Proposal of device capability profiling for manufacturing application service interface

Recently, generic application service interface specifications (GDI, FDT, OPC-UA, etc.) were standardized for the system integration of different field bus technologies. However, since each field bus technology had an original device description, it was not able to describe the device capability pro...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Suzuki, K., Tetsuo Ideguchi
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 6
container_issue
container_start_page 1
container_title
container_volume
creator Suzuki, K.
Tetsuo Ideguchi
description Recently, generic application service interface specifications (GDI, FDT, OPC-UA, etc.) were standardized for the system integration of different field bus technologies. However, since each field bus technology had an original device description, it was not able to describe the device capability profile of the device in a unified way. In this paper, the device capability profiling method corresponding to multi-technology is proposed for GDI which is one of generic application service interfaces. The device capability profile of each device is previously described in the XML schema definition language (XSD) according to the template. It is shown that the parameter instance which describes the values of devices can be described by an XML document, using the device capability profile as a schema. And it is shown that the manufacturing application service interface which accesses manufacturing equipment can be realized on GDI by using OASIS Production Planning and Scheduling (PPS) protocol. For standardization of a manufacturing application service interface, we proposed adding this method to ISO 20242 standard to ISO.
doi_str_mv 10.1109/ICIT.2009.4939689
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4939689</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4939689</ieee_id><sourcerecordid>4939689</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-3c354d999a18330eb06663875744a9b35dbd4a754c64fa514abef3e5d460b5ef3</originalsourceid><addsrcrecordid>eNpFkE9LxDAQxSOyoLvuBxAv-QKtSTNJm6MU_xQW9FDwuEzTRCLdNqRdYb-9URecy7z3eL85DCG3nOWcM33f1E2bF4zpHLTQqtIXZM2hABCSlcXlv1GwIutUrDRPoLgi23n-ZGlACl6oa_L-FqcwzTjQydHefnljqcGAnR_8cqIhTi6p8YO6KdIDjkeHZjnGnwRDGLzBxU8jnW38Rf242Jgq9oasHA6z3Z73hrRPj239ku1en5v6YZd5zZZMGCGh11ojr4RgtmNKKVGVsgRA3QnZdz1gKcEocCg5YGedsLIHxTqZ5Ibc_Z311tp9iP6A8bQ_P0V8A_lJVQM</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Proposal of device capability profiling for manufacturing application service interface</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Suzuki, K. ; Tetsuo Ideguchi</creator><creatorcontrib>Suzuki, K. ; Tetsuo Ideguchi</creatorcontrib><description>Recently, generic application service interface specifications (GDI, FDT, OPC-UA, etc.) were standardized for the system integration of different field bus technologies. However, since each field bus technology had an original device description, it was not able to describe the device capability profile of the device in a unified way. In this paper, the device capability profiling method corresponding to multi-technology is proposed for GDI which is one of generic application service interfaces. The device capability profile of each device is previously described in the XML schema definition language (XSD) according to the template. It is shown that the parameter instance which describes the values of devices can be described by an XML document, using the device capability profile as a schema. And it is shown that the manufacturing application service interface which accesses manufacturing equipment can be realized on GDI by using OASIS Production Planning and Scheduling (PPS) protocol. For standardization of a manufacturing application service interface, we proposed adding this method to ISO 20242 standard to ISO.</description><identifier>ISBN: 1424435064</identifier><identifier>ISBN: 9781424435067</identifier><identifier>EISBN: 1424435072</identifier><identifier>EISBN: 9781424435074</identifier><identifier>DOI: 10.1109/ICIT.2009.4939689</identifier><identifier>LCCN: 2008911103</identifier><language>eng</language><publisher>IEEE</publisher><subject>Field buses ; ISO standards ; Job shop scheduling ; Manufacturing ; Production planning ; Proposals ; Quality management ; Research and development ; Space technology ; XML</subject><ispartof>2009 IEEE International Conference on Industrial Technology, 2009, p.1-6</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4939689$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,27904,54899</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4939689$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Suzuki, K.