Reliability study of 850 nm VCSELs for data communications

Reliability study of 850 nm VCSELs for data communications

We present reliability results for 850 nm Vertical Cavity Surface Emitting Laser (VCSEL) devices. Hundreds of parts from multiple wafer lots and package styles were subjected to burn-in for thousands of hours at various temperatures and currents, yielding more than one million device-hours of data....

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Hawthorne, R.A., Guenter, J.K., Granville, D.N., Hibbs-Brenner, M.K., Morgan, R.A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Communication switching
Data communication
Packaging
Production
Stress
Surface emitting lasers
Switches
Telecommunication network reliability
Temperature
Vertical cavity surface emitting lasers
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We present reliability results for 850 nm Vertical Cavity Surface Emitting Laser (VCSEL) devices. Hundreds of parts from multiple wafer lots and package styles were subjected to burn-in for thousands of hours at various temperatures and currents, yielding more than one million device-hours of data. Possible failure mechanisms are also discussed.
DOI:10.1109/RELPHY.1996.492120