Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal
An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of th...
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creator | Postnikov, I.I. |
description | An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of these dependencies is demonstrated for crystals with varying thickness and different cut directions for both harmonic and nonharmonic vibrations. |
doi_str_mv | 10.1109/FREQ.1995.484088 |
format | Conference Proceeding |
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The possibility of determining of these dependencies is demonstrated for crystals with varying thickness and different cut directions for both harmonic and nonharmonic vibrations.</description><subject>Crystals</subject><subject>Elasticity</subject><subject>Lab-on-a-chip</subject><subject>Power engineering</subject><subject>Power engineering computing</subject><subject>Resonance</subject><subject>Resonant frequency</subject><subject>Temperature dependence</subject><subject>Temperature distribution</subject><subject>Vibration measurement</subject><isbn>0780325001</isbn><isbn>9780780325005</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1995</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkE1LAzEQhgMi-NW7eMoPcGuyyXaTo9RWhYIoei7TZEKju9ltkgrtH_HvurbOZXge3pnDS8g1Z2POmb6bv81ex1zraiyVZEqdkAtWKybKijF-RkYpfbJhpNCl5Ofk5wF7DBaDQdo56iJutgPsioxtjxHyNiI1a4hgMkafsjfpL7jZQsx7GjF1AXIXBxmo62J7S61vMSTfhUQhWNp0Bhr6DdFDPsjhOq-9-QqYDtB73HfYoMnRG2riLmVorsipgybh6H9fko_57H36VCxeHp-n94vCcyZzIaypbV1DKY1y1gpRS9CKudXgsRJaotMTEKtKc-MqtJUqNZhJDbVaoeVcXJKb41-PiMs--hbibnmsTvwCfl5qTw</recordid><startdate>1995</startdate><enddate>1995</enddate><creator>Postnikov, I.I.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1995</creationdate><title>Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal</title><author>Postnikov, I.I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-3dc7d77a24c8fdd3374a980fbdc7e5394ef96a3b591cf5ed5829ac67a78bed113</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Crystals</topic><topic>Elasticity</topic><topic>Lab-on-a-chip</topic><topic>Power engineering</topic><topic>Power engineering computing</topic><topic>Resonance</topic><topic>Resonant frequency</topic><topic>Temperature dependence</topic><topic>Temperature distribution</topic><topic>Vibration measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Postnikov, I.I.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Postnikov, I.I.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal</atitle><btitle>Proceedings of the 1995 IEEE International Frequency Control Symposium (49th Annual Symposium)</btitle><stitle>FREQ</stitle><date>1995</date><risdate>1995</risdate><spage>804</spage><epage>809</epage><pages>804-809</pages><isbn>0780325001</isbn><isbn>9780780325005</isbn><abstract>An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of these dependencies is demonstrated for crystals with varying thickness and different cut directions for both harmonic and nonharmonic vibrations.</abstract><pub>IEEE</pub><doi>10.1109/FREQ.1995.484088</doi><tpages>6</tpages></addata></record> |
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ispartof | Proceedings of the 1995 IEEE International Frequency Control Symposium (49th Annual Symposium), 1995, p.804-809 |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Crystals Elasticity Lab-on-a-chip Power engineering Power engineering computing Resonance Resonant frequency Temperature dependence Temperature distribution Vibration measurement |
title | Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal |
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