</creatorcontrib><creatorcontrib>Tetsuo Ideguchi</creatorcontrib><title>Proposal of device capability profiling for manufacturing application service interface</title><title>2009 IEEE International Conference on Industrial Technology</title><addtitle>ICIT</addtitle><description>Recently, generic application service interface specifications (GDI, FDT, OPC-UA, etc.) were standardized for the system integration of different field bus technologies. However, since each field bus technology had an original device description, it was not able to describe the device capability profile of the device in a unified way. In this paper, the device capability profiling method corresponding to multi-technology is proposed for GDI which is one of generic application service interfaces. The device capability profile of each device is previously described in the XML schema definition language (XSD) according to the template. It is shown that the parameter instance which describes the values of devices can be described by an XML document, using the device capability profile as a schema. And it is shown that the manufacturing application service interface which accesses manufacturing equipment can be realized on GDI by using OASIS Production Planning and Scheduling (PPS) protocol. For standardization of a manufacturing application service interface, we proposed adding this method to ISO 20242 standard to ISO.</description><subject>Field buses</subject><subject>ISO standards</subject><subject>Job shop scheduling</subject><subject>Manufacturing</subject><subject>Production planning</subject><subject>Proposals</subject><subject>Quality management</subject><subject>Research and development</subject><subject>Space technology</subject><subject>XML</subject><isbn>1424435064</isbn><isbn>9781424435067</isbn><isbn>1424435072</isbn><isbn>9781424435074</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFkE9LxDAQxSOyoLvuBxAv-QKtSTNJm6MU_xQW9FDwuEzTRCLdNqRdYb-9URecy7z3eL85DCG3nOWcM33f1E2bF4zpHLTQqtIXZM2hABCSlcXlv1GwIutUrDRPoLgi23n-ZGlACl6oa_L-FqcwzTjQydHefnljqcGAnR_8cqIhTi6p8YO6KdIDjkeHZjnGnwRDGLzBxU8jnW38Rf242Jgq9oasHA6z3Z73hrRPj239ku1en5v6YZd5zZZMGCGh11ojr4RgtmNKKVGVsgRA3QnZdz1gKcEocCg5YGedsLIHxTqZ5Ibc_Z311tp9iP6A8bQ_P0V8A_lJVQM</recordid><startdate>200902</startdate><enddate>200902</enddate><creator>Suzuki, K.</creator><creator>Tetsuo Ideguchi</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200902</creationdate><title>Proposal of device capability profiling for manufacturing application service interface</title><author>Suzuki, K. ; Tetsuo Ideguchi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-3c354d999a18330eb06663875744a9b35dbd4a754c64fa514abef3e5d460b5ef3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Field buses</topic><topic>ISO standards</topic><topic>Job shop scheduling</topic><topic>Manufacturing</topic><topic>Production planning</topic><topic>Proposals</topic><topic>Quality management</topic><topic>Research and development</topic><topic>Space technology</topic><topic>XML</topic><toplevel>online_resources</toplevel><creatorcontrib>Suzuki, K.</creatorcontrib><creatorcontrib>Tetsuo Ideguchi</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Suzuki, K.</au><au>Tetsuo Ideguchi</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Proposal of device capability profiling for manufacturing application service interface</atitle><btitle>2009 IEEE International Conference on Industrial Technology</btitle><stitle>ICIT</stitle><date>2009-02</date><risdate>2009</risdate><spage>1</spage><epage>6</epage><pages>1-6</pages><isbn>1424435064</isbn><isbn>9781424435067</isbn><eisbn>1424435072</eisbn><eisbn>9781424435074</eisbn><abstract>Recently, generic application service interface specifications (GDI, FDT, OPC-UA, etc.) were standardized for the system integration of different field bus technologies. However, since each field bus technology had an original device description, it was not able to describe the device capability profile of the device in a unified way. In this paper, the device capability profiling method corresponding to multi-technology is proposed for GDI which is one of generic application service interfaces. The device capability profile of each device is previously described in the XML schema definition language (XSD) according to the template. It is shown that the parameter instance which describes the values of devices can be described by an XML document, using the device capability profile as a schema. And it is shown that the manufacturing application service interface which accesses manufacturing equipment can be realized on GDI by using OASIS Production Planning and Scheduling (PPS) protocol. For standardization of a manufacturing application service interface, we proposed adding this method to ISO 20242 standard to ISO.</abstract><pub>IEEE</pub><doi>10.1109/ICIT.2009.4939689</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 1424435064
ispartof 2009 IEEE International Conference on Industrial Technology, 2009, p.1-6
issn
language eng
recordid cdi_ieee_primary_4939689
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Field buses
ISO standards
Job shop scheduling
Manufacturing
Production planning
Proposals
Quality management
Research and development
Space technology
XML
title Proposal of device capability profiling for manufacturing application service interface
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T17%3A53%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Proposal%20of%20device%20capability%20profiling%20for%20manufacturing%20application%20service%20interface&rft.btitle=2009%20IEEE%20International%20Conference%20on%20Industrial%20Technology&rft.au=Suzuki,%20K.&rft.date=2009-02&rft.spage=1&rft.epage=6&rft.pages=1-6&rft.isbn=1424435064&rft.isbn_list=9781424435067&rft_id=info:doi/10.1109/ICIT.2009.4939689&rft_dat=%3Cieee_6IE%3E4939689%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1424435072&rft.eisbn_list=9781424435074&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4939689&rfr_iscdi=true