On-Chip Variability Sensor Using Phase-Locked Loop for Detecting and Correcting Parametric Timing Failures

Performance variability in digital integrated circuits can largely affect parametric yield and product reliability in ultra deep submicrometer technologies. As a result, variation resilience is becoming an essential design requirement for future technology nodes, especially for timing critical appli...

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Veröffentlicht in:	IEEE transactions on very large scale integration (VLSI) systems 2010-02, Vol.18 (2), p.270-280
Hauptverfasser:	Kunhyuk Kang, Sang Phill Park, Keejong Kim, Roy, K.
Format:	Artikel
Sprache:	eng
Schlagworte:	Adaptive body biasing Applied sciences Circuit properties Circuits Circuits of signal characteristics conditioning (including delay circuits) CMOS technology Design. Technologies. Operation analysis. Testing Digital integrated circuits Dynamical systems Electric potential Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Failure General equipment and techniques Instruments, apparatus, components and techniques common to several branches of physics and astronomy Integrated circuit technology Integrated circuit yield Integrated circuits negative bias temperature instability (NBTI) Oscillators, resonators, synthetizers Phase detection Phase locked loops phase-locked loop (PLL) Physics reliability Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices sensor circuit Sensors Sensors (chemical, optical, electrical, movement, gas, etc.) remote sensing Studies Temperature sensors Time measurements Timing variation resilience Voltage Voltage-controlled oscillators
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