measure of pin density, the average distance between adjacent signal pins, s/sub T/, is introduced. The practical limit of s/sub T/ is estimated by analyzing the actual product data and experimental data. The lower bound of s/sub T/, normalized by the grid spacing, can range from 1.5 to 2.0. These results are applied as a guideline to estimate the footprint area per LSI, and to do design tradeoffs among different packaging technologies such as multichip modules (MCM).
doi_str_mv 10.1109/96.496043
format Article
fullrecord <record><control><sourceid>pascalfrancis_RIE</sourceid><recordid>TN_cdi_ieee_primary_496043</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>496043</ieee_id><sourcerecordid>3111195</sourcerecordid><originalsourceid>FETCH-LOGICAL-c275t-4803685f0891904b3265accd7f383155abac16364c9317b82fe62565aafd106e3</originalsourceid><addsrcrecordid>eNo9j81LxDAQxYMouK4evHrKwYuHrpPmo8lRFr-g4EXPZZoma6TblqQg-98b6bJzmYH3mzfzCLllsGEMzKNRG2EUCH5GVkxKXXCl1XmeoYLCaCMuyVVKPwDAJWcrIuuwDzPOYRzo6On87WgKuwF7OoWBdm5IYT7QLP6GGIYdbUeMXbomFx775G6OfU2-Xp4_t29F_fH6vn2qC1tWci6EhnxeetCGGRAtL5VEa7vKc83zd9iiZYorYQ1nVatL71QpM4O-Y6AcX5OHxdfGMaXofDPFsMd4aBg0_3kbo5olb2bvF3bCZLH3EQcb0mmBs1xGZuxuwYJz7qQePf4AaxJbEw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Limitation of the signal pin density on wiring boards</title><source>IEEE Electronic Library (IEL)</source><creator>Chiba, T. ; Yamada, M. ; Kobayashi, F.</creator><creatorcontrib>Chiba, T. ; Yamada, M. ; Kobayashi, F.</creatorcontrib><description>A practical limit of the signal pin density on wiring boards is investigated from the wireability point of view. The wireability problem can be expressed as a supply and demand model of two resources, i.e. wiring channels and via-holes. The limit of the signal pin density is assumed to be determined by the shortage of either of these two resources. As a measure of pin density, the average distance between adjacent signal pins, s/sub T/, is introduced. The practical limit of s/sub T/ is estimated by analyzing the actual product data and experimental data. The lower bound of s/sub T/, normalized by the grid spacing, can range from 1.5 to 2.0. These results are applied as a guideline to estimate the footprint area per LSI, and to do design tradeoffs among different packaging technologies such as multichip modules (MCM).</description><identifier>ISSN: 1070-9894</identifier><identifier>EISSN: 1558-3686</identifier><identifier>DOI: 10.1109/96.496043</identifier><identifier>CODEN: IMTBE4</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Costs ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Exact sciences and technology ; Guidelines ; Large scale integration ; Multichip modules ; Packaging ; Pins ; Signal design ; Signal processing ; Space technology ; Wiring</subject><ispartof>IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 1996-05, Vol.19 (2), p.391-396</ispartof><rights>1996 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c275t-4803685f0891904b3265accd7f383155abac16364c9317b82fe62565aafd106e3</citedby><cites>FETCH-LOGICAL-c275t-4803685f0891904b3265accd7f383155abac16364c9317b82fe62565aafd106e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/496043$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/496043$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=3111195$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Chiba, T.</creatorcontrib><creatorcontrib>Yamada, M.</creatorcontrib><creatorcontrib>Kobayashi, F.</creatorcontrib><title>Limitation of the signal pin density on wiring boards</title><title>IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging</title><addtitle>T-CPMB</addtitle><description>A practical limit of the signal pin density on wiring boards is investigated from the wireability point of view. The wireability problem can be expressed as a supply and demand model of two resources, i.e. wiring channels and via-holes. The limit of the signal pin density is assumed to be determined by the shortage of either of these two resources. As a measure of pin density, the average distance between adjacent signal pins, s/sub T/, is introduced. The practical limit of s/sub T/ is estimated by analyzing the actual product data and experimental data. The lower bound of s/sub T/, normalized by the grid spacing, can range from 1.5 to 2.0. These results are applied as a guideline to estimate the footprint area per LSI, and to do design tradeoffs among different packaging technologies such as multichip modules (MCM).