Towards prognostics for electronics components
Electronics components have an increasingly critical role in avionics systems and in the development of future aircraft systems. Prognostics of such components is becoming a very important research field as a result of the need to provide aircraft systems with system level health management informat...
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| creator | Saha, B. Celaya, J.R. Wysocki, P.F. Goebel, K.F. |
| description | Electronics components have an increasingly critical role in avionics systems and in the development of future aircraft systems. Prognostics of such components is becoming a very important research field as a result of the need to provide aircraft systems with system level health management information. This paper focuses on a prognostics application for electronics components within avionics systems, and in particular its application to an Isolated Gate Bipolar Transistor (IGBT). This application utilizes the remaining useful life prediction, accomplished by employing the particle filter framework, leveraging data from accelerated aging tests on IGBTs. These tests induced thermal-electrical overstresses by applying thermal cycling to the IGBT devices. In-situ state monitoring, including measurements of steady-state voltages and currents, electrical transients, and thermal transients are recorded and used as potential precursors of failure. |
| doi_str_mv | 10.1109/AERO.2009.4839676 |
| format | Conference Proceeding |
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Prognostics of such components is becoming a very important research field as a result of the need to provide aircraft systems with system level health management information. This paper focuses on a prognostics application for electronics components within avionics systems, and in particular its application to an Isolated Gate Bipolar Transistor (IGBT). This application utilizes the remaining useful life prediction, accomplished by employing the particle filter framework, leveraging data from accelerated aging tests on IGBTs. These tests induced thermal-electrical overstresses by applying thermal cycling to the IGBT devices. 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Prognostics of such components is becoming a very important research field as a result of the need to provide aircraft systems with system level health management information. This paper focuses on a prognostics application for electronics components within avionics systems, and in particular its application to an Isolated Gate Bipolar Transistor (IGBT). This application utilizes the remaining useful life prediction, accomplished by employing the particle filter framework, leveraging data from accelerated aging tests on IGBTs. These tests induced thermal-electrical overstresses by applying thermal cycling to the IGBT devices. In-situ state monitoring, including measurements of steady-state voltages and currents, electrical transients, and thermal transients are recorded and used as potential precursors of failure.</abstract><pub>IEEE</pub><doi>10.1109/AERO.2009.4839676</doi><tpages>7</tpages></addata></record> |
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| identifier | ISSN: 1095-323X |
| ispartof | 2009 IEEE Aerospace conference, 2009, p.1-7 |
| issn | 1095-323X 2996-2358 |
| language | eng ; jpn |
| recordid | cdi_ieee_primary_4839676 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Accelerated aging Aerospace electronics Aircraft Bipolar transistors Condition monitoring Electronic components Information management Insulated gate bipolar transistors Life testing Particle filters |
| title | Towards prognostics for electronics components |
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