Size dependent nonuniformity loss in thin film photovoltaics
We develop one- and two-dimensional PSPICE models of nonuniform thin-film photovoltaic (PV) cells and study the effects of lateral variations in device photovoltage on major integral PV parameters. These effects turn out to be size dependent with amplitude that decreases with cell series resistance....
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creator | Muszynski, Timothy Shvydka, Diana Karpov, V.G. |
description | We develop one- and two-dimensional PSPICE models of nonuniform thin-film photovoltaic (PV) cells and study the effects of lateral variations in device photovoltage on major integral PV parameters. These effects turn out to be size dependent with amplitude that decreases with cell series resistance. Fill factor is found to suffer the strongest nonuniformity loss most tightly correlated with efficiency; however, the effects of Voc and Jsc loss are significant as well. The observed size dependencies suggest a way of experimentally verifying the predicted effects, in particular, discriminating between them and the alternative 'field-dependent collection' explanation of the fill factor and efficiency loss. This discrimination is important, as leading to considerably different technological remedies. |
doi_str_mv | 10.1109/PVSC.2008.4922536 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4922536</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4922536</ieee_id><sourcerecordid>4922536</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-aa4ae3cf7c786d9a9bdf675f642a10fc41c0c41ad5f7b70f7f27d6f678490ee13</originalsourceid><addsrcrecordid>eNo1kN9KwzAYxSM6sJt7APEmL9D6fUmaP-CNFKfCQGHD25E1CYu0zWirMJ_egvPmdziHw7k4hNwiFIhg7t8_NlXBAHQhDGMllxdkjoIJgVKgviRLo_S_B7giGaCEXHOFM5JpkU8panZN5sPwCcCAS8zIwyb-eOr80XfOdyPtUvfVxZD6No4n2qRhoLGj42FCiE1Lj4c0pu_UjDbWww2ZBdsMfnnWBdmunrbVS75-e36tHtd5NDDm1grreR1UrbR0xpq9C1KVQQpmEUItsIYJ1pVB7RUEFZhycqpoYcB75Aty9zcbvfe7Yx9b25925xP4L10OTUQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Size dependent nonuniformity loss in thin film photovoltaics</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Muszynski, Timothy ; Shvydka, Diana ; Karpov, V.G.</creator><creatorcontrib>Muszynski, Timothy ; Shvydka, Diana ; Karpov, V.G.</creatorcontrib><description>We develop one- and two-dimensional PSPICE models of nonuniform thin-film photovoltaic (PV) cells and study the effects of lateral variations in device photovoltage on major integral PV parameters. These effects turn out to be size dependent with amplitude that decreases with cell series resistance. Fill factor is found to suffer the strongest nonuniformity loss most tightly correlated with efficiency; however, the effects of Voc and Jsc loss are significant as well. The observed size dependencies suggest a way of experimentally verifying the predicted effects, in particular, discriminating between them and the alternative 'field-dependent collection' explanation of the fill factor and efficiency loss. This discrimination is important, as leading to considerably different technological remedies.</description><identifier>ISSN: 0160-8371</identifier><identifier>ISBN: 9781424416400</identifier><identifier>ISBN: 142441640X</identifier><identifier>EISBN: 1424416418</identifier><identifier>EISBN: 9781424416417</identifier><identifier>DOI: 10.1109/PVSC.2008.4922536</identifier><identifier>LCCN: 84-640182</identifier><language>eng</language><publisher>IEEE</publisher><subject>Astronomy ; Circuits ; Diodes ; Grain size ; Immune system ; Photovoltaic cells ; Physics ; SPICE ; Thin film devices ; Transistors</subject><ispartof>2008 33rd IEEE Photovoltaic Specialists Conference, 2008, p.1-4</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4922536$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4922536$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Muszynski, Timothy</creatorcontrib><creatorcontrib>Shvydka, Diana</creatorcontrib><creatorcontrib>Karpov, V.G.</creatorcontrib><title>Size dependent nonuniformity loss in thin film photovoltaics</title><title>2008 33rd IEEE Photovoltaic Specialists Conference</title><addtitle>PVSC</addtitle><description>We develop one- and two-dimensional PSPICE models of nonuniform thin-film photovoltaic (PV) cells and study the effects of lateral variations in device photovoltage on major integral PV parameters. These effects turn out to be size dependent with amplitude that decreases with cell series resistance. Fill factor is found to suffer the strongest nonuniformity loss most tightly correlated with efficiency; however, the effects of Voc and Jsc loss are significant as well. The observed size dependencies suggest a way of experimentally verifying the predicted effects, in particular, discriminating between them and the alternative 'field-dependent collection' explanation of the fill factor and efficiency loss. This discrimination is important, as leading to considerably different technological remedies.</description><subject>Astronomy</subject><subject>Circuits</subject><subject>Diodes</subject><subject>Grain size</subject><subject>Immune system</subject><subject>Photovoltaic cells</subject><subject>Physics</subject><subject>SPICE</subject><subject>Thin film devices</subject><subject>Transistors</subject><issn>0160-8371</issn><isbn>9781424416400</isbn><isbn>142441640X</isbn><isbn>1424416418</isbn><isbn>9781424416417</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1kN9KwzAYxSM6sJt7APEmL9D6fUmaP-CNFKfCQGHD25E1CYu0zWirMJ_egvPmdziHw7k4hNwiFIhg7t8_NlXBAHQhDGMllxdkjoIJgVKgviRLo_S_B7giGaCEXHOFM5JpkU8panZN5sPwCcCAS8zIwyb-eOr80XfOdyPtUvfVxZD6No4n2qRhoLGj42FCiE1Lj4c0pu_UjDbWww2ZBdsMfnnWBdmunrbVS75-e36tHtd5NDDm1grreR1UrbR0xpq9C1KVQQpmEUItsIYJ1pVB7RUEFZhycqpoYcB75Aty9zcbvfe7Yx9b25925xP4L10OTUQ</recordid><startdate>200805</startdate><enddate>200805</enddate><creator>Muszynski, Timothy</creator><creator>Shvydka, Diana</creator><creator>Karpov, V.G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200805</creationdate><title>Size dependent nonuniformity loss in thin film photovoltaics</title><author>Muszynski, Timothy ; Shvydka, Diana ; Karpov, V.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-aa4ae3cf7c786d9a9bdf675f642a10fc41c0c41ad5f7b70f7f27d6f678490ee13</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Astronomy</topic><topic>Circuits</topic><topic>Diodes</topic><topic>Grain size</topic><topic>Immune system</topic><topic>Photovoltaic cells</topic><topic>Physics</topic><topic>SPICE</topic><topic>Thin film devices</topic><topic>Transistors</topic><toplevel>online_resources</toplevel><creatorcontrib>Muszynski, Timothy</creatorcontrib><creatorcontrib>Shvydka, Diana</creatorcontrib><creatorcontrib>Karpov, V.G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Muszynski, Timothy</au><au>Shvydka, Diana</au><au>Karpov, V.G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Size dependent nonuniformity loss in thin film photovoltaics</atitle><btitle>2008 33rd IEEE Photovoltaic Specialists Conference</btitle><stitle>PVSC</stitle><date>2008-05</date><risdate>2008</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>0160-8371</issn><isbn>9781424416400</isbn><isbn>142441640X</isbn><eisbn>1424416418</eisbn><eisbn>9781424416417</eisbn><abstract>We develop one- and two-dimensional PSPICE models of nonuniform thin-film photovoltaic (PV) cells and study the effects of lateral variations in device photovoltage on major integral PV parameters. These effects turn out to be size dependent with amplitude that decreases with cell series resistance. Fill factor is found to suffer the strongest nonuniformity loss most tightly correlated with efficiency; however, the effects of Voc and Jsc loss are significant as well. The observed size dependencies suggest a way of experimentally verifying the predicted effects, in particular, discriminating between them and the alternative 'field-dependent collection' explanation of the fill factor and efficiency loss. This discrimination is important, as leading to considerably different technological remedies.</abstract><pub>IEEE</pub><doi>10.1109/PVSC.2008.4922536</doi><tpages>4</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Astronomy Circuits Diodes Grain size Immune system Photovoltaic cells Physics SPICE Thin film devices Transistors |
title | Size dependent nonuniformity loss in thin film photovoltaics |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T03%3A29%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Size%20dependent%20nonuniformity%20loss%20in%20thin%20film%20photovoltaics&rft.btitle=2008%2033rd%20IEEE%20Photovoltaic%20Specialists%20Conference&rft.au=Muszynski,%20Timothy&rft.date=2008-05&rft.spage=1&rft.epage=4&rft.pages=1-4&rft.issn=0160-8371&rft.isbn=9781424416400&rft.isbn_list=142441640X&rft_id=info:doi/10.1109/PVSC.2008.4922536&rft_dat=%3Cieee_6IE%3E4922536%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1424416418&rft.eisbn_list=9781424416417&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4922536&rfr_iscdi=true |