Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal

An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of th...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Postnikov, I.I.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 809
container_issue
container_start_page 804
container_title
container_volume
creator Postnikov, I.I.
description An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of these dependencies is demonstrated for crystals with varying thickness and different cut directions for both harmonic and nonharmonic vibrations.
doi_str_mv 10.1109/FREQ.1995.484088
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_484088</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>484088</ieee_id><sourcerecordid>484088</sourcerecordid><originalsourceid>FETCH-LOGICAL-i104t-3dc7d77a24c8fdd3374a980fbdc7e5394ef96a3b591cf5ed5829ac67a78bed113</originalsourceid><addsrcrecordid>eNotkE1LAzEQhgMi-NW7eMoPcGuyyXaTo9RWhYIoei7TZEKju9ltkgrtH_HvurbOZXge3pnDS8g1Z2POmb6bv81ex1zraiyVZEqdkAtWKybKijF-RkYpfbJhpNCl5Ofk5wF7DBaDQdo56iJutgPsioxtjxHyNiI1a4hgMkafsjfpL7jZQsx7GjF1AXIXBxmo62J7S61vMSTfhUQhWNp0Bhr6DdFDPsjhOq-9-QqYDtB73HfYoMnRG2riLmVorsipgybh6H9fko_57H36VCxeHp-n94vCcyZzIaypbV1DKY1y1gpRS9CKudXgsRJaotMTEKtKc-MqtJUqNZhJDbVaoeVcXJKb41-PiMs--hbibnmsTvwCfl5qTw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Postnikov, I.I.</creator><creatorcontrib>Postnikov, I.I.</creatorcontrib><description>An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of these dependencies is demonstrated for crystals with varying thickness and different cut directions for both harmonic and nonharmonic vibrations.</description><identifier>ISBN: 0780325001</identifier><identifier>ISBN: 9780780325005</identifier><identifier>DOI: 10.1109/FREQ.1995.484088</identifier><language>eng</language><publisher>IEEE</publisher><subject>Crystals ; Elasticity ; Lab-on-a-chip ; Power engineering ; Power engineering computing ; Resonance ; Resonant frequency ; Temperature dependence ; Temperature distribution ; Vibration measurement</subject><ispartof>Proceedings of the 1995 IEEE International Frequency Control Symposium (49th Annual Symposium), 1995, p.804-809</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/484088$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,4035,4036,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/484088$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Postnikov, I.I.</creatorcontrib><title>Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal</title><title>Proceedings of the 1995 IEEE International Frequency Control Symposium (49th Annual Symposium)</title><addtitle>FREQ</addtitle><description>An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of these dependencies is demonstrated for crystals with varying thickness and different cut directions for both harmonic and nonharmonic vibrations.</description><subject>Crystals</subject><subject>Elasticity</subject><subject>Lab-on-a-chip</subject><subject>Power engineering</subject><subject>Power engineering computing</subject><subject>Resonance</subject><subject>Resonant frequency</subject><subject>Temperature dependence</subject><subject>Temperature distribution</subject><subject>Vibration measurement</subject><isbn>0780325001</isbn><isbn>9780780325005</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1995</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkE1LAzEQhgMi-NW7eMoPcGuyyXaTo9RWhYIoei7TZEKju9ltkgrtH_HvurbOZXge3pnDS8g1Z2POmb6bv81ex1zraiyVZEqdkAtWKybKijF-RkYpfbJhpNCl5Ofk5wF7DBaDQdo56iJutgPsioxtjxHyNiI1a4hgMkafsjfpL7jZQsx7GjF1AXIXBxmo62J7S61vMSTfhUQhWNp0Bhr6DdFDPsjhOq-9-QqYDtB73HfYoMnRG2riLmVorsipgybh6H9fko_57H36VCxeHp-n94vCcyZzIaypbV1DKY1y1gpRS9CKudXgsRJaotMTEKtKc-MqtJUqNZhJDbVaoeVcXJKb41-PiMs--hbibnmsTvwCfl5qTw</recordid><startdate>1995</startdate><enddate>1995</enddate><creator>Postnikov, I.I.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1995</creationdate><title>Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal</title><author>Postnikov, I.I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-3dc7d77a24c8fdd3374a980fbdc7e5394ef96a3b591cf5ed5829ac67a78bed113</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Crystals</topic><topic>Elasticity</topic><topic>Lab-on-a-chip</topic><topic>Power engineering</topic><topic>Power engineering computing</topic><topic>Resonance</topic><topic>Resonant frequency</topic><topic>Temperature dependence</topic><topic>Temperature distribution</topic><topic>Vibration measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Postnikov, I.I.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Postnikov, I.I.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal</atitle><btitle>Proceedings of the 1995 IEEE International Frequency Control Symposium (49th Annual Symposium)</btitle><stitle>FREQ</stitle><date>1995</date><risdate>1995</risdate><spage>804</spage><epage>809</epage><pages>804-809</pages><isbn>0780325001</isbn><isbn>9780780325005</isbn><abstract>An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of these dependencies is demonstrated for crystals with varying thickness and different cut directions for both harmonic and nonharmonic vibrations.</abstract><pub>IEEE</pub><doi>10.1109/FREQ.1995.484088</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 0780325001
ispartof Proceedings of the 1995 IEEE International Frequency Control Symposium (49th Annual Symposium), 1995, p.804-809
issn
language eng
recordid cdi_ieee_primary_484088
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Crystals
Elasticity
Lab-on-a-chip
Power engineering
Power engineering computing
Resonance
Resonant frequency
Temperature dependence
Temperature distribution
Vibration measurement
title Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T09%3A15%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Dependence%20of%20frequency-temperature%20characteristics%20of%20quartz%20resonators%20on%20form,%20dimensions%20and%20local%20variations%20of%20thickness%20of%20piezoelectric%20crystal&rft.btitle=Proceedings%20of%20the%201995%20IEEE%20International%20Frequency%20Control%20Symposium%20(49th%20Annual%20Symposium)&rft.au=Postnikov,%20I.I.&rft.date=1995&rft.spage=804&rft.epage=809&rft.pages=804-809&rft.isbn=0780325001&rft.isbn_list=9780780325005&rft_id=info:doi/10.1109/FREQ.1995.484088&rft_dat=%3Cieee_6IE%3E484088%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=484088&rfr_iscdi=true