</description><subject>Applied sciences</subject><subject>Costs</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Guidelines</subject><subject>Large scale integration</subject><subject>Multichip modules</subject><subject>Packaging</subject><subject>Pins</subject><subject>Signal design</subject><subject>Signal processing</subject><subject>Space technology</subject><subject>Wiring</subject><issn>1070-9894</issn><issn>1558-3686</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNo9j81LxDAQxYMouK4evHrKwYuHrpPmo8lRFr-g4EXPZZoma6TblqQg-98b6bJzmYH3mzfzCLllsGEMzKNRG2EUCH5GVkxKXXCl1XmeoYLCaCMuyVVKPwDAJWcrIuuwDzPOYRzo6On87WgKuwF7OoWBdm5IYT7QLP6GGIYdbUeMXbomFx775G6OfU2-Xp4_t29F_fH6vn2qC1tWci6EhnxeetCGGRAtL5VEa7vKc83zd9iiZYorYQ1nVatL71QpM4O-Y6AcX5OHxdfGMaXofDPFsMd4aBg0_3kbo5olb2bvF3bCZLH3EQcb0mmBs1xGZuxuwYJz7qQePf4AaxJbEw</recordid><startdate>19960501</startdate><enddate>19960501</enddate><creator>Chiba, T.</creator><creator>Yamada, M.</creator><creator>Kobayashi, F.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19960501</creationdate><title>Limitation of the signal pin density on wiring boards</title><author>Chiba, T. ; Yamada, M. ; Kobayashi, F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c275t-4803685f0891904b3265accd7f383155abac16364c9317b82fe62565aafd106e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Applied sciences</topic><topic>Costs</topic><topic>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Guidelines</topic><topic>Large scale integration</topic><topic>Multichip modules</topic><topic>Packaging</topic><topic>Pins</topic><topic>Signal design</topic><topic>Signal processing</topic><topic>Space technology</topic><topic>Wiring</topic><toplevel>online_resources</toplevel><creatorcontrib>Chiba, T.</creatorcontrib><creatorcontrib>Yamada, M.</creatorcontrib><creatorcontrib>Kobayashi, F.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chiba, T.</au><au>Yamada, M.</au><au>Kobayashi, F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Limitation of the signal pin density on wiring boards</atitle><jtitle>IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging</jtitle><stitle>T-CPMB</stitle><date>1996-05-01</date><risdate>1996</risdate><volume>19</volume><issue>2</issue><spage>391</spage><epage>396</epage><pages>391-396</pages><issn>1070-9894</issn><eissn>1558-3686</eissn><coden>IMTBE4</coden><abstract>A practical limit of the signal pin density on wiring boards is investigated from the wireability point of view. The wireability problem can be expressed as a supply and demand model of two resources, i.e. wiring channels and via-holes. The limit of the signal pin density is assumed to be determined by the shortage of either of these two resources. As a measure of pin density, the average distance between adjacent signal pins, s/sub T/, is introduced. The practical limit of s/sub T/ is estimated by analyzing the actual product data and experimental data. The lower bound of s/sub T/, normalized by the grid spacing, can range from 1.5 to 2.0. These results are applied as a guideline to estimate the footprint area per LSI, and to do design tradeoffs among different packaging technologies such as multichip modules (MCM).</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/96.496043</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1070-9894
ispartof IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 1996-05, Vol.19 (2), p.391-396
issn 1070-9894
1558-3686
language eng
recordid cdi_ieee_primary_496043
source IEEE Electronic Library (IEL)
subjects Applied sciences
Costs
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Guidelines
Large scale integration
Multichip modules
Packaging
Pins
Signal design
Signal processing
Space technology
Wiring
title Limitation of the signal pin density on wiring boards
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T02%3A47%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Limitation%20of%20the%20signal%20pin%20density%20on%20wiring%20boards&rft.jtitle=IEEE%20transactions%20on%20components,%20packaging,%20and%20manufacturing%20technology.%20Part%20B,%20Advanced%20packaging&rft.au=Chiba,%20T.&rft.date=1996-05-01&rft.volume=19&rft.issue=2&rft.spage=391&rft.epage=396&rft.pages=391-396&rft.issn=1070-9894&rft.eissn=1558-3686&rft.coden=IMTBE4&rft_id=info:doi/10.1109/96.496043&rft_dat=%3Cpascalfrancis_RIE%3E3111195%3C/pascalfrancis_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=496043&rfr_iscdi=true