Spatially resolved silicon solar cell characterization using infrared imaging methods

We present a comprehensive overview over infrared imaging techniques for (electrical) silicon solar cell characterization. Recent method development in local series resistance imaging is reviewed in more detail and new results in local breakdown investigations on multicrystalline (mc) silicon solar...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kasemann, M., Kwapil, W., Schubert, M.C., Habenicht, H., Walter, B., The, M., Kontermann, S., Rein, S., Breitenstein, O., Bauer, J., Lotnyk, A., Michl, B., Nagel, H., Schutt, A., Carstensen, J., Foll, H., Trupke, T., Augarten, Y., Kampwerth, H., Bardos, R.A., Pingel, S., Berghold, J., Warta, W., Glunz, S.W.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Breakdown voltage Electric breakdown Electric resistance Image resolution Infrared imaging Low voltage Optical imaging Photovoltaic cells Silicon Spatial resolution